A tour of the chip D.G.Ast. Not well aligned ! Transistors T1 and T2 share a gate contact. The smallest transistors is T4. To right is the first Diode.

Slides:



Advertisements
Similar presentations
6.1 Transistor Operation 6.2 The Junction FET
Advertisements

BASIC BLOCKS : PASSIVE COMPONENTS 1. PASSIVE COMPONENTS: Capacitors  Junction Capacitors  Inversion Capacitors  Parallel Plate Capacitors Resistors.
Electrical transport and charge detection in nanoscale phosphorus-in-silicon islands Fay Hudson, Andrew Ferguson, Victor Chan, Changyi Yang, David Jamieson,
CMOS Fabrication EMT 251.
Lecture 0: Introduction
Analog VLSI Design Nguyen Cao Qui.
VLSI Design Lecture 2: Basic Fabrication Steps and Layout
EE/MAtE1671 Front-End-Of-Line Variability Considerations EE/MatE 167 David Wahlgren Parent.
Spring 2007EE130 Lecture 34, Slide 1 Lecture #34 OUTLINE The MOS Capacitor: MOS non-idealities (cont.) V T adjustment Reading: Chapter 18.3.
11/5/2004EE 42 fall 2004 lecture 281 Lecture #28 PMOS LAST TIME: NMOS Electrical Model – NMOS physical structure: W and L and d ox, TODAY: PMOS –Physical.
Introduction to CMOS VLSI Design Lecture 0: Introduction
For the exclusive use of adopters of the book Introduction to Microelectronic Fabrication, Second Edition by Richard C. Jaeger. ISBN © 2002.
11/3/2004EE 42 fall 2004 lecture 271 Lecture #27 MOS LAST TIME: NMOS Electrical Model – Describing the I-V Characteristics – Evaluating the effective resistance.
Lecture 0: Introduction. CMOS VLSI Design 4th Ed. 0: Introduction2 Introduction  Integrated circuits: many transistors on one chip.  Very Large Scale.
Device Fabrication Example
MOS Capacitors ECE Some Classes of Field Effect Transistors Metal-Oxide-Semiconductor Field Effect Transistor ▫ MOSFET, which will be the type that.
Introduction Integrated circuits: many transistors on one chip.
MSE-630 Gallium Arsenide Semiconductors. MSE-630 Overview Compound Semiconductor Materials Interest in GaAs Physical Properties Processing Methods Applications.
Depletion Region ECE Depletion Region As electrons diffuse from the n region into the p region and holes diffuse from the p region into the n region,
Z. Feng VLSI Design 1.1 VLSI Design MOSFET Zhuo Feng.
CMOS Fabrication Details
Analog Layout.
Chapter 5: Field Effect Transistor
Lecture 0: Introduction. CMOS VLSI Design 4th Ed. 0: Introduction2 Introduction  Integrated circuits: many transistors on one chip.  Very Large Scale.
CP-416 VLSI System Design Lecture 1-A: Introduction Engr. Waqar Ahmad UET,Taxila.
Chapter 23 Alternating Current Circuits Capacitors and Capacitive Reactance The resistance in a purely resistive circuit has the same value at all.
IC Process Integration
Lecture 7.0 Device Physics. Electronic Devices Passive Components Resistance (real #) –Conductor –Resistor –Battery Active Components Reactance (Imaginary.
Limitations of Digital Computation William Trapanese Richard Wong.
Modern VLSI Design 2e: Chapter 3 Copyright  1998 Prentice Hall PTR Topics n Electrical properties of static combinational gates: –transfer characteristics;
© Pearson & GNU Su-Jin Kim MEMS Manufacturing Processes MEMS Devices The MEMS(Microelectromechanical systems) devices can be made through the IC Process:
1 OUTPUT Pad and Driver. 2 CLOCK DRIVER 3 Buffering S = scaling or tapering factor CL = S N+1 Cg ……………… All inverters have identical delay of t o = delay.
ES050 – Introductory Engineering Design and Innovation Studio 1 ECE Case Study Accelerometers in Interface Design – Part II Prof. Ken McIsaac
Norhayati Soin 06 KEEE 4426 WEEK 3/1 9/01/2006 KEEE 4426 VLSI WEEK 3 CHAPTER 1 MOS Capacitors (PART 1) CHAPTER 1.
Introduction to CMOS VLSI Design CMOS Fabrication and Layout Harris, 2004 Updated by Li Chen, 2010.
ECE 4991 Electrical and Electronic Circuits Chapter 9.
Lecture 24a, Slide 1EECS40, Fall 2004Prof. White Lecture #24a OUTLINE Device isolation methods Electrical contacts to Si Mask layout conventions Process.
Fabrication Technology(1)
ECE Case Study Accelerometers in Interface Design – Part II
Part 1. Background What are polymer electronics? What makes polymer so suited for electronic applications? Polymer Devices Applications and Areas of Research.
Norhayati Soin 05 KEEE 4426 WEEK 12/1 3/13/2005 KEEE 4426 WEEK 12 CMOS FABRICATION PROCESS.
Spencer/Ghausi, Introduction to Electronic Circuit Design, 1e, ©2003, Pearson Education, Inc. Chapter 3, slide 1 Introduction to Electronic Circuit Design.
CMOS Fabrication nMOS pMOS.
1 Overview of Fabrication Processes of MOSFETs and Layout Design Rules.
CMOS VLSI Design Introduction
Chapter 4: Secs ; Chapter 5: pp
MOS Capacitors UoG-UESTC Some Classes of Field Effect Transistors Metal-Oxide-Semiconductor Field Effect Transistor ▫ MOSFET, which will be the.
CMOS VLSI Fabrication.
Silicon Design Page 1 The Creation of a New Computer Chip.
Introduction to CMOS Transistor and Transistor Fundamental
Integrated Circuit Devices
CMOS FABRICATION.
Lesson 1-4 Review …Lesson 5-8 Intro. Lesson 1: Component Parts ID Resistors Capacitors Diodes Transistors Switches Speakers Lamps Transformers Batteries.
2007/11/20 Paul C.-P. Chao Optoelectronic System and Control Lab., EE, NCTU P1 Copyright 2015 by Paul Chao, NCTU VLSI Lecture 0: Introduction Paul C.–P.
Objectives: 1. Define and calculate the capacitance of a capacitor. 2. Describe the factors affecting the capacitance of the capacitor. 3. Calculate the.
CMOS Fabrication EMT 251.
Full-Custom Design ….TYWu
Introduction to CMOS VLSI Design Lecture 0: Introduction.
1. Introduction. Diseño de Circuitos Digitales para Comunicaciones Introduction Integrated circuits: many transistors on one chip. Very Large Scale Integration.
The Devices: MOS Transistor
BASICS OF ELECTRONICS.
Testing PXD6 - testing plans
CMOS Fabrication CMOS transistors are fabricated on silicon wafer
Microfabrication Home 3 exercise Return by Feb 5th, 22 o’clock
Chapter 1 & Chapter 3.
Other FET’s and Optoelectronic Devices
Lecture #25 OUTLINE Device isolation methods Electrical contacts to Si
Process flow part 2 Develop a basic-level process flow for creating a simple MEMS device State and explain the principles involved in attaining good mask.
Presentation transcript:

A tour of the chip D.G.Ast

Not well aligned ! Transistors T1 and T2 share a gate contact. The smallest transistors is T4. To right is the first Diode Below is inverter 1

Diodes D1 and D2. They look nearly the same. The reaction of the Al indicates that D1 the Al is likely in contact with implanted Si. And in D2 in contact with the n-type substrate. It will become clear in the electrical test. Below D2 is the gate oxide capacitor and below D1 the field oxide capacitor

Capacitors C1 and C2. C2 is about 3 times the diameter of C1. \ Since the FOX is 10 times as thick as the gate oxide, C2 has a 10 times larger area (3 times the diameter). This scaling ensures that both caps have similar capacitance in a range easily measured (around 100 pF)

Inverters I1 and I2. An inverter is 2 transistors in series. Note that the two gates are not the same size for reasons you will learn in a layout class.

The chips at the periphery contain single crystal MEMS. This here is a floating grid suspended on Si springs that can driven sideways (x-y) by comb drives. The p+ implanted beams are not etched by KOH. KOH is an anisotropic etch that stops at {111} planes.

Single beam (left) and and a platform with comb drives. The platform is held be a single beam. You can drive the thing into resonance !

There are many more structures on the chip you processed - Kelvin resistance probes, test structures to measure the implant sheet resistance, logic blocks…. THE END