Johann Knechtel, Igor L. Markov and Jens Lienig University of Michigan, EECS Department, Ann Arbor USA Dresden University of Technology, EE Department,

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Johann Knechtel, Igor L. Markov and Jens Lienig University of Michigan, EECS Department, Ann Arbor USA Dresden University of Technology, EE Department, Dresden Germany Assembling 2D Blocks into 3D Chips ISPD’11

Introduction Background Problem Formulation Method Experimental Result Outline 2

3D IC. –Stacking multiple dies and implementing vertical interconnections with Through-Silicon Vias (TSVs). Focus on design styles that reuse existing 2D Intellectual Property (IP) blocks. –Modern chip designs are dominated by 2D IP blocks, proven in applications and considered reliable. Introduction 3

Design Style –R2DL2D Introduction Gate-level and Redesigned 2D (R2D) styles place TSVs (small boxes) within the block footprint. Legacy 2D (L2D) style places scattered TSVs between blocks 4

L2Di Background L2D style with TSV islands (L2Di) groups TSV to blocks. 5

Why TSV island? –Stress TSVs introduce stress in surrounding silicon which affects nearby transistors. –TSV redundancy architectures Background 6 TSV islands can incorporate spare TSVs for redundancy.

Wirelength estimation –Neti = { P1, P2} with TSVia ( red block) Background 7

Inputs –Active layers –Rectangular IP blocks –Netlist –TSV-island types –3D floorplan by[32] 3D integration with the L2Di style seeks to cluster inter-layer nets into TSV islands, and to insert TSV islands into aligned deadspace around floorplan blocks. If TSV-island insertion is impossible due to lack of aligned deadspace, blocks can be shifted from their initial locations, but their relative positions must be preserved. Problem Formulation 8

Method 9

Parameters for net clustering and TSV- island insertion algorithms 10 Control the deadspace search for TSV island insertion Control the global iteration Control the clustering algorithm

Phase 1 –Construct Virtual die and grid structure Phase 2 –Determine possible clusters Phase 3 –Determine deadspace for clusters Net Clustering 11

Net Clustering 12

Phase 1 –Construct Virtual die and grid structure Net Clustering 13 N 1 = {p 1, p 5 } N 2 = {p 2, p 4 } N 3 = {p 3, p 5 }

Phase 2 –Determine possible clusters Net Clustering 14

Phase 3 –Determine deadspace for clusters Net Clustering 15

Phase 4 –Sort nets Phase 5 –Assign nets to clusters Phase 6 –Mark & unlink handled nets from clusters Insert TSV Island 16

Insert TSV Island 17

Phase 4 –Sorts all nets by their total aligned deadspace of related clusters. Insert TSV Island 18

Phase 5 –Assign nets to highest-scored cluster Insert TSV Island 19

Phase 6 –Mark & unlink handled nets from clusters Insert TSV Island 20

By the concept floorplan slack[1] Block Shifting 21

Experimental Results Parameters for net clustering and TSV-island insertion algorithms, along with their values. 22

Experimental Results 23 HPWL ratio divides wirelength of connections through TSVs by shortest-path wirelengths.

Experimental Results 24

A key insight in our work is that many of the benefits of 3D integration can be obtained while reusing existing 2D blocks. In the near future, the most promising and least risky design style for 3D integration is the L2Di style. To enable the L2Di style, we contribute novel techniques for clustering of nets and inserting TSV islands. Conslusions 25