Renaat VerbruggenCA421 Patterns & Metrics 1 CA421 Software Patterns & Metrics
Renaat VerbruggenCA421 Patterns & Metrics 2 Renaat Verbruggen School of Computing Room L2.43 (01) Moodle: CA421 Q&A etc.
Renaat VerbruggenCA421 Patterns & Metrics 3 Assessment Patterns Project, individual, 25% Final Exam, 2 hours, 75%
Renaat VerbruggenCA421 Patterns & Metrics 4 Presentation Lectures Readings available through Moodle Get the full readings completed early, use the summaries to revise.
Renaat VerbruggenCA421 Patterns & Metrics 5 Topics 1. Object-oriented Design Patterns 2. Architectural Patterns 3. Software Metrics 4. Software Cost Estimation 5. Software Test
Renaat VerbruggenCA421 Patterns & Metrics 6 Book: If you are to buy one book for the course then I recommend: Object-Oriented Software Engineering: Practical Software Development using UML and Java Second Edition Timothy C. Lethbridge and Robert Laganière McGraw Hill, 2005 ISBN Timothy C. LethbridgeRobert Laganière The first edition is still worth picking up 2nd hand: ISBN
Renaat VerbruggenCA421 Patterns & Metrics 7 Book… Website associated with book, including lectures by authors etc. at: upportMaterial/slides/ upportMaterial/slides/ However I will link locally to the notes that we will be covering in lectures.
Renaat VerbruggenCA421 Patterns & Metrics 8 Electronic Books in DCU library DCU Library currently subscribes to a number of e-books which can be accessed via the Safari Books Online database. You can search the entire set of 40 e-books by keyword, author, subject, title, etc..Safari Books Online
Renaat VerbruggenCA421 Patterns & Metrics 9 Electronic Journals in DCU library ACM Digital Library Fulltext access to approximately 95% of all ACM (Association for Computing Machinery) articles and transactions. Abstracts of Proceedings are also available. Coverage: to date ACM Digital Library
Renaat VerbruggenCA421 Patterns & Metrics 10 Electronic Journals … IEL - IEEE/IEE Electronic Library Represents 30% of electrical engineering and computer science literature. IEL provides access to all IEEE journals, transactions, magazines and conference proceedings; IEE journals and conference proceedings; and current IEEE standards. Full-text is available from 1988 and selected content available from IEL - IEEE/IEE Electronic Library E-tutorials User Guides (pdf): basic | advancedbasicadvanced Search IEEE Help FAQ Coverage: 1988-
Renaat VerbruggenCA421 Patterns & Metrics 11 Any Questions ?