TSC 12/03 Post-CMOS Grand Challenges Juri Matisoo Vice-President, Technology Semiconductor Industry Association
TSC 12/03 Acknowledgements SIA TSC Working Group Bob Doering, TI, Chair; George Bourianoff, Intel Philip Wong, IBM Luan Tran, Micron Papu Maniar, Motorola Jim Hutchby, SRC
TSC 12/03 Agenda/Overview Value and Need for Investment in Nanoelectronics* Research Long-Term Manufacturing Research Long-Term Device Research Recommendations Summary * In this presentation: “nanoelectronics” ≡ “future IC technology”
TSC 12/03 Benefits to the U.S. from the Semiconductor Industry Powers other Industries Spurs Economic Growth ~3% of GDP growth due to “computer quality” increase Creates High-Wage Jobs ~300K jobs in the U.S. currently Fosters International Competitive Advantage Bolsters National Defense/Homeland Security Intelligence gathering/processing Guidance/Control systems (e.g., for E2C2) Logistics management/efficiency Communications Technology
TSC 12/03 The Need for New Enablers of Progress in Future ICs The industry productivity gains of 25%/year reduction in cost/function and improved performance and reduced power consumption over the last 40 years have been driven by miniaturization of semiconductor devices. The International Technology Roadmap for Semiconductors (ITRS) predicts that over the next years, this trend will end. New devices and manufacturing techniques are needed.
TSC 12/03 Long-Range Grand Challenges In the long term, the SIA TSC feels that we face two grand challenges worthy of very large federal funding: (1)Scaling limits of “evolutionary lithography/thin-film manufacturing” (2)Scaling limits of “charge-transport devices/interconnect” We suggest that these might be overcome through new and synergistic research in the under-funded broad areas of: (1)“Directed self-assembly” of complex structures with “nanoelectronics-functionality” (computation, comm., etc.) (2)“Beyond (classical) charge transport” signal-processing/ computational technology (e.g., based on quantum-states)
TSC 12/03 Rationale for Directed Self-Assembly Break the manufacturing “scaling tyranny” of: (1)Maintaining adequate process-control margin (2)Contamination-density-limited yield (3)Escalating wafer-fab capital cost (4)Lengthening production cycle time (5)Rapidly increasing photomask cost
TSC 12/03 Desired Consequences of Directed Self-Assembly (1)Approaching “atomic-level” perfection/control in manufacturing of nano-systems (“future SOCs”) (2)Providing radically enhanced and affordable functionality in nano-systems (3)Revolutionizing fab economics and logistics (4)Application to a broad range of devices (e.g., from “ultimate CMOS” to “quantum-state”) Note: the principal barrier to implementation of advanced device concepts is often “manufacturing feasibility”
TSC 12/03 Current Examples of Self-Assembly Techniques
TSC 12/03 The Self-Assembly “Place and Route” Problem
TSC 12/03
IC Metrics that Should Guide Research on NanoManufacturing Cost/Integrated-Function(e.g., $/gate or $/bit integrated into system) Operations/Second(computation speed, e.g. MIPS) Power Dissipation(both operating and standby power) Integration Density(e.g., integrated functions/cm 2 or /cm 3 ) Integration Diversity(SOC functions - e.g., analog, RF, e-RAM) Capital Cost/Capacity (e.g., capital investment $/chips/month) Mfg. Cycle Time(impacts time-to-market and ASIC delivery) R&D Cost(e.g., cost per new product or tech node) NanoManufacturing Goals: 100x beyond limits of the evolutionary approach
TSC 12/03 Rationale for Beyond-Charge-Transport Signal-Processing/Computation Break the “CMOS electrical scaling tyranny,” e.g.: (1)Voltage (limiting speed/power/error-rate tradeoff) (2)Resistance (limiting speed and low power) (3)Capacitance (limiting speed and low active power) (4)Charge-Leakage Mechanisms (limiting standby power)
TSC 12/03 Desired Consequences of Beyond-Charge-Transport Computation/Signal-Processing (1)Providing significant performance improvements via mechanisms beyond merely scaling physical dimensions (e.g., multiple logic states, far-from- equilibrium operation) (2)Providing qualitatively new types of nano-system functionality (e.g., direct sensing/actuating)
TSC 12/03 Some Potential State Variables Alternative to Classical Electric Charge Atomic/molecular quantum states (including “artificial atoms”) Magnetic-dipole magnitude/orientation (e.g., electron/nuclear spin) Electric-dipole magnitude/orientation Magnetic flux quanta Photon number Photon polarization Mechanical state
TSC 12/03 Example: Spin-Resonance Transistor (SRT) Example: Spin-Resonance Transistor (SRT) Transistors that control spins rather than charge More energy efficient than conventional transistors Combines magnetic and electrostatic fields May enable quantum computing Courtesy Eli Yablanovitch, UCLA
TSC 12/03 Challenges to Metrology Instrumentation and techniques for Identification and visualization of atomic species and structure Observation of short-range and long-range order, defects Device characterization
TSC 12/03 Summary We have identified two major challenges for nanoelectronics, worthy of significant Government funding via NNI We presented these findings to PCAST as part of their NNI review, and strategy development