Heat Transfer in Nanoelectronics by Quantum Mechanics Thomas Prevenslik QED Radiations Discovery Bay, Hong Kong InterPACK 2013 Inter. Conf. on Packaging.

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Presentation transcript:

Heat Transfer in Nanoelectronics by Quantum Mechanics Thomas Prevenslik QED Radiations Discovery Bay, Hong Kong InterPACK 2013 Inter. Conf. on Packaging of Electronics July 16-18, Burlingame, CA, USA 1

Today, Fourier’s equation based on classical physics is routinely applied to heat transfer in nanoelectronics - resistors, capacitors, and inductors - having submicron dimensions. However, unphysical results are found. Memristors require oxygen vacancies ( Behaviour observed w/o vacancies ) Resistance change in PCRAM devices caused by melting ( Melting can not create discrete charge ) Hooge relation gives 1/f noise by electron collisions w lattice ( Frequencies << lattice frequencies ) [1] L. O. Chua, “Memristor - the missing circuit element,” IEEE Trans. Circuit Theory, vol. 18, pp. 507–519, Introduction 2 InterPACK 2013 Inter. Conf. on Packaging of Electronics July 16-18, Burlingame, CA, USA

Proposal Heat transfer in nanoelectronics is a QM effect that conserves Joule heat by producing QED radiation instead of the usual increase in temperature. QM = Quantum Mechanics QED = Quantum electrodynamics QED radiation creates excitons (hole and electron pairs), the holes separating from electrons In the electric field across the circuit element, Holes lower resistance of circuit element or upon recombination with electrons emit EM radiation. EM = Electromagnetic InterPACK 2013 Inter. Conf. on Packaging of Electronics July 16-18, Burlingame, CA, USA 3

Theory Heat Capacity of the Atom Conservation of Energy TIR Confinement QED Induced Heat Transfer 4

Heat Capacity of the Atom 5 NEMS kT eV Classical Physics (kT > 0) QM (kT = 0) InterPACK 2013 Inter. Conf. on Packaging of Electronics July 16-18, Burlingame, CA, USA In MEMS, atoms have heat capacity, but not in NEMS MEMS

InterPACK 2013 Inter. Conf. on Packaging of Electronics July 16-18, Burlingame, CA, USA Conservation of Energy Lack of heat capacity by QM precludes Joule heat conservation in NEMS by an increase in temperature, but how does conservation proceed? Proposal Absorbed EM energy is conserved by creating QED radiation and excitons inside the circuit element - by frequency up - conversion to the TIR resonance of the circuit element. TIR = Total Internal Reflection 6

Since the refractive index of nanoelectroncs is > surroundings, the QED radiation is confined by TIR Circuit elements ( films, wires, etc) have high surface to volume ratio, but why important? Magic of NPs. By QED, EM energy absorbed in the surface of circuit elements creates EM radiation in the TIR mode of the surface. Magic of NPs is the chemical reactions induced from the conversion of absorbed EM energy to QED radiation f = (c/n) / and E = hf TIR Confinement 7 InterPACK 2013 Inter. Conf. on Packaging of Electronics July 16-18, Burlingame, CA, USA For thin film circuit elements having thickness d, = 2d

QED Heat Transfer 8 QED Radiation InterPACK 2013 Inter. Conf. on Packaging of Electronics July 16-18, Burlingame, CA, USA Phonons Q cond Charge EM Radiation Excitons Substrate NEMS Circuit Element

InterPACK 2013 Inter. Conf. on Packaging of Electronics July 16-18, Burlingame, CA, USA Response Exciton Source and Loss Exciton Dynamics Resistance and Current 9

Excitons Source and Loss InterPACK 2013 Inter. Conf. on Packaging of Electronics July 16-18, Burlingame, CA, USA Exciton Source P = Joule heat E = QED Photon energy  = Fraction of P absorbed in Element (1-  ) = Fraction of P loss to Surroundings 10 Exciton Loss to Electrodes Q = Number of Excitons  = Mobility V = Voltage d = thickness

Exciton Dynamics InterPACK 2013 Inter. Conf. on Packaging of Electronics July 16-18, Burlingame, CA, USA Where, Q E and Q H are number electrons and holes, V is the voltage  E and  H are electron and hole mobility, and d thickness Electrons Holes 11 For Ovshinsky effect and 1/f Noise, V = V o, For memristors, V = V o sin  t.

Resistance and Current InterPACK 2013 Inter. Conf. on Packaging of Electronics July 16-18, Burlingame, CA, USA 12  = Conductivity  = Resistivity

Applications InterPACK 2013 Inter. Conf. on Packaging of Electronics July 16-18, Burlingame, CA, USA Memristors Ovshinsky effect 1/f Noise Optimum Circuit Design 13

Memristors InterPACK 2013 Inter. Conf. on Packaging of Electronics July 16-18, Burlingame, CA, USA d = 50 nm, GST mobility  H = 2x10 -6 cm 2 /V-s 14 QED creates charge to lower Memristor resistance ( Oxygen vacancies not required)

Ovshinsky Effect InterPACK 2013 Inter. Conf. on Packaging of Electronics July 16-18, Burlingame, CA, USA Alq3 Mobility  = 2x10 -5 cm 2 /V-s, Vo = 1 V, Ro = 1 M  15 QED charge lowers PCRAM resistance ( Melting is inconsequential)

1/f Noise in Nanowires InterPACK 2013 Inter. Conf. on Packaging of Electronics July 16-18, Burlingame, CA, USA 16 SnO 2 NWs d = 50 nm  H = 172 cm 2 /V-s

1/f Noise in Nanowires InterPACK 2013 Inter. Conf. on Packaging of Electronics July 16-18, Burlingame, CA, USA Step in QED Induced Charge  Step in Current  Step in Power Fourier Transform of Step in Power P(t) gives 1/f Noise 17 Step change in time domain  1/f noise in frequency domain Music and Stock Market prices recordings? 0 P(t) t 

Optimum MEMS/NEMS Design InterPACK 2013 Inter. Conf. on Packaging of Electronics July 16-18, Burlingame, CA, USA Optimum Design 0.05 < d < 20 microns Fourier equation and BTE invalid  Use QED heat transfer 18

By QM, NEMS circuit elements do not increase in temperature because Joule heat is conserved by the creation of charge. QED induced charge supersedes:  Oxygen vacancies in memristors  Melting in PCRAM  The Hooge relation in 1/f noise Optimum NEMS/MEMS circuit design 0.05 < d < 20 microns avoids both hot spots and 1/f noise Conclusions 19 InterPACK 2013 Inter. Conf. on Packaging of Electronics July 16-18, Burlingame, CA, USA

Questions & Papers InterPACK 2013 Inter. Conf. on Packaging of Electronics July 16-18, Burlingame, CA, USA