CONTROL SOFTWARE On December 11th 2006 By Juha Petäjäjärvi On December 11th 2006 By Juha Petäjäjärvi
VFATGUIDebugger Tests available: I 2 C Power On Pulsing Channels One or all channels User defined range NEW Channels’ TrimDAC values NEW eUser defined for all channels eChannel specific Threshold Scan User defined range Inverted Latency Scan User defined range Phases NEW DAC Characterization NEW
VFATGUIDebugger To do list: Usability / GUI improvements Support for scanning multiple VFATs on same run Currents / voltages to control panel Lookup table for every DAC on every VFAT used needed
CCHIPGUIDebugger Control / test software for TOTEM Coincidence chip So far tested only with emulator Will appear to CVS during this week...