Effect of combination of twist pitches on distribution of strands appearing on cable surface in CICC Daisuke Miyagi, Toshiya Morimura, Makoto Tsuda (Tohoku.

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Effect of combination of twist pitches on distribution of strands appearing on cable surface in CICC Daisuke Miyagi, Toshiya Morimura, Makoto Tsuda (Tohoku University) Takataro Hamajima * (Hachinohe Institute of Technology) Tsuyoshi Yagai ** (Sophia University) Kazuya Takahata ***, Tetsuhiro Obana *** (NIFS) CHATS October 9-11, 2013 Cambridge, MA Tohoku University, , Aoba Aramaki Aoba-ku, Sendai, Miyagi, , Japan * Hachinohe Institute of Technology, 88-1 Ohbiraki, Myo, Hachinohe, Aomori , Japan ** Sophia University, , kioityou Tiyoda-ku, Tokyo, , Japan *** National Institute for Fusion Science, 322-6, Oroshi-cho Toki, Gifu, , Japan This work was supported in part by JSPS KAKENHI Grant Number

1. Background and Objective 2. Experiment of a resistance distribution between strands and a copper sleeve at LHe temperature 3. Calculation of a resistance distribution between strands and a copper sleeve using computed strand paths 4. Influence of a combination of twist pitches on a distribution of strands appearing on cable surface 5. Summary 2 Outline

Background and Objective 3 i. Cable-in-Conduit Conductor (CICC) Composed of many superconducting strands twisted in multiple stages (usually 4~5 stages) for large current capacity. Strands are compacted into a metallic conduit for high mechanical strength. Critical current of a CICC is lower than the expected. CICC partly explained by filament fracture and unbalanced current. Superconducting coils used for fusion reactors and SMES are formed from a Cable-in-Conduit-Conductor (CICC). However, ………

Background and Objective 4 ii. CICC Joint (Wrap Joint) Two cables without conduit are inserted into a copper sleeve to join each other. Strands are in contact with a copper sleeve on the cable surface. Current flow between two CICCs through a copper sleeve. Contact condition between a strand and a copper sleeve was estimated to be inhomogeneous by our calculation. Fig. Schematic view of a CICC wrap joint. copper sleeve CICC It has been unclear that the resistance distribution between strands and a copper sleeve is inhomogeneous actually. One of the reasons is unbalanced current distribution caused by inhomogeneous contact resistances between a copper sleeve and strands at joint called “wrap joint”.

Objective of this study 5 The resistance distribution becomes inhomogeneous? The resistance distribution relates to contact condition? We measured resistances between each strand and a copper sleeve. We calculated the resistance distribution using the calculated strand paths. We examined the influence of a combination of twist pitches on a distribution of strands appearing on cable surface using the calculated strand paths.

6 Outline 1. Background and Objective 2. Experiment of a resistance distribution between strands and a copper sleeve at LHe temperature 3. Calculation of a resistance distribution between strands and a copper sleeve using computed strand paths 4. Influence of a combination of twist pitches on a distribution of strands appearing on cable surface 5. Summary

Specifications of Measurement Sample 7 number of strands486 material of strandNbTi / Cu strand diameter [mm]0.89 cable size [mm]20.5×24.8 cable twist pitch [mm]70/120/170/250/400 CICC (LHD OV coil) length [mm]75 size [mm]18.8×23.0 Copper Sleeve thickness [mm]50 (Simulates the solder coating) Indium Sheet The inner shape of the sleeve was designed such that the void fraction of the CICC changed from 38% to 30%.

Cable (486 strands) Constant current source Nano-voltmeter Copper sleeve 100 mm75 mm35 mm Conduit Simple model “Wrap Joint” 8 1.A conduit and a stainless wrap were removed at one end of a sample. 2.The conduit and the stainless wrap were removed within 75mm in length. 3.A thin indium sheet was wrapped around the cable. 4.The copper sleeve was installed on the cable with the indium sheet. Fig. Schematic view of a measurement sample arrangement. The wrap of indium sheet simulated the solder coating in a real wrap joint.

Cable (486 strands) Constant current source Current : 6.0 A Nano-voltmeter Copper sleeve 100 mm75 mm35 mm Conduit Simple model “Wrap Joint” 9 Fig. Schematic view of a measurement sample. We measured the contact resistance between the copper sleeve and each strand using the four-terminal method at the LHe temperature (4.2K).

Measurement Results 10 Fig. Measurement resistance distribution between the strands and the copper sleeve. strand Copper sleeve Indium sheet Contact Non-contact 146 strands inhomogeneous The 0 ohm strands are considered to be in direct contact with the copper sleeve through the indium sheet.

11 Outline 1. Background and Objective 2. Experiment of a resistance distribution between strands and a copper sleeve at LHe temperature 3. Calculation of a resistance distribution between strands and a copper sleeve using computed strand paths 4. Influence of a combination of twist pitches on a distribution of strands appearing on cable surface 5. Summary

Evaluation of the Strand Path 12 Longitudinal direction Arbitrary cross-section (5 th sub-cable) Centroid 5th reference Line (R.L.) In order to calculate the resistance distribution between the strands and the copper sleeve, we evaluated all strand paths by numerical approach considering the manufacturing process of the CICC. We evaluated all strand positions at each cross-section every 10mm. 1.Draw the outer shape of the 5 th sub-cable in the cross section of a sample CICC. 2.Draw a “reference line” from the 5 th sub-cable centroid to the outer shape. Cable cross section (5 th sub-cable) Equal-area method

Evaluation of the Strand Path 13 Longitudinal direction Arbitrary cross-section (5 th sub-cable) Centroid 5 th reference Line (R.L.) 3.Divide the cross section (5 th sub-cable) into six 4 th sub-cables with same area on the basis of the 5 th reference line. Because the same order sub-cables consist of the same number of strands. 4.Draw a “4 th reference line” from the 4 th sub-cable centroid to the outer shape of the 4 th sub-cable in each 4 th sub-cable area. 4 th sub-cable area 4 th R.L. Centroid

Evaluation of the Strand Path 14 5.Divide each 4 th sub-cable area into three 3 rd sub-cables with same area on the basis of the 4 th reference line. 6. Draw a “3 rd reference line” from the 3 rd sub-cable centroid to the outer shape of the 3 rd sub-cable in each 3 rd sub-cable area. 4 th R.L. 4 th sub-cable area Centroid 3 rd sub-cable area Centroid 3 rd R.L.

Evaluation of the Strand Path 15 7.Divide each 3 rd sub-cable area into three 2 nd sub-cables with same area. 8.Similarly, divide each 2 nd sub-cable area into three 1 st sub-cables with same area. 9.divide each 1 st sub-cable area into three strands and obtain all strands’ centroid’s position at the cross-section of the cable. 3 rd sub-cable area Centroid 3 rd R.L. 1 st sub-cable area 2 nd sub-cable area Strand’s centroid

Evaluation of the Strand Path Rotate each sub-cable about its centroid. The rotation angle depends on the longitudinal position (z). The rotating angle  n of n- th order sub-cable is given as follows: : rotation angle of n-th R.L. : R.L. order (1~5) : initial rotation angle of n-th R.L. : twist pitch of n-th sub-cable 5 th R.L. 4 th sub-cable Longitudinal direction Fig. Schematic view of 5 th reference line and 4 th sub-cables’ rotation at a cross-section. The cable contraction due to refrigerant cooling was not considered in this method.

Evaluation of the Strand Path 17 Evaluated strands’ positions at a cross section by “equal-area method”. Our technique “equal-area method” to evaluate strand’s positions ignores the overlap among strands. However, actual strands do not overlap, and each strand’s contact region is pressurized. In this situation, the elastic potential energy is accumulated in the strands. In addition, the elastic potential energy is also accumulated by the deformation of the twist structure of strands. All strand’s positions evaluated by “equal-area method” are iteratively perturbed using a genetic algorithm until the elastic potential energy in the cross section is minimized. We search strand’s positions with the minimum elastic potential energy. We introduce the elastic potential energy into our method.

Evaluation of the Strand Path 18 Evaluated strand’s positions at a cross section by only “equal-area method”. Evaluated strand’s positions at a cross section in consideration of the elastic potential energy minimization.

19 z y x l l : loop length l c : contact length Fig. Schematic view of two strands contacting each other. Calculation of the Contact Resistance We assumed the contact resistance between a strand and a copper sleeve to be 0  according to our experimental results. We assumed that the contact resistance “R c ” between strands only depends on the contact length.  The contact length “l c ” between two strands was considered as the sum total of partial contact length.  The contact conductance between the strands “G c ” was obtained by G a : constant value [S/m] G c : contact conductance [S]

Resemblance between the resistance distribution The calculated resistance distribution between the strands and the copper sleeve depends on the value “Ga” and contact length. We analyzed the similarity between the calculated resistance distribution and the measured one using “cosine similarity” as a function of “G a ”. Fig. The relation between the cosine similarity and “Ga” contact conductance per meter between strands.

Comparison of Resistance Distribution 21 Fig. The comparison of the calculated resistance distribution with the measured resistance distribution between the strand and the copper sleeve. /Mea.Cal. number of 0  strands average [  ] standard deviation [  ] Tab. Characteristics of measured and calculated resistance distribution.

Comparison of Resistance Distribution 22 Fig. The comparison of the calculated resistance distribution with the measured resistance distribution between the strand and the copper sleeve. The CICC structure should be arranged such that all strands are in direct contact with the copper sleeve. Since the strand paths depend on the combination of twist pitches, it is important to choose the suitable twist pitches for realizing homogeneous resistance distribution at joint. The homogeneity of the resistance distribution between the copper sleeve and strands is strongly dependent on whether the strand is in direct contact with the copper sleeve or not.

23 Outline 1. Background and Objective 2. Experiment of a resistance distribution between strands and a copper sleeve at LHe temperature 3. Calculation of a resistance distribution between strands and a copper sleeve using computed strand paths 4. Influence of a combination of twist pitches on a distribution of strands appearing on cable surface 5. Summary

Influence of Twist Pitch on Contact Situation 24 number of strands486 strand diameter [mm]0.89 cable size [mm]20.5×24.8 Cable length [mm]400 Actual model :cable twist pitch [mm]70/120/170/250/400 Analyzed model :cable twist pitch [mm]40/60/100/160~280/400 Copper sleeve length [mm]400 Copper sleeve inner size [mm]18.8×23.0 Tab. Specifications of analyzed model of a CICC. We investigated the influence of the combination of twist pitches of each sub-cable on contact length between the strand and the copper sleeve by varying the twist pitch of the 4 th sub-cable from 160 to 280 mm. It has been reported that a contact situation is improved between a strand and a copper sleeve when twist pitches have been shorter. The strand has the degradation of the critical current when twist pitches of 1 st and 2 nd sub-cable are shortened too much.

25 Fig. Influence of the twist pitch of the 4 th sub-cable on contact situation between strands and the copper sleeve. Twist pitch of 4 th sub-cable [mm] Number of non-contact strands Standard deviation of contact length [mm] Standard deviation Number of non-contact strands Influence of Twist Pitch on Contact Situation All strands are in contact with the copper sleeve and standard deviation of contact length between strands and the copper sleeve becomes the minimum, when twist pitches of 3rd and 4th sub-cables are aliquot part of a twist pitch of a 5th sub-cable. Number of non- contact strands : 66 Standard deviation of contact length : mm Cable twist pitches : 40/60/100/200/400 Cable twist pitches : 40/60/100/160~280/400

Summary We measured the contact resistance between the copper sleeve and each strand at a joint which simulated the wrap joint. –The non-uniformity of contact resistances between the copper sleeve and the strands was observed. –The homogeneity of the resistance distribution between the copper sleeve and strands is strongly dependent on whether the strand is in direct contact with the copper sleeve or not. The CICC structure should be arranged such that all strands are in directly contact with a copper sleeve at a joint. –It is expected that the resistance distribution between the strand and the copper sleeve is homogeneous, when twist pitches of 3 rd and 4 th sub-cables are aliquot part of a twist pitch of a 5 th sub-cable. 26

27 Thank you for your attention.

We measured the resistance distribution between the strands and the copper sleeve at LHe temperature (4.2 K) Measurement system 28 Cryostat

Calculation of Elastic Potential Energy wnwn E n : hypothetical elastic modulus (simulate twist under 3D component ) E strand : Young’s modulus of strand w strand, w conduit  r = r – r 0 calculate following component in each section  w strand, w conduit energy of strand deformation by strand and conduit  w n energy of n stage sub-cable’s deformation

Evaluation of strands’ positions Evaluate all strands’ positions in each section by  1 st Sub-Cable (triplet) Deformation  Loop Length between strands  Contact Length between strands Schematic view of deformation of a triplet at a cross section.