Multichannel Phenomenon of Symmetrical Structure Optical Filter Guoxun Tian April 23, 2007 ATMS790 Seminar (Dr. Pat Arnott)

Slides:



Advertisements
Similar presentations
Vapor-deposited thin films with negative real refractive index in the visible regime J. J. Yi, A. Lakhatakia, W. Y. Ching, T.L. Chin Optics Express Vol.
Advertisements

Waves (in general) sine waves are nice
Optical sources Lecture 5.
IV. Optics Nature of light. Spectrum of electromagnetic waves.
Created by Stephanie Ingle Kingwood High School
AP Physics Mr. Jean March 30 th, The plan: Review of slit patterns & interference of light particles. Quest Assignment #2 Polarizer More interference.
Department of Physics and Astronomy The University of Sheffield 1.
1 Components of Optical Instruments, Cont… Lecture 6.
INTEGRATED CIRCUITS Dr. Esam Yosry Lec. #6.
1 UCT PHY1025F: Geometric Optics Physics 1025F Geometric Optics Dr. Steve Peterson OPTICS.
A Model for Light Chapter 18. What light is? n Newton: light is a stream of tinny particles n Huygens: light is a wave n due to Newton’s great reputation,
When light passes from vacuum (index of refraction n = 1) into water (n = 1.333), Q33.1 A. the wavelength increases and the frequency is unchanged. B.
Today’s agenda: Thin Film Interference. Phase Change Due to Reflection. You must be able to determine whether or not a phase change occurs when a wave.
Optical Fiber Communications
OPTICAL COMPONENTS 9/20/11. Applications See notes.
Cell and module construction. Photovoltaic effect and basic solar cell parameters To obtain a potential difference that may be used as a source of electrical.
The Hong Kong Polytechnic University Optics II----by Dr.H.Huang, Department of Applied Physics1 Interference Conditions for Interference: (i) (  2 
Properties of Multilayer Optics An Investigation of Methods of Polarization Analysis for the ICS Experiment at UCLA 8/4/04 Oliver Williams.
OPTICAL FIBER WAVEGUIDE Optical Fiber Waveguides An Optical Fiber is a dielectric waveguide that operates at optical frequencies Normally cylindrical.
Dr. Jie ZouPHY Chapter 35 The Nature of Light and the Laws of Geometric Optics.
Chapter 25: Interference and Diffraction
IV. Optics Nature of light. Spectrum of electromagnetic waves.
Free-Space MEMS Tunable Optical Filter in (110) Silicon
9.12 Diffraction grating • Order of diffraction
Cross section measurements for analysis of D and T in thicker films Liqun Shi Institute of Modern Physics, Fudan University, Shanghai, , People’s.
Anti-reflection optical coatings Anti-reflection coatings are frequently used to reduce the Fresnel reflection. For normal incidence, the intensity reflection.
1© Manhattan Press (H.K.) Ltd. Reflection Refraction Refraction 12.1 Reflection and refraction Total internal reflection Total internal reflection.
Optical characteristics of the EUV spectrometer for the normal-incidence region L. Poletto, G. Tondello Istituto Nazionale per la Fisica della Materia.
Optical Components Ajmal Muhammad, Robert Forchheimer
Polarization-preserving of laser beam in Fabry Perot Cavity Accelerator center, IHEP Li Xiaoping.
Silver / Polystyrene Coated Hollow Glass Waveguides for the Transmission of Visible and Infrared Radiation Carlos M. Bledt a and James A. Harrington a.
D EDICATED S PECTROPHOTOMETER F OR L OCALIZED T RANSMITTANCE A ND R EFLECTANCE M EASUREMENTS Laetitia ABEL-TIBERINI, Frédéric LEMARQUIS, Michel LEQUIME.
Overview of course Capabilities of photonic crystals Applications MW 3:10 - 4:25 PMFeatheringill 300 Professor Sharon Weiss.
INTEGRATED CIRCUITS Dr. Esam Yosry Lec. #2. Chip Fabrication  Silicon Ingots  Wafers  Chip Fabrication Steps (FEOL, BEOL)  Processing Categories 
3.18. Defects caused by reflections We have assumed that the paraxial approximation applies in that all rays make small angles with respect to the optical.
Refraction is the change of direction of a light wave caused by a change in speed as the wave crosses a boundary between materials.
Waveguide High-Speed Circuits and Systems Laboratory B.M.Yu High-Speed Circuits and Systems Laboratory 1.
For the E// component, the phase change // is given by
WAVE OPTICS & LASER.
Electrical and optical properties of organic materials are closely related to its molecular orientation. SE is employed in the understanding of molecular.
When light passes from vacuum (index of refraction n = 1) into water (n = 1.333), Q the wavelength increases and the frequency is unchanged 2. the.
Divergent Illumination Optical Testing Device M. Fried 1, Z. Horváth 2, G. Juhász 1, O. Polgár 1, T. Mosoni 1, P. Petrik 1 1 Research Institute for Technical.
Cascaded Solid Spaced Filters for DWDM applications
Lecture Outline Chapter 22 College Physics, 7 th Edition Wilson / Buffa / Lou © 2010 Pearson Education, Inc.
1 Use of gratings in neutron instrumentation F. Ott, A. Menelle, P. Humbert and C. Fermon Laboratoire Léon Brillouin CEA/CNRS Saclay.
Itoh Laboratory Masataka Yasuda
Fundamental of Optical Engineering Lecture 9.  The amount of light reflected when a beam moves from one media to another can be reduced by placing a.
Today’s agenda: Thin Film Interference.
Conditions for Interference
High performance optical absorber based on a plasmonic metamaterial 岑剡.
Sputtering. Why? Thin layer deposition How? Bombarding a surface with ions which knocks out molecules from a target which in turn will redeposit onto.
Narrow-band filtering with resonant gratings under oblique incidence Anne-Laure Fehrembach, Fabien Lemarchand, Anne Sentenac, Institut Fresnel, Marseille,
Zhanshan Wang, Zhenxiang Shen, Qiushi Huang, ZhongZhang, Bin Ma Institute of Precision Optics and Engineering (IPOE), Tongji University Institute of Precision.
17. Electromagnetic waves
Design of Alternately Stacked ZnS/MgF2 and CdS/MgF2 Ultra-Thin Multilayer Optical Filters Vemuri SRS Praveen Kumara,b, Parinam Sunitaa,b, Mukesh Kumara,b,
Design and Fabrication of Alumina/Silica Optical Bandpass Filter
J.Kalkman, A.Tchebotareva, A.Polman, T.J.Kippenberg,
Multiple Beam Interference
Refraction of light c n = v
IV. Optics Nature of light. Spectrum of electromagnetic waves.
Luminescent Periodic Microstructures for Medical Applications
Today’s agenda: Thin Film Interference.
INTERFERENCE: In physics, interference is a phenomenon in which two waves superpose to form a resultant wave of greater, lower, or the same amplitude.
Date of download: 11/9/2017 Copyright © ASME. All rights reserved.
Reproducibility Analysis of E-beam Deposited Multilayer Dielectric Reflective Filter Nancy Sharmaa , P Sunitaa, b, VSRS Praveen Kumara,b , Gaurav Dwivedia,
IV. Optics Nature of light. Spectrum of electromagnetic waves.
List of materials which have been evaporated:
Optical Fiber Communications
Today’s agenda: Thin Film Interference.
Presentation transcript:

Multichannel Phenomenon of Symmetrical Structure Optical Filter Guoxun Tian April 23, 2007 ATMS790 Seminar (Dr. Pat Arnott)

Outline 1. Mutiple reflection in Multilayer film 2. Introduction of Fabry-Perot filter 3. Multichannel Phenomenon in double-symmetrical structure 4. Design of double-linear filter 5. Two-chamber integrated multichannel narrowband filter 6. Review

1. 1. Mutiple reflection in Multilayer film  A multilayer

A Fabry-Perot filter showing multiple reflections in the spacer layer 2. Fabry-Perot filter

Mirror Cavity 2. Fabry-Perot filter C  Structure of Fabry-Perot Filter This is a symmetrical structure and the position of channel was calculated by equivalent surface method

Structure of this Fabry-Perot filter: (HL) 7 H C (LH) 7, where the number “7” is the periodic number and c is the periodic thickness of the cavity layer. 1H=1L=n H d H =n L d L =λ 0 /4, where d H and d L are the physical thickness of high and low refractive index material respectively, λ 0 =600 nm. Vertical incidence, n H =2.3 and n L =1.44. Refractive index of substrate is n=1.52. Absorbance of the material of material is neglected to simplify the theoretical calculation.  Simulated conditions 2. Fabry-Perot filter

 Equivalent surface method 2. Fabry-Perot filter

 Equivalent surface method Maintains two mirrors invariably It means that  1 and  2 are constants C is the thickness of Layer C  (  =2  nC/ ) Changes the thickness of layer C to satisfy the following formula  1 +  2 - 2  nC/ =2k  (k=±1 , 2 , 3 ) = 2  nC/ [2k  +(  1 +  2 )]  Calculation of channel’s position 2. Fabry-Perot filter

 Multichannel Fabry-Perot Filter Two-channel filter 492nm/598nmThree-channel filter487nm/550nm/632nm 2. Fabry-Perot filter

 Channel can be moved continuously by changing layer C The position of channels are correlated. It is difficult to design a useful two-channel filter by this structure because we can not ensure every channel on it’s position.  Deficiency in this structure 2. Fabry-Perot filter

Fabry-Perot structure Coupling layer CCd Double-symmetrical structure based on Fabry Perot structure  Double-symmetrical structure based on Fabry Perot structure 3. Multichannel Phenomenon in double-symmetrical structure

Movement of Channel position while d changes and C is fixed  Adjustment of Channel position 3. Multichannel Phenomenon in double-symmetrical structure  Calculated spectrum of double-symmetrical structure

3. Multichannel Phenomenon in double-symmetrical structure  Adjustment of Channel position  Calculated spectrum of double-symmetrical structure Movement of Channel position while C changes and d is fixed

 Calculated spectrum and experiment spectrum (HL) 3 HL C H(HL) 3 L D (HL) 3 HL C H(HL) 3 3. Multichannel Phenomenon in double-symmetrical structure (a) d changes and C is fixed (b) C changes and d is fixed Here H=L=n H d H =n L d L =λ 0 /4 , λ 0 =749nm , n H =2.2 , n L =1.44

3. Multichannel Phenomenon in double-symmetrical structure  Calculated spectrum and experiment spectrum (1H1L) 3 1H1L C 1H(1H1L) 3 1L D (1H1L) 3 1H1L C 1H(1H1L) 3 (a) d changes and C is fixed (b) C changes and d is fixed

 Film structure of double-linear filter 4. Design of double-linear filter

 Relationship between incident point and spectrum  Incident point move along X axis 4. Design of double-linear filter

 Relationship between incident point and spectrum  Incident point move along Y axis

CC  Film structure of two-chamber filter 5. Two-chamber integrated multichannel narrowband filter The original structure of the filter designed to be (HL) 4 H 4.64 LH(LH) 4 L(HL) 4 H 4.64 LH(LH) 4 with design wavelength =777.4nm

 Flow sheet of the preparation of two-chamber integrated narrowband filter 5. Two-chamber integrated multichannel narrowband filter (a) Depositing the first resonant cavity, (b) etching the first resonant cavity, (c) second depositing, (d) depositing the second resonant cavity, (e) etching the second resonant cavity, (f) deposition the residual film.

(HL) 4 H 4.64 LH(LH) 4 L(HL) 4 H 4.64 LH(LH) 4 5. Two-chamber integrated multichannel narrowband filter  Calculated spectrum of two-chamber integrated narrowband filter

 Experiment spectrum of two-chamber integrated narrowband filter 5. Two-chamber integrated multichannel narrowband filter (HL) 4 H 4.64 LH(LH) 4 L(HL) 4 H 4.64 LH(LH) 4

 Instrument and experiment condition 5. Two-chamber integrated multichannel narrowband filter Thickness of two spacer layer of which equivalently decreases by the optical thickness of 0.02L through the etching technique.

Coating machine: ZZSX-800 (Beijing Beiyi Innovation Vacuum Technology Co., Ltd, Beijing, China) optical multilayer coating machine, which uses the electron-beam vapor-deposition method assisted by ionic bombardment to fabricate the multilayer. Etching machine: the LKJ-1C (Beijing Institute of Radio Measurement, Beijing, China) ion-beam etching machine, which uses the dry etching method. The entrance angle of the ion beam is normal. The depth of the 32 parallel etched notches is gradually increased, and their width and length are and 12 mm, respectively. Material: TiO 2 and SiO Two-chamber integrated multichannel narrowband filter  Instrument and experiment condition