Institute of Physical Chemistry “Ilie Murgulescu”, Romanian Academy

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Institute of Physical Chemistry “Ilie Murgulescu”, Romanian Academy Improved TCO materials for the next generation transparent electronics and their complex investigation by wide range ellipsometry from UV to Mid IR PN II-ID-PCE-IDEI 12/05.10.2011 Project Director: Dr. Mariuca Gartner 1

Project Summary Transparent conductive oxides (TCO) are materials that exhibit electrical conductivity and high optical transparency together with a wide band-gap. The traditional applications of these materials are flat-panel displays, light-emitting diodes, solar cells, and imaging sensors. The aim of this project is the preparation by low-cost sol-gel methods of improved TCO (ITO, ZnO) and of new generation of TCO (Nb or V doped TiO2, SrCu2O2) n and p type films with various morphologies on different substrates (silicon, glass and plastics), having a very stable surface. A complete optical and microstructural characterization of the TCO samples will be performed by ellipsometry in a wide spectral range, from UV to Mid-IR (our IR ellipsometer being the only one available in Romania) and the results will be corroborated with those obtained by complementary methods (UV-VIS, IR and Raman spectroscopy, XRD, XPS, AFM, SEM, TEM, electrical measurements). A database for optical constants of the TCO investigated materials in the IR range (2-33m), which for the moment is lacking in the literature, will be provided. In the frame of this project the best films obtained will be used in specific tests for solar-cell application. 2

Budget Budget category 2011 (lei) 2012 1. Staff expenses 63500.00 No. Budget category 2011 (lei) 2012 1. Staff expenses 63500.00 333500.00 2. Indirect expenses 16700.00 116700.00 3 Mobilities 0.00 42753.80 4. Logistic costs 20000.00 207246.20 TOTAL 100200.00 700200.00 3

Research team No. Surname and first name Year of birth Scientific title Doctorate 1 Zaharescu Maria 1938 Senior Researcher I M.C. Acad, Dr 2 Osiceanu Petre 1949 Dr 3 Mihaiu Susana 1952 Senior Researcher II 4 Anastasescu Mihai 1971 Senior Researcher III 5 Predoana Luminita 1973 6 Stoica Mihai 1979 Researcher assistent 7 Stroescu Hermine 1976 Researcher Ph D Student 8 Preda Silviu 1977 9 Marin Alexandru 1986 10 Penea Cornelia 1962 technician - 4

(1a) Deposition of ITO films by reactive sputtering Objectives & activities / Year Project objectives in 2011 (1a) Deposition of ITO films by reactive sputtering (1b) Stabilization of the surfaces by thermal treatment of these samples in N2 atmosphere Project objectives in 2012 (2a) Optical and electrical characterization of the ITO films (2b) Stability study of the samples in time and of the optimization routes regarding chemical and physical stabilization of the sample surfaces (2c) Obtaining of n and p-type conduction ITO and ZnO by sol-gel method 5 E-MRS 2012 SPRING MEETING, Strasbourg Francr. Mai 13-18, 2012 EMRS SPRING MEETINGS, Strasbourg, France, May 14-18, 2012E-MRS 2012 SPRING MEETING, Strasbourg Francr. Mai 13-18, 2012

Scientific contributions based on the results obtained in 2011-2012 Published papers Influence of the Substrate and Nitrogen Amount on the Microstructural and Optical Properties of Thin r.f.-Sputtered ZnO Films Treated by Rapid Thermal Annealing, M. Nicolescu, M. Anastasescu, S. Preda, H. Stroescu, M. Stoica, V.S. Teodorescu, E. Aperathitis, M. Modreanu, M. Zaharescu, M. Gartner”, Appl.Surf.Sci., 261 (2012) 815– 823 (FI = 2.103) Submitted papers Influence of thermal treatment in N2 atmosphere on chemical, microstructural and optical properties of ITO and ITO:N sputtered thin films, H.Stroescu, M.Anastasescu, S.Preda, M.Nicolescu, M.Stoica, N.Stefan, E. Aperathitis, M.Modreanu, M.Zaharescu, M. Gartner- Thin Solid Films - in print (FI=1.89) Optical investigations of tin and zinc oxides as TCOs films, Al. Toader, S. Mihaiu, M. Voicescu, M. Anastasescu, H. Stroescu, M. Nicolescu, I. Atkinson, M. Gartner, M. Zaharescu, accepted Proceedings of SPIE, 2012 6

Scientific contributions based on the results obtained in 2011-2012 Conferences: oral presentations Influence of thermal treatment in N2 atmosphere on chemical, microstructural and optical properties of ITO and ITO:N sputtered thin films, H.Stroescu, M.Anastasescu, S.Preda, M.Nicolescu, M.Stoica, N.Stefan, E. Aperathitis, M.Modreanu, M.Zaharescu, M. Gartner- EMRS, Spring Meeting, 13-18 Mai 2012, Strasbourg, Franta Influence of the Substrate and Nitrogen Amount on the Microstructural and Optical Properties of Thin r.f.-Sputtered ZnO Films Treated by Rapid Thermal Annealing, M.Nicolescu, M. Anastasescu, S.Preda, H.Stroescu, M.Stoica, V.S.Teodorescu, E.Aperathitis, M. Modreanu, M.Zaharescu, M.Gartner”, JVC-14 / EVC-12 / AMDVG-11 / CroSloVM-19 conference, 3-8 Iunie 2012, Dubrovnik, Croatia. Optical investigations of tin and zinc oxides as TCOs films, Al. Toader, S. Mihaiu, M. Voicescu, M. Anastasescu, H. Stroescu, M. Nicolescu, I. Atkinson, M. Gartner, M. Zaharescu, Atom-2012, 23-26 August, Constanta, Romania Transparent Conductive Oxides (TCO) - properties and stability studies, M. Anastasescu, M. Nicolescu, S. Preda, H. Stroescu, M. Stoica, E. Aperathitis, V. Kampylafka, M. Modreanu, M. Zaharescu, M.Gartner, ”Current trends and advanced ellipsometry and all X-ray techniques for the characterization of TCO, BIO and other nanostructured materials” workshop, 12-14,Septembrie 2012, Bucuresti, Romania TCO sol-gel films based on tin and zinc oxides, Al. Toader, S. Mihaiu, M. Voicescu, M. Anastasescu, H. Stroescu, M. Nicolescu, I. Atkinson, M. Gartner and M. Zaharescu, ”Current trends and advanced ellipsometry and all X-ray techniques for the characterization of TCO, BIO and other nanostructured materials” workshop, 12-14,Septembrie 2012, Bucuresti, Romania Preparation and Characterization of Nanostructured ZnO Thin Films for Solar Cell Application, E. P. Zaretskaya , V.A. Ivanov, V.B. Zalesski, M. Stoica, M. Nicolescu, M. Gartner, International Conference on Modern Applications of Nanotechnology, 27-29 June 2012, Minsk , Belarus 7

Scientific contributions based on the results obtained in 2011-2012 Conferences: poster presentations The stability of the ITO sputtering films by thermal treatment in N2 atmosphere, H. Stroescu, E. Aperathitis P.Osiceanu, M. Anastasescu, A.Marin, M. Modreanu, O. Buiu, M. Gartner, "7th Workshop Ellipsometry", 4-8 Martie, 2012, Leipzig, Germania Investigation of the surface chemistry of ITO / ITON thin films before and after N2 passivation, A. Marin, E. Aperathitis, P. Osiceanu, S.Preda, M. Modreanu, M. Gartner, M. Zaharescu, EMRS, Spring Meeting, 13-18 Mai 2012, Strasbourg, Franta Structural Characterization of Different TCO films obtained by various vacuum deposition method, S.Preda, M.Gartner, S.Mihaiu, L. Predoana, M. Zaharescu, JVC-14 / EVC- 12 / AMDVG-11 / CroSloVM-19 conference, 3-8 Iunie 2012, Dubrovnik, Croatia Structural, morphological and optical properties of SrCu2O2 thin films, M. Stoica, H. Stroescu, M. Anastasescu, M. Modreanu, N. Jamond, G. Garry, M. Gartner, JVC-14 / EVC- 12 / AMDVG-11 / CroSloVM-19 conference, 3-8 Iunie 2012, Dubrovnik, Croatia Optical investigations of tin and zinc oxides as TCO’s films, Al. Toader, S. Mihaiu, S.Preda, M. Gartner, I. Atkinson and M. Zaharescu, Atom-2012, 23-26 August, Constanta, Romania Nitrogen evolution during annealing of sputtering Indium Tin Oxide films studied by XPS, A. Marin, P. Osiceanu, E. Aperathitis, A. Szekeres, M. Modreanu, M. Gartner, "17th International School on Condensed Matter Physics", 2-8 Septembrie, Varna, Bulgaria Optical, structural and chemical study of TCO thin film after chemical and physical treatment, H. Stroescu, M. Nicolescu, M. Anastasescu, M. Stoica, A. Marin, P. Osiceanu, M. Modreanu, E. Aperathitis and M. Gartner, "17th International School on Condensed Matter Physics", 2-8 Septembrie, Varna, Bulgaria Surface chemistry of RF-sputtering Indium Tin Oxide and Indium Tin Oxynitride thin films, A. Marin, P. Osiceanu, E. Aperathitis, A. Szekeres, M. Modreanu, M. Gartner,”Current trends and advanced ellipsometry and all X-ray techniques for the characterization of TCO, BIO and other nanostructured materials” workshop, 12-14, Septembrie 2012, Bucuresti, Romania AFM, XPS and ellipsometric observations on ITO thin film versus annealing type, H. Stroescu, M. Nicolescu, M. Anastasescu, M. Stoica, A. Marin, P. Osiceanu, M. Modreanu, E. Aperathitis and M. Gartner, ”Current trends and advanced ellipsometry and all X-ray techniques for the characterization of TCO, BIO and other nanostructured materials” workshop, 12-14, Septembrie 2012, Bucuresti, Romania 8