Quality Test of L1 sensors HPK 10 sensors –Tested all, 6 sent to Fermilab – Test structures, HPK 133 L00 CDF ELMA 9 sensors –Tested 6 of 9

HPK V depletion ~120V consistent I leakage at V depletion ~ 50nA (except 07) Breakdown: seen once s/n20 at 750V Strip leakage ~ 0.04nA Poly resistor value ?? Capacitance 70pF I dielectric: LCR noise Bad Channels

–HPK01 none –HPK03 bad strip 42; –HPK04 bad strip 346; –HPK06 PH 13, 47, 267; –HPK07 bad strips 27, 320; –HPK09 none –HPK11 leaky 169; –HPK12 none –HPK13 none; Rpoly strange shape –HPK20 none; HPK claims two low Cac Fermilab

Polysilicon Resistor Using 237 bias/no bias

Interstrip Resistor Using 237 Bias/NO Bias

Polysilicon Resistor Using 487 Bias/NO Bias

ELMA V depletion ~ 26V I leakage at V depletion ~ 50nA Breakdown ALL at V Strip leakage ~ 0.15nA Poly resistor value: vary, better than HPK Capacitance ~ 80pF I dielectric

Bad Strips L , 43, 140, 256, 276 L , 362, 383 L ,384; Rpoly ~ 4MOhm L , 168, 263, 356, 373 L , 368 L , Rpoly ~ 1.3 Mohm

Conclusion HPK – Polysilicon resistors are out of specs ELMA – Low breakdown voltage