Cover of Scientific American, October 2003. Source: www.ritsumei.ac.jp Actuator driven by thermal expansion of water and air.

Slides:



Advertisements
Similar presentations
Measuring Nanostructures. How do we see nanostructures? A light microscope? Helpful, but cannot resolve below 1000 nm An electron microscope? Has a long.
Advertisements

AFM Basics Xinyong Chen.
AFM Basics Xinyong Chen.
Atomic Force Microscope (AFM)
Scanning Probe Microscopy
Scanning Probe Microscopy ( STM / AFM )
The Principle of Microscopy : SEM, TEM, AFM
SCANNING PROBE MICROSCOPY By AJHARANI HANSDAH SR NO
Lecture 10. AFM.
Development of Local and Scanning Probe Techniques Heinrich Hoerber NanoBioPhysics University Bristol.
Activities during UK-Japan Young Scientist Workshop Dr Riz Khan Room 31DJ02, x6062, Advanced Technology Institute University.
Imaging of flexural and torsional resonance modes of atomic force microscopy cantilevers using optical interferometry Michael Reinstaedtler, Ute Rabe,
Sample laser cantilever quadrant photodetector tip AFM measures x, y, and z dimensions. The AFM works by scanning a silicon or silicon nitride tip, with.
Atomic Force Microscopy: characterization of surface topography Andrius Martinavičius.
UNIT IV LECTURE 61 LECTURE 6 Scanning Probe Microscopy (AFM)
Atomic Force Microscopy
History and Applications of Atomic Force Microscopy Gregory James PhD Candidate Department of Chemical Engineering 1.
Notre Dame extended Research Community 1 The Atomic Force Microscope Michael Crocker Valerie Goss Rebecca Quardokus Natalie Wasio.
Get to the point!. AFM - atomic force microscopy A 'new' view of structure (1986) AlGaN/GaN quantum well waveguide CD stamper polymer growth surface atoms.
Atomic Force Microscop (AFM) 3 History and Definitions in Scanning Probe Microscopy (SPM) History Scanning Tunneling Microscope (STM) Developed.
Atomic Force Microscopy
Atomic Force Microscopy
Announcements Mid-Term Test next Tuesday in class! (Oct. 7 th, 9:30-11am, Rm 136LLP) Will cover all of classes Lec 1-10 plus (qualitatively) on Lec 11–
Copyright © 2005 SRI International Scanning Probe Microscopy “Seeing” at the nanoscale.
Scanning Probe Microscopy (SPM) Real-Space Surface Microscopic Methods.
Scanning Probe Lithography (SPL)
Methods and Tehniques in Surface Science
ATOMIC FORCE MICROSCOPE Presented By Er. RANJAN CHAKRABORTY, B.Tech; A Student in M.Tech (VLSI & MICROELECTRONICS) 1 st Year, 2 nd Semester.
RHEOLOGICAL MEASUREMENTS BY AFM OF THE FORMATION OF POLYMER NANOFIBERS M. M. Yazdanpanah, M. Hosseini, S. Pabba, S. M. Berry, V. V. Dobrokhotov, A. Safir,
TAPPINGMODE™ IMAGING APPLICATIONS AND TECHNOLOGY
How Do We Measure Forces at the Nanoscale Level? 1 © 2009 McREL Physical Science Lesson 7 How Do We Measure Forces at the Nanoscale Level? Investigating.
What has enabled Nanoscience? Advances in Computing Power New Generation of Scientific Instruments Scanning Probe Microscopes An incomplete list.... Very.
2.002 Tutorial Presentation Problem 1-Atomic Force Microscopy Justin Lai.
Friction Friction Problem Situations Chapter 5.2 and 5.3.
NANO 225 Micro/Nanofabrication Characterization: Scanning Probe Microscopy 1.
Tutorial 4 Derek Wright Wednesday, February 9 th, 2005.
3.052 Nanomechanics of Materials and Biomaterials Prof. Christine Ortiz DMSE, RM Phone : (617) WWW :
3.052 Nanomechanics of Materials and Biomaterials Prof. Christine Ortiz DMSE, RM Phone : (617) WWW :
HE3 Soft Matter Potential Energy in Condensed Matter and the Response to Mechanical Stress 25 February, 2010 Lecture 3 See Jones’ Soft Condensed Matter,
Common scanning probe modes
Scanning Probe Microscopy Colin Folta Matt Hense ME381R 11/30/04.
Today –Homework #4 Due –Scanning Probe Microscopy, Optical Spectroscopy –11 am NanoLab Tour Tomorrow –Fill out project outline –Quiz #3 in regular classroom.
5 kV  = 0.5 nm Atomic resolution TEM image EBPG (Electron beam pattern generator) 100 kV  = 0.12 nm.
Atomic Force Microscopy (AFM)
Tuning Fork Scanning Probe Microscopy Mesoscopic Group Meeting November 29, 2007.
Atomic Force Microscopy Alexander Chew Florida State University BSC5936 April 2005.
Properties of Matter Thermodynamic Mechanical Work:
Cover of Scientific American, October Source: Actuator driven by thermal expansion of water and air.
3SMS Potential Energy in Condensed Matter and the Response to Mechanical Stress 29 January, 2007 Lecture 3 See Jones’ Soft Condensed Matter, Chapt. 2;
Casey Ross Mullikin Graduate Mentor: Brock Schulte Faculty Mentor: Dr. Steve Tung.
Donovan Sung EE235 Student Presentation 4/16/08 Chemical identification of individual surface atoms by atomic force microscopy.
Atomic Force Microscope Nanoindentation/Scratching
EEM. Nanotechnology and Nanoelectronics
Atomic Force Microscopy (AFM)
Pooria Gill PhD of Nanobiotechnology Assistant Professor at MAZUMS In The Name of Allah.
Get to the point!.
Get to the point!.
Scanning Tunneling Microscopy
Scanning Probe Microscopy
Work done by a variable force
Scanning Probe Microscopy History
7x7 surface have been removed and deposited.
Scanning Probe Microscopy History
Atomic Force Microscopy Samrat Dutta, Ph.D.
NANO 230 Micro/Nano characterization
Scanning Probe Microscopy
Atomic Force Microscope
Atomic Force Microscopy
AFM modes 1- Contact Mode
Fig. 2 Fibrous structure, roughness, and softness of SNE surface enabling switchable adhesion. Fibrous structure, roughness, and softness of SNE surface.
Presentation transcript:

Cover of Scientific American, October 2003

Source: Actuator driven by thermal expansion of water and air

V.H. Ebron et al., Science (2006) 311, 1580 A chemical reaction with methanol creates heat in the NiTi alloy wire, which causes it to shrink - thus lifting a weight. Example of negative thermal expansivity!

Weak Nano-scale Forces Can be Measured The AFM probe is exceedingly sharp so that only a few atoms are at its tip! Sensitive to forces on the order of nano-Newtons. Atomic force microscope (AFM)

AFM tips from NT-MDT. See Tips for Scanning Probe Microscopy Radius of curvature ~ 10 nm Ideally, one of the atoms at the tip is slightly above the others. The tip is on a cantilever, which typically has a spring constant on the order of k = 10 N/m. Modelled as a simple spring: F = kz where z is the deflection in the vertical direction. F

Measuring Attractive Forces at the Nano-Scale A = approach B = “jump” to contact C = contact D = adhesion E = pull-off Tip deflection  Force Vertical position A B C DE C

Measuring Force of Attraction to a Polymer Surface Pulling on the AFM probe tip Pushing on AFM probe tip