High-Temp Life Test #1 Update Jason McPhate LAPP Tuesday Telecon 17 May 2011.

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Presentation transcript:

High-Temp Life Test #1 Update Jason McPhate LAPP Tuesday Telecon 17 May 2011

Dual MCP, High Temp Build All detector parts compatible with tube processing temperatures (350°C) Pair of Arradiance functionalized MCPs – INCOM “first batch” substrates, 33mm, 20µm, 60:1, 60% OAR, 8° – Arradiance S/Ns S00613 (top), S00612 (bot). Resistance matched (458 MΩ and 431 MΩ, respectively) – No inter-plate gap 217 May 2011J. McPhate – LAPP Tuesday Telecon

Pre-Scrub 350°C Bake-Out 317 May 2011J. McPhate – LAPP Tuesday Telecon Principal outgassing component is hydrogen – dominant source would be stainless vessel Bake performed on turbo pump Detector “pot” heated with two heater collars Temp at or over 350° for ~16 hours RGA monitoring outgassing RGA not pre-baked (error)

Photo-Current vs. Time 417 May 2011J. McPhate – LAPP Tuesday Telecon Begin at ~1 µA bump voltage to stay there Bump Voltage to get ~2 µA Now at ~3 µA Gain vs. Voltage RGA Outgassing Check

Relative Gain vs. Extracted Charge 517 May 2011J. McPhate – LAPP Tuesday Telecon Despite bake-out, there is still significant initial gain drop from outgassing

Comparison to Commercial MCPs 617 May 2011J. McPhate – LAPP Tuesday Telecon Both matched pairs of similar pore diameter Different L/D ratios Both put through similar bake- out procedures Similar scrub extractions Scrub-down behavior is similar Perhaps quicker stabilization for ALD MCPs

Extended Gain vs. Voltage 717 May 2011J. McPhate – LAPP Tuesday Telecon Measure gain in photon counting mode Switch to photo-current collection to extend to lower gain Increase flux to go even lower Repeat Scrub gain about x lower than operational gain (when at 1µA scrub current)

RGA Scans at Start of 3µA Scrubbing 817 May 2011J. McPhate – LAPP Tuesday Telecon

Scrub On-Off RGA Comparison 917 May 2011J. McPhate – LAPP Tuesday Telecon Principal MCP outgas component appears to be H 2