Timed Test Cases Generation Based on MSC-2000 Test Purposes Abdeslam En-Nouaary and Gang Liu Department of Electrical and Computer Engineering Concordia.

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Presentation transcript:

Timed Test Cases Generation Based on MSC-2000 Test Purposes Abdeslam En-Nouaary and Gang Liu Department of Electrical and Computer Engineering Concordia University Montréal, Québec, Canada November 2, 2004

Abdeslam En-Nouaary & Gang Liu Timed Test Cases Generation based on MSC-2000 Test Purposes Contents n Introduction n Overview of Conformance Testing n Our Approach for Timed Test Cases Generation Based on Test Purpose n Conclusion and Future Works

Abdeslam En-Nouaary & Gang Liu Timed Test Cases Generation based on MSC-2000 Test Purposes Introduction n What is a real-time system ? - A system whose behavior is time dependent. - Example: air traffic control, monitoring medical device, multimedia applications. n Some characteristics of real-time systems? - real-time systems have complicated behaviors - failure could cost lives and huge economy damage - too much test cases generated by existing algorithms - Testing both actions and their time constraints

Abdeslam En-Nouaary & Gang Liu Timed Test Cases Generation based on MSC-2000 Test Purposes Overview of Conformance Testing

Abdeslam En-Nouaary & Gang Liu Timed Test Cases Generation based on MSC-2000 Test Purposes Main Operations of Our Approach n Four Phases: - Conversion of MSC test purpose into TIOA. - Synchronous product construction - Sampling - Test cases generation

Abdeslam En-Nouaary & Gang Liu Timed Test Cases Generation based on MSC-2000 Test Purposes FrameWork--- 1 st Variant

Abdeslam En-Nouaary & Gang Liu Timed Test Cases Generation based on MSC-2000 Test Purposes Timed Input Output Automata (TIOA) A Timed Input Output Automata (TIOA) is a tuple (I, O, L, l0, C, T), where: u I: the set of inputs. u O: the set of outputs. u L: the set of locations. u l0: the initial location. u C: the set of clocks all initialized to 0 in l0. u T : the set of transitions. A 2-Clock TIOA

Abdeslam En-Nouaary & Gang Liu Timed Test Cases Generation based on MSC-2000 Test Purposes Problems Related to Testing TIOA n Executability of test cases. n Infinity of time domain. n Fault Model. n Fault coverage. n Conformance relation. A 2-Clock TIOA

Abdeslam En-Nouaary & Gang Liu Timed Test Cases Generation based on MSC-2000 Test Purposes Message Sequence Chart (MSC) n A MSC is a structure: M = (P, S, R, A, O, T, Tx, Y), where: - P is a finite set of instances - - S is a finite set of sending Message events - - R is a finite set of receiving message events - - A is a finite set of local events - - O is ordering of S,R and A - - T is set of timers - - Tx associates each timer related event with its timer - - Y associates each pair of dependent events with its timing restriction and duration

Abdeslam En-Nouaary & Gang Liu Timed Test Cases Generation based on MSC-2000 Test Purposes Converting MSC to TIOA n SIMPLE MSC assumptions n Received Msg and Send Msg -> Input and Output in TIOA n Create initial location and final location n For each event -> create a destination location n Each event is converted to a transition n Time constraints -> clocks and guards

Abdeslam En-Nouaary & Gang Liu Timed Test Cases Generation based on MSC-2000 Test Purposes Clock Minimizing

Abdeslam En-Nouaary & Gang Liu Timed Test Cases Generation based on MSC-2000 Test Purposes Synchronous Product Construction specificationTest Purpose Synchronous Product

Abdeslam En-Nouaary & Gang Liu Timed Test Cases Generation based on MSC-2000 Test Purposes Sampling – Grid Automaton

Abdeslam En-Nouaary & Gang Liu Timed Test Cases Generation based on MSC-2000 Test Purposes Traversal – Test Cases Derivation

Abdeslam En-Nouaary & Gang Liu Timed Test Cases Generation based on MSC-2000 Test Purposes FrameWork--- 2 nd Variant

Abdeslam En-Nouaary & Gang Liu Timed Test Cases Generation based on MSC-2000 Test Purposes Sampling First GA of specificationGA of Test Purpose Synchronous Product of GA

Abdeslam En-Nouaary & Gang Liu Timed Test Cases Generation based on MSC-2000 Test Purposes Sampling with Different Granularities

Abdeslam En-Nouaary & Gang Liu Timed Test Cases Generation based on MSC-2000 Test Purposes Conclusion and Future Works n Conclusion - an integrated process is provided - solves time related problems - less test cases generated than other methods n Future Works - extend the approach to a general form of MSC - multi instances (processes) included - test cases expressed as Tree and Tabular Combined Notation (TTCN)