May 8, USB High Speed Compliance Program Overview Dan Froelich Intel Corporation

May 8, Agenda w USB-IF Compliance Testing History w USB High Speed Compliance Program Goals w FS and LS Testing Summary and Additions w New Test Development Process w New Compliance Tests – High Speed Electricals – Transaction Translator Test Suite – USBCheck Updates w HS Compliance Program Milestones w Summary

May 8, History w USB-IF Full/Low Speed Compliance Program – Long evolution from 1996 (USB 1.0) to today (2001) S3 Inrush Signal Quality, S1 USBCheck, Hidview, Interoperability Chap 11, OHCI, Current Chap 9, UHCI, Drop/Droop S3 Inrush Signal Quality, S1 USBCheck, Hidview, Interoperability Chap 11, OHCI, Current Chap 9, UHCI, Drop/Droop ‘96 Year TestingTesting TestingTesting LevelLevel LevelLevel ‘97 ‘98 ‘99 ‘00 ‘01

May 8, Compliance Program Evolution w The USB HS Compliance Program is an extension of the USB FS/LS Compliance Program – Years of experience – Tools already in place – Full Speed Tests Apply to – High Speed Devices USB HS Compliance Program Will Start at a High Level! Today Tomorrow HS FS/LS

May 8, Goals of the Compliance Program w High Quality USB 2.0 Products w Stable, Repeatable, Well Documented Tests – Documented Test Procedures – Documented Test Assertions and Descriptions w Instantly Available Testing (Qualified Test Houses) w Leverage USB 1.1 Compliance Program – Reuse USB Check – Reuse Interoperability Test Procedures – Reuse Full and Low Speed Electrical Testing w Minimize Test Equipment Costs

May 8, Agenda w USB-IF Compliance Testing History w USB High Speed Compliance Program Goals w FS and LS Testing Summary and Additions w New Test Development Process w New Compliance Tests – High Speed Electricals – Transaction Translator Test Suite – USBCheck Updates w HS Compliance Program Milestones w Summary

May 8, Full and Low Speed Testing w Current Consumption w USBCheck – Chapter 9 – Chapter 11 – HidView w Interoperability – HS Device and Hub Additions – Power Management w USB FS/LS Test Fixtures – Droop/Drop – Inrush – FS/LS Signal Quality – Backdrive voltage

May 8, Current Consumption w Unconfigured – 100 ma max w Configured – 100 ma Max (Low Power) – 500 ma Max (High Power) – < bMaxPower value w Active/Operating (Same as Configured) w Suspend – 500 ua max – 2.5 ma max for high power devices with remote wakeup enabled

May 8, USBCheck – Chapter 9 Additions w Other Speed Device Qualifier and Configuration Descriptors – HS/FS Devices Must Use In Either Environment – Standard Configuration Descriptors Only For Current Environment w Endpoint Packet Size and Interval Rules w HS Devices Tested At High and Full Speeds w bcdUSB = 0200H for ANY device designed to 2.0 Spec HS Capable Devices Must Function in FS Environments

May 8, Compliance Tool USBCheck USB Check 5.0 Beta 3 Released

May 8, Interoperability Testing w Same Tree For HS/FS/LS Testing w Similar To FS/LS Interopability – All Transfer Types – 5 hubs deep with 5 meter cables (i.e. Tier 6) – Mix of speeds – Power Management (S3) w Test devices at both Full and High Speeds w Current Test Procedures Online Root HS Hub DUT HS Hub Other Devices Other Devices FS Hub HS Hub

May 8, Full and Low Speed Electrical Tests w Current w Inrush w Drop w Backdrive Voltage w Droop w Full/Low Speed Signal Quality USB Check 5.0 Beta 3 Released

May 8, Agenda w USB-IF Compliance Testing History w USB High Speed Compliance Program Goals w FS and LS Testing Summary and Additions w New Test Development Process w New Compliance Tests – High Speed Electricals – Transaction Translator Test Suite – USBCheck Updates w HS Compliance Program Milestones w Summary

May 8, Test Suite Development Process Universal Serial Bus Specification Revision 2.0 April 27, 2000 April 27, 2000 Universal Serial Bus Specification Revision 2.0 April 27, 2000 April 27, 2000 Transaction Translator And Hub Compliance Test Specification Revision.91 March 15, 2001 Transaction Translator And Hub Compliance Test Specification Revision.91 March 15, 2001 Test Assertions TestSuite Test Results Refer To Assertions

May 8, Test Specification Format w Test Assertions w Test Descriptions – Occupy All Non-Periodic Buffers * – Issue Clear TT For One Buffer – Attempt Transaction For Cleared Endpoint HS Electrical Test Spec version 1.0 and TT/Hub Test Specification Rev.91 Posted In Members Site A Transaction Translator must clear an asynchronous (non-periodic) buffer associated with the given endpoint in response to a valid Clear TT Buffer request. Specification Ref: Universal Serial Bus Specification, Revision 2.0. Section Test Description: TD.1.11 RequirementSource Test Covering Req

May 8, Test Procedures w Full and Low Speed Compliance Test Procedure – Covers FS/LS Hub, Device, and Host/System Testing u Drop/Droop, InRush, Signal Quality, Current Consumption u USBCheck, Interoperability – 1.0 RC2 Release on – USBCheck HS Changes To Be Added w High Speed Electrical Compliance Procedure – Very Thorough Coverage – Initial Post for Member Review in June

May 8, Agenda w USB-IF Compliance Testing History w USB High Speed Compliance Program Goals w FS and LS Testing Summary and Additions w New Test Development Process w New Compliance Tests – High Speed Electricals – Transaction Translator Test Suite w HS Compliance Program Milestones w Summary

May 8, New Testing Areas w HS Electricals – High Speed Signal Quality – Time Domain Reflectometry (TDR) – Receiver Sensitivity and Squelch – J and K Voltage Levels – ChIRP – Packet Parameters – Suspend/Resume w Transaction Translator – Full Functional Test – Protocol Response Cases – Implementation Rules w HS Hub Repeater – Sync Bits – Latency – EOP Dribble

May 8, USB HS Test Fixture HS Relay Test Port InitializationPort Diff Probe DataGenerator 90 Ohms PowerSelectionCktPowerSelectionCkt Vbus1Vbus2 Vcc Gnd New Test Fixture(s) w High Speed Isolation Relay w Ideal Terminations w Selectable VBUS Source w USB-IF Will Provide

May 8, General HS Electrical Test Procedure w Connect Device Under Test To Test Port on Fixture w Configure DUT With Test Mode SW w Isolate DUT from Host with High Speed Relay w Make Appropriate Electrical Measurements

May 8, Electrical Example – HS Receiver Sensitivity w DUT Placed In Test_SEO_NAK Mode w Data Generator Generates IN Packets w Device Must Respond For In Spec Packets w Device Must Not Respond to Out of Spec Data Generator Output Data Generator Test Mode SW USB 2.0 Test Fixture HS Relay Device Under Test Test SMA

May 8, Electrical Example – High Speed Repeater Testing w Put Hub Port in Test_Force_Enable w Test SW Generates Downstream Traffic w Capture Pre/Post Hub Signals w Analyze Data – Sync Truncation – EOP Dribble – Latency Test Mode SW Oscilloscope Hub Under Test Breakout Board HS Electrical Test Specification Rev 1.0 Released

May 8, Agenda w USB-IF Compliance Testing History w USB High Speed Compliance Program Goals w FS and LS Testing Summary and Additions w New Test Development Process w New Compliance Tests – High Speed Electricals – Transaction Translator Test Suite w HS Compliance Program Milestones w Summary

May 8, Transaction Translator w Sophisticated Functional Unit w Bulk/Control Transaction Buffers w Periodic Pipeline w New Protocols TT/Hub Test Specification Rev.91 Released HS Device Device LSDevice Port MHz 12 MHz 1.5 MHz Port 2 Port N FSDevice Hub Hub State Hub Hub State Repeater Machines Hub Hub State Hub Hub State Repeater Machines HubControllerHubController High Speed Connection Transaction Translator TranslatorTransaction Port Routing Logic

May 8, Test Suite Architecture Test Executive Hub and TT Test DLL Test Services Intel Test Stack MS USBDI Interface FS Test Device LS Test Device

May 8, Test Devices - OverView w Basic Functionality – Full Speed – Low Speed – All Transfer Types – Multiple Endpoints w Protocol Level Control – Produce All Possible Device Responses – Allows Testing of Corner Cases w Defined Device Interface (Test Device Class) – Allows Any Capable PDK/Device to Be Used – Vendor Command Based – Allows Dynamic Device Reconfiguration

May 8, Test Services - Architecture Test Services Host Controller Port Host Port Hub Port EndPoint Test Device EndPoint Stack Interface MS USBDI Interface Intel EHCI Test Stack Device Node Device Node List Minimal I/O Interface Read Write Select Host Controller Enumerate Do Control Request Set/Clear Port Feature Hub Device Test Device Device

May 8, Test Executive w Standard GUI w Logging – Assertion Pass/Fail – Time/Date/Version Stamps w Multi-Threading Support – Multiple Transfer Streams – Simpler Tests w Robust - Well Tested Engine w Tests are Simple DLL Functions Several Third Party Test Executives Under Evaluation USBCheck Rewrite With Same Model Planned

May 8, Note: all dates provided are for planning purposes only and are subject to change Compliance Program Milestones w HS Logo Testing – Device Testing PreviewOctober 2000 – First Host Controller CertifiedNovember 2000 – First Device CertifiedDecember 2000 – Full Device Testing Available At Compliance WorkshopsJanuary 2001 – Full Hub Testing Available at Intel Test LabMarch 2001 w Test Specifications – HS Electrical v. 1.0 Released To USB-IF MembersMarch 2001 – TT/Hub v.91 Released to USB-IF MembersMarch 2001 – TT/Hub v 1.0 ReleaseJune 2001 w HS Electrical Test Suite – USB-IF Test Procedure ReleaseJune 2001 – USB-IF High Speed Test Fixture ReleaseOctober 2001 – USB-IF Test Mode SW ReleaseOctober 2001

May 8, Note: all dates provided are for planning purposes only and are subject to change * Other brands and names may be claimed as the property of others. Compliance Program Milestones w TT/Hub Test Suite – Full/Low Seed Test Device SpecificationJune 2001 – Full Speed Compliance Test DeviceOctober 2001 – Low Speed Compliance Test DeviceOctober 2001 – USB-IF Automated Test Suite ReleaseOctober 2001 w USBCheck – USB-IF 5.0 Beta 3 Windows 2000* Release - HS Support March 2001 – USB-IF 5.0 Release for Windows XP July 2001 – USB-IF USBCheck Rewrite – Initial Release October 2001 w Test House Certification – Formal HS Training Begins June/July 2001 – HS Certified Test House October 2001

May 8, Summary w Thorough Electrical Tests – High Speed Electrical – High Speed Hub Repeater w Thorough Functional Test of Transaction Translator – Test Suite – Test Devices w Well Documented Tests – Test Procedures – Test Specifications Great Steps Being Taken To Ensure USB 2.0 Success

May 8, Questions?