16/1-13MENA3100 Probes used for analysis PhotonElectronNeutron Waves/particles UiOIFE Wave length Monochromatic Amplitude and phase Coherence

16/1-13MENA3100 What to learn about Imaging/microscopy –Visible light/Optical –Electron SEM STEM TEM Diffraction –X-rays –Electrons –Neutrons Spectroscopy –EDS X-rays –EELS Electrons –XPS, AES Electrons (surface) Sample preparation –Mechanical grinding/polishing –Chemical polishing/etching –Ion bombardment –Crunching etc…… Mapping of elements or chemical states of elements. The same basic theory for all waves. Different imaging modes.

Waves and lenses 16/1-13MENA3100 r1r1 r2r2 α r1r1 r2r2 Spherical aberration α v v - Δ v Chromatic aberration y-focus x-focus y x Astigmatism Back focal plane Object 1. image f S1S1 S2S2 Thin lens

Probe-specimen interactions Wave length dependence –Diffraction Z- and structure dependence –Scattering factors Orientation dependence Energy dependent –Ineleastic scattering/ energy transfere 16/1-10MENA3100 electron photon neutron Probe dependent

19/1-10MENA3100 Basic principles, electron probe Valence K L M Electron shell Characteristic x-ray emitted or Auger electron ejected after relaxation of inner state. Low energy photons (cathodoluminescence) when relaxation of outer stat. K L M 1s 2 2s 2 2p 2 2p 4 3s 2 3p 2 3p 4 3d 4 3d 6 Auger electron or x-ray Secondary electron Electron

16/1-10MENA3100 Basic principles, x-ray probe K L M Auger electron Photo electron X-ray Valence K L M Electron shell Characteristic x-ray emitted or Auger electron ejected after relaxation of inner state. Low energy photons (cathodoluminescence) when relaxation of outer stat. Secondary x-rays

16/1-13MENA3100 Probes Photon Visible light –Optical microscopy (OM), Ch. 1 X-ray –X-ray diffraction (XRD), Ch. 2 –X-ray photo electron spectroscopy (XPS), Ch. 7 Neutron –Neutron diffraction (ND) (IFE) Electron –Scanning electron microscopy (SEM), Ch. 4 –Transmission electron microscopy (TEM), Ch. 3 –Electron diffraction (ED), Ch. 3 –Electron energy loss spectroscopy (EELS) –Energy dispersive x-ray spectroscopy (EDS), Ch. 6 –Auger electron spectroscopy (AES), Ch. 7

16/1-13MENA3100 Basic principles Electrons X-rays E<Eo (EELS) BSE SE AE X-rays (EDS) AE PE (XD) X-rays E=Eo (XPS) SE (SEM) (TEM and ED) You will learn about: - the equipment -imaging -diffraction -the probability for different events to happen -energy related effects -element related effects -etc., etc., etc……..