TI Information – Selective Disclosure © Robert Baumann 9/18/2013 TI Information – Selective Disclosure © Robert Baumann 4/22/2014 Slide 1/42 TI Information – Selective Disclosure © Robert Baumann 6/10/2014 Slide 1/24 TI Information – Selective Disclosure © Robert Baumann 6/10/2014 Slide 1/24 Industrial challenges and trends in terrestrial single- event effects (SEE) Dr. Robert Baumann TI/IEEE Fellow, Technology Office Aerospace & Defense (MHRS Group) High Performance Analog Products Texas Instruments, Dallas, Texas, USA

TI Information – Selective Disclosure © Robert Baumann 9/18/2013 TI Information – Selective Disclosure © Robert Baumann 4/22/2014 Slide 2/42 TI Information – Selective Disclosure © Robert Baumann 6/10/2014 Slide 2/24 TI Information – Selective Disclosure © Robert Baumann 6/10/2014 Slide 2/24 Natural Terrestrial Background (neutrons and  particles) Avionics (neutrons) Space (protons, heavy ions, electrons) Man-made Accelerators/Nuclear reactors (x-ray, gamma, proton, neutron, etc.) Weapons (x-ray, gamma, neutrons) Industrial/Security (x-ray, gamma, e-beam) Medical (x-ray, gamma, protons, neutrons, e-beam) Radiation Environments

TI Information – Selective Disclosure © Robert Baumann 9/18/2013 TI Information – Selective Disclosure © Robert Baumann 4/22/2014 Slide 3/42 TI Information – Selective Disclosure © Robert Baumann 6/10/2014 Slide 3/24 Flux, Total Ionizing Dose, and Neutron/Proton Dose Comparison Adapted from M. Brugger (CERN)

TI Information – Selective Disclosure © Robert Baumann 9/18/2013 TI Information – Selective Disclosure © Robert Baumann 4/22/2014 Slide 4/42 TI Information – Selective Disclosure © Robert Baumann 6/10/2014 Slide 4/24 Energetic Ions in Matter Generated with SRIM MeV He in Silicon Generated with SRIM um Silicon surface

TI Information – Selective Disclosure © Robert Baumann 9/18/2013 TI Information – Selective Disclosure © Robert Baumann 4/22/2014 Slide 5/42 TI Information – Selective Disclosure © Robert Baumann 6/10/2014 Slide 5/24 Physical Manifestations of Radiation Transient Charge Generation Charge Trapping/Interface Damage Nuclear Reactions Structural (Lattice) Damage DoseEffects Single Event Effects Dose Rate Effects stochastic chronic

TI Information – Selective Disclosure © Robert Baumann 9/18/2013 TI Information – Selective Disclosure © Robert Baumann 4/22/2014 Slide 6/42 TI Information – Selective Disclosure © Robert Baumann 6/10/2014 Slide 6/24 Basic Reliability Definitions Soft Failure (glitch, noise, SEE) An event corrupting only the DATA stored in a device. The device itself is not damaged and functionality is restored when new data is written. Hard Failure (GOI, EM, NBTI, ESD,…TID, ND, SEE) An error induced by faulty device operation. DATA is lost AND function is lost and can no longer operate at that location. 1 FIT is 1 failure in 114,155 years! or 1,000,000 FIT is ~ 1 failure/month

TI Information – Selective Disclosure © Robert Baumann 9/18/2013 TI Information – Selective Disclosure © Robert Baumann 4/22/2014 Slide 7/42 TI Information – Selective Disclosure © Robert Baumann 6/10/2014 Slide 7/24 Who cares about SEE (SEU, SEL)? Don’t Care Really Care Catalog DSP, MSP, MCUs etc. Catalog DSP, MSP, MCUs etc. 1 MFIT/chip ok (~1 fail/month) < 1 kFIT/Chip (~ 1 fail/114 yrs) < 1 kFIT/Chip (~ 1 fail/114 yrs) High Reliability Multi-chip systems Life support Safety systems Medical electronics Automotive, Avionics High Reliability Multi-chip systems Life support Safety systems Medical electronics Automotive, Avionics Consumer Goods Single-chip Non-critical Cell phones MP3 Players Consumer Goods Single-chip Non-critical Cell phones MP3 Players

TI Information – Selective Disclosure © Robert Baumann 9/18/2013 TI Information – Selective Disclosure © Robert Baumann 4/22/2014 Slide 8/42 TI Information – Selective Disclosure © Robert Baumann 6/10/2014 Slide 8/24 BIG Business Impact Loss of revenue Loss of customer confidence = Sun Screen Daniel Lyons, Forbes Global, mysterious glitch has been popping up since late last year… for America Online, Ebay and dozens of other major corporate accounts…The SUN (server) has caused crashes at dozens of customer sites. An odd problem involving stray cosmic rays and memory chips in the flagship Enterprise server line… A dotcom company bought a Sun 6500 server to run…the core of its business. The server crashed and rebooted four times over a few months. "It's ridiculous. I've got a $300,000 server that doesn't work. The thing should be bulletproof," says the company's president.

TI Information – Selective Disclosure © Robert Baumann 9/18/2013 TI Information – Selective Disclosure © Robert Baumann 4/22/2014 Slide 9/42 TI Information – Selective Disclosure © Robert Baumann 6/10/2014 Slide 9/24 Safety Impact: QANTAS Flight 72 Single subatomic event has human-scale impact! “In-flight upset, 154 km west of Learmonth, WA, 7 Oct. 2008, VH- QPA Airbus A ,” ATSB Transp. Safety Report - Aviation Occurrence Invest., AO , pp. 1 – 313, Dec

TI Information – Selective Disclosure © Robert Baumann 9/18/2013 TI Information – Selective Disclosure © Robert Baumann 4/22/2014 Slide 10/42 TI Information – Selective Disclosure © Robert Baumann 6/10/2014 Slide 10/24 TI Information – Selective Disclosure © Robert Baumann 6/10/2014 Slide 10/24 Terrestrial + Avionics Environments Alpha particles and neutrons

TI Information – Selective Disclosure © Robert Baumann 9/18/2013 TI Information – Selective Disclosure © Robert Baumann 4/22/2014 Slide 11/42 TI Information – Selective Disclosure © Robert Baumann 6/10/2014 Slide 11/ Th Actual & Simulated alpha spectra Package- simulation U:Th (50:50) Measured Thick 232 Th 238 U

TI Information – Selective Disclosure © Robert Baumann 9/18/2013 TI Information – Selective Disclosure © Robert Baumann 4/22/2014 Slide 12/42 TI Information – Selective Disclosure © Robert Baumann 6/10/2014 Slide 12/24 Alpha Particles from Materials Distributed throughout materials Flux depends on types of materials & purity Most of the alphas are from packaging Ultra low alpha materials <  /cm 2 -hr

TI Information – Selective Disclosure © Robert Baumann 9/18/2013 TI Information – Selective Disclosure © Robert Baumann 4/22/2014 Slide 13/42 TI Information – Selective Disclosure © Robert Baumann 6/10/2014 Slide 13/24 Cosmic Cascade Single Incoming Cosmic Particle   ±± ±± e-e-      e-e- e+e+ e±e±   P N    J. F. Ziegler, “Terrestrial Cosmic Ray Intensities,” IBM J. Res. Develop., Vol. 42(1), p. 125, Jan

TI Information – Selective Disclosure © Robert Baumann 9/18/2013 TI Information – Selective Disclosure © Robert Baumann 4/22/2014 Slide 14/42 TI Information – Selective Disclosure © Robert Baumann 6/10/2014 Slide 14/24 Relative Neutron Flux (sea-level=1) Altitude (km). Flight Altitudes Terrestrial Altitudes Effect of Altitude/Latitude at 3,000 meters relative neutron flux ~ 11x higher than sea-level Adapted from Eugene Normand, “Single Event Effects in Avionics”, IEEE Trans. Nucl. Sci., 43(2), April 1996, pp equatorialpolar Latitude (degrees) Relative Neutron Flux Sea-level Flight altitudes North South 25 G.A. Glatzmaier and P.H. Roberts, "Rotation and magnetism of Earth's inner core," Science, 274, (1996).

TI Information – Selective Disclosure © Robert Baumann 9/18/2013 TI Information – Selective Disclosure © Robert Baumann 4/22/2014 Slide 15/42 TI Information – Selective Disclosure © Robert Baumann 6/10/2014 Slide 15/24 10 B and Thermal Neutrons 10 B Thermal neutron 4 He 7 Li Oxygen  nth (barns) Tungsten Titanium Arsenic Copper Nitrogen Aluminum Boron-11 Phosphorus Silicon BORON MeV 0.84 MeV R. Baumann, T. Hossain, E. Smith, S. Murata, H. Kitagawa, “Boron as a primary source of radiation in high density DRAMs”, IEEE Symp. VLSI Tech., June 1995, pp Generated with SRIM

TI Information – Selective Disclosure © Robert Baumann 9/18/2013 TI Information – Selective Disclosure © Robert Baumann 4/22/2014 Slide 16/42 TI Information – Selective Disclosure © Robert Baumann 6/10/2014 Slide 16/24 TI Information – Selective Disclosure © Robert Baumann 6/10/2014 Slide 16/24 Single Event Effects (SEEs) A single event (nuclear reaction or energetic ion) creates transient charge that induces a disruption in circuit operation or data state. Typically SEE are very rare events (1 per month, etc.) Of all possible nuclear events only a fraction can cause a SEE Of all possible SEE only a few will cause machine state failures (derating effects)

TI Information – Selective Disclosure © Robert Baumann 9/18/2013 TI Information – Selective Disclosure © Robert Baumann 4/22/2014 Slide 17/42 TI Information – Selective Disclosure © Robert Baumann 6/10/2014 Slide 17/24 SEU and SEL – Most Common SEE Ion Track +V n+ diffusion p- epi Recombination Diffusion Collection Potential Contour Deformation Electron-Hole Pairs Electron collection Drift Collection Reverse-biased N+/P junction V Ion Track Parasitic bipolar action Single Event UpsetSingle Event Latch Up

TI Information – Selective Disclosure © Robert Baumann 9/18/2013 TI Information – Selective Disclosure © Robert Baumann 4/22/2014 Slide 18/42 TI Information – Selective Disclosure © Robert Baumann 6/10/2014 Slide 18/24 FINFET Planar Magnitudes from two different curves cannot be compared as these curves were individually normalized! SRAM/DRAM Bit SEU Scaling Trend R. H. Edwards, C. S. Dyer, E. Normand, “Technical standard for atmospheric radiation single event effects, (SEE) on avionics electronics”, IEEE Rad. Effects Data Workshop, 2004, pp DRAM sensitivity has been decreasing with scaling SRAM sensitivity has been decreasing with scaling (since the 130nm node)

TI Information – Selective Disclosure © Robert Baumann 9/18/2013 TI Information – Selective Disclosure © Robert Baumann 4/22/2014 Slide 19/42 TI Information – Selective Disclosure © Robert Baumann 6/10/2014 Slide 19/24 Future Terrestrial Mechanisms? n +  SER When Q crit reaches 0.2 fC SER will double from muons alone and at 0.1 fC SER will be 5-10x higher. Note: Q crit for 40nm is ~ 0.5 fC Adapted from B. Sierawski et al., “Effects of Scaling on Muon-Induced Soft Errors”, 2011 IEEE IRPS, pp. 3C C.3.6. (with TI) Muon SEU From B. Sierawski et al., “Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions”, IEEE Trans. NS, 56 (6), Part 1, Dec. 2009, pp (with TI) Terrestrial Protons may also dominate as Q crit is reduced due to the much higher cross-section for direct ionization. Proton SEU  for direct ionization  for prior technologies

TI Information – Selective Disclosure © Robert Baumann 9/18/2013 TI Information – Selective Disclosure © Robert Baumann 4/22/2014 Slide 20/42 TI Information – Selective Disclosure © Robert Baumann 6/10/2014 Slide 20/24 TI Information – Selective Disclosure © Robert Baumann 6/10/2014 Slide 20/24 Accelerated Testing & Facilities

TI Information – Selective Disclosure © Robert Baumann 9/18/2013 TI Information – Selective Disclosure © Robert Baumann 4/22/2014 Slide 21/42 TI Information – Selective Disclosure © Robert Baumann 6/10/2014 Slide 21/24 Extrapolating Neutron Results Actual neutron particle flux (≥ 10MeV n/hr/cm 2 ) reaching the Si as defined by JEDEC JESD89A nASER Test Neutron Sensitivity (errors/neutron/cm 2 ) Failure rate due to neutrons (errors/hr) always induce > 100 upsets per test so that  ≤ 10%) Neutron beam Conversion of TTL ULC from U 238 foil to actual n/hr- cm 2 ( ≥ 10MeV) NYC Sea-level = 13 n/hr/cm 2 sources are inexpensive and in-house BUT extrapolating the alpha-particle SEE is much more difficult and requires simulation

TI Information – Selective Disclosure © Robert Baumann 9/18/2013 TI Information – Selective Disclosure © Robert Baumann 4/22/2014 Slide 22/42 TI Information – Selective Disclosure © Robert Baumann 6/10/2014 Slide 22/24 shutter DUT Tungsten spallation target master shutter 30ºR15ºR0º15ºL 30ºL Neutron beams Fission Foil Proton beam Accelerated Neutron Testing neutron test procedure in JESD89 and JESD89A Close match between terrestrial background spectrum and Los Alamos means extrapolation is based on a simple multiplication

TI Information – Selective Disclosure © Robert Baumann 9/18/2013 TI Information – Selective Disclosure © Robert Baumann 4/22/2014 Slide 23/42 TI Information – Selective Disclosure © Robert Baumann 6/10/2014 Slide 23/24  Svedberg Laboratory, Uppsala University, Sweden (TSL, ANITA)  Los Alamos Neutron Science Center - Ice House (LANSCE), New Mexico, USA xTri-University Meson Facility - Univ. of British Columbia (TRIUMF) +Research Center for Nuclear Physics - Osaka University (RCNP)  Vesuvio Beamline - Rutherford Appleton Lab, Oxfordshire, UK (ISIS) JEDEC JESD89A “standard” flux x (3x10 8 ) From Charlie Slayman, “Theoretical Correlation of Broad Spectrum Neutron Sources for Accelerated Soft Error Testing”, IEEE Nuclear and Space Radiation Effects Conference (NSREC), Denver, July 22, 2010 (to be published Trans. on Nuc. Sci. December 2010) “Atmospheric” Neutron Test Facilities Extend E n > 800MeV Need for muon testing will grow

TI Information – Selective Disclosure © Robert Baumann 9/18/2013 TI Information – Selective Disclosure © Robert Baumann 4/22/2014 Slide 24/42 TI Information – Selective Disclosure © Robert Baumann 6/10/2014 Slide 24/24 TI Information – Selective Disclosure © Robert Baumann 6/10/2014 Slide 24/24 Summary SEE sensitivity is decreasing with new generations due to V dd saturation, HOWEVER increased bit density leads to similar or increasing system SER. Nano-devices may offer improved resilience against SEE (bulk/SOI FinFETs, etc.) but will NOT eliminate them. Protons and muons are a growing concern and 10 B reactions with thermal neutrons can still be a risk. SER is application-specific so one failure rate specification for all products is NOT viable (e.g. for catalog products). Extensive support for radiation effects engineers needed to extrapolate reliability in a wide variety of environments. Vendors that ignore the soft error problem will end up paying for it in loss of customer confidence – leading to significant revenue and market share loss. Control and detection electronics in accelerator facilities share many of the problems induced by terrestrial and avionics radiation environments (typically at much higher equivalent fluxes). Use of space-grade or enhanced COTS may be required for many accelerator applications and/or fault-tolerant system design.