Welcometo Boin GmbH. WAFERMAP PANELMAP WAFERView.OCX.

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Presentation transcript:

Welcometo Boin GmbH

WAFERMAP PANELMAP WAFERView.OCX

WAFERMAP Award winning software package Collect, edit, visualize and analyze measured physical parameters on semiconductor wafers Import data from various metrology tools -Ellipsometers -4 point probes -Thickness gauges Supported File Formats We add customer imports upon request

9 different visualization plots from 1D to 3D Data operations and filtering File comparison Statistical Process Control SPC -Browser -Trend chart Inter-application Communication (Active X) WAFERMAP

New features: New easy to use XML-based Boin file format Multiple wafers and multi-measurements in one file Import of multi-measurement wafers at once Free rotation of 3D plots WAFERMAP New Release: Version 3.0

WAFERMAP New features: Export of *.jpg and *.bmp Export of *.html … and many more New Release: Version 3.0

WAFERMAP Compare your measurements Work off-line Work outside the clean room  WAFERMAP is your choice

Advanced Micro Devices ASM Atmel Canon Hitachi Hypernex Infineon Intel Jordan Valley SC LSI Logic Mattson Technology Motorola/ Freescale Nicolet Osram Philips, Philips Analytical Mitsubishi Seagate Sematech ST Microelectronics Sumitomo Eaton Nova Silicon Valley Group Thermawave Tokyo Electron Tru-Si Varian WAFERMAP References – Partial List of WAFERMAP Customers

References – OEM Customers WAFERMAP Cyrium Foothill Instruments Jenawave Jordan Valley KLA - Tencor LayTec Napson Sigmatech SOPRA Technos Tepla AG Thermawave Thermo Electron Carl Zeiss  Sell WAFERMAP as analysis and visualization tool together with your equipment

PANELMAP Transfer of Award winning technology to flat panel geometry Collect, edit, visualize and analyze measured physical parameters on LCD, TFT, flat panels Import data from different metrology tools -Ellipsometers -4 point probes -Thickness gauges Supported File Formats We add customer imports upon request

9 different visualization plots from 1D to 3D Data operations and filtering File comparison Statistical Process Control SPC -Browser -Trend chart Inter-application Communication (Active X) PANELMAP

New easy to use XML-based Boin file format Multiple panels and multi-measurements in one file Import of multi-measurement panels at once Free rotation of 3D plots Export of *.jpg and *.bmp Export of *.html … and many more PANELMAP

PANELMAP Compare your measurements Work off-line Work outside the clean room  PANELMAP is your choice

Provides Boin visualization techniques as integration tool 9 different plots from 1D to 3D Easy to use integration Detailed Property pages for each plot Detailed Method descriptions WAFERView.OCX

WAFERView.OCX Integrate award winning Boin technology directly into your own equipment software Save development costs Save development time  WAFERView.OCX is your choice

WAFERView.OCX References – Partial List of WAFERView.OCX Customers Nicolet SOPRA Thermawave Thermo Electron Timbre

Thank you very much for your interest in for your interest in Boin products