Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems Slide 1 SCC20 Liaison Report Dr. John W. Sheppard CS SAB Meeting November 3, 2005

Standards Coordinating Committee 20 Slide 2 Scope “Provides for the management, development, and maintenance of language and interface standards supporting system-level (onboard and offboard) automatic test and diagnosis. These standards include (but are not limited to) test requirements, test programs, test procedures, diagnostic knowledge, maintenance information, and major hardware subsystem interfaces between and within Automatic Test Systems.”

Standards Coordinating Committee 20 Slide 3 Sponsors/Liaisons IEEE Sponsors and Liaisons: –Aerospace Electronic Systems Society (Joseph Stanco) –Computer Society (John Sheppard) –Instrumentation and Measurement Society (Mark Kaufman) Official Industry Liaisons: –US Department of Defense (William Ross) –UK Ministry of Defense (Malcom Brown) –National Defense Industrial Association (Les Orlidge) Systems Engineering Committee Automatic Test Committee –IEC/TC93—Design Automatic (Narayanan Ramachandran)

Standards Coordinating Committee 20 Slide 4 Organization Administration –Chair: Les Orlidge (AAI), Vice Chair: John Sheppard (ARINC/JHU) –Steering Committee (general oversight and approval) –Administrative Subcommittee (quality control and procedures review) Working Groups –Diagnostic and Maintenance Control –Hardware Interfaces –Test and ATS Description –Test Information Infrastructure Membership –2005 Annual Report to SA 80 members 43 interested parties –Issued “call for membership” for Current respondents = 73.

Standards Coordinating Committee 20 Slide 5 Status Standards –IEEE Std : ATLAS, reaffirmed 2000, Starting reaffirmation ballot. –IEEE Std : Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE), dual logo’ed as IEC Ed 1.0. –IEEE Std : Digital Test Interchange Format (DTIF), reaffirmed –IEEE Std : Testability and Diagnosability Characteristics and Metrics. (Trial Use) –IEEE Std : DTIF Users Guide, Starting reaffirmation ballot. –IEEE Std : Signal and Test Definition, under consideration for IEC dual logo.

Standards Coordinating Committee 20 Slide 6 Status Projects Underway –P1232a: Amendment to AI-ESTATE, to be withdrawn. –P1232: Revision to AI-ESTATE, new PAR submitted. –P1505: Receiver Fixture Interface (co-sponsored by I&M), just passed initial ballot. –P1505.1: Common Test Interface Pin Map, new project. –P1552: Structured Architecture for Test Systems, PAR extended through 12/07. –P1636: Software Interface for Maintenance Information, Collection, and Analysis (SIMICA), work proceeding. –P1636.1: SIMICA Test Results and System Information, PAR revision requested to change name. To ballot in early –P1641a: Amendment to STD, new PAR submitted. –P1641.1: STD Users Guide, in ballot. –P1671: Automatic Test Markup Language, new project. –P1671.1: ATML Test Description, new project. –P1671.2: ATML Instrument Description, new project. –P1671.3: ATML UUT Description, new PAR submitted

Standards Coordinating Committee 20 Slide 7 Recent and Current Issues XML Schemata: Committee has serious concerns over copyright/licensing issues with respect to XML schemata in the standards. Closely monitoring CS SAB work with Creative Common. Patent Issue on ATML family of standards: National Instruments claims several “essential patents” may impact these standards. We have solicited a “letter of assurance” from them and are awaiting response. Co-Sponsorship: Recent issue over P PAR led to revision of P&P to define conditions under which co-sponsorship will be considered. Essentially requires lead role in any co-sponsored project. Membership: Recent growth in committee size led to revision of P&P to better define “membership.” Requires annual registration and attendance to at least one meeting. International Standards: Continue to pursue “dual-logo” standards. Also have strong representation in IEC TC93 (Design Automation) –Narayanan Ramachandran, WG7 Chair and US Delegate –Chris Gorringe, UK Delegate Next SCC20 Meeting: April-May timeframe at Indra in Madrid, Spain.