INA826 EMI RR Testing

Testing Methodology Signal Generator DMM LPF A sine wave applied to the input to simulate conducted EMI 10MHz to 6GHz -10dBm power level (100mVp) This conducted EMI signal will cause a change in the output offset of the part DUT output is low-pass filtered Change in offset is measured by a 6.5 digit DMM Change in offset is input referred

Test Configurations Bipolar (+/-12V) supplies were used with the reference pin grounded Differential Measurement Signal applied to non-inverting input Inverting input grounded Common-Mode Measurement Signal applied to both inputs

Differential EMI RR of 3 Separate Units The differential EMI RR performance is consistent across multiple INA826s

INA826 Differential EMI RR Gain Dependency Differential EMI RR improves above 1GHz with increasing gain

Common-Mode EMI RR of 3 Separate Units Low frequency common-mode EMI RR performance has more unit-to-unit variation than differential EMI RR performance

INA826 Common-Mode EMI RR Gain Dependency Increasing gain generally improves CM EMI RR at high frequencies

Decoupling Capacitor Effects Varying the decoupling capacitor size and type had negligible effect on EMI RR performance