Qualification Test of UFE Board  Schematic diagram of UFE  Board types and current status  Qualification test procedures  VA & UFE test setup 

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Presentation transcript:

Qualification Test of UFE Board  Schematic diagram of UFE  Board types and current status  Qualification test procedures  VA & UFE test setup  Test results  Conclusion C. H. Chung AMS TRD eeting, July 16 ~17.

Schematic Diagram of UFE VA32 HDR12 Preamp. Shaping Multiplexing Peak. T = 2.4  s Power:55mW Applied Power HCC Chip 12 bit ADC AD7476

UFE Board Types UFE45M21UFE45S17 UFE90S96 UFE90M18 UFE development made up to the present ADC Op. Amp VA

Test Procedures Measurements : Gain, Pedestals, Noise, Linearity, Connectivity VA Hybrid UFE w.o VA  Peaking Time = 2.4  s  Gain = 2.0 [ADC counts / fC]  Pedestals and Noise  All channels within  1% of the mean gain  All channels within 3% non-linearity  Connection test with external CAL Production More Qualification Tests  Mechanical Vibration  Thermo Vacuum  EMI

VA Hybrid Test Setup VA-DAQ setup * IDE Co. * Type of VA-chip: VA32HDR12 * Number of channels/chip: 32 * Number of chips/board: 1 * Value (pF) of calibration capacitor:10.00E+0 Labview w. ROOT VA DAQ PCB and Adapter board

VA Test Results(1) Peaking time & Linearity / channel Signal waveform of channel Oscilloscope Gain fitting vs. input charge

VA Test Results (2)

VA Test Results (3) Click to add text Typically all channels within 1% of the mean gain Mean = [mV/fC], Sigma =

UFE Board Test Setup Board Box Block diagram of DAQ system Control signal WIN NT CVI, ROOT Real mode : Pedestal and Noise CAL mode : Gain and Nonlinearity 4m

UFE Test Results (1) One Channel Pedestals and Gain linearity Noise = ADC counts Gain = 2.01 [ADC counts/fC] MIP signal in TRD = 55 Xe + 20%CO 2, gain = 3000(3.5  10 5 e-) S/N = 55/0.86 = 64

UFE Test Results (2) Pedestals and Noise

UFE Test Results (3) Non-Linearity = [Fit-Measured]/Fit upto 1.5[pC] Linear range : 0~1.5pC within 2% nonlinearity

UFE Test Results (4) External Connection Test

Conclusion Qualification test setup for VA and UFE board is ready and working successfully. 40 VA Hybrid were tested and two chips were malfunctioning. 12 UFE boards were produced and tested. Pedestal, Noise, Gain, Linearity, Nonlinearity, Peaking Time, Connectivity /Channel/ VA chip/ UFE-Board Some problems are under investigation. Defect on VAs after soldering with UFE, connectivity improvement. Calibration const. DB : data sheet in ASCII format on the WWW.

WWW