Parameter studies of the e - cloud build up (update) C.Octavio Domínguez, Frank Zimmermann 28 th April 2011 - e - cloud meeting.

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Presentation transcript:

Parameter studies of the e - cloud build up (update) C.Octavio Domínguez, Frank Zimmermann 28 th April e - cloud meeting

Outline 1)New fittings 2)Other locations 3)Scrubbing run – 6/04/ th April e - cloud meeting

Outline 1)New fittings 2)Other locations 3)Scrubbing run – 6/04/ th April e - cloud meeting

As you may remember… w/o fitting

28 th April e - cloud meeting Approximately same SEY but much lower R 3 rd order fit

28 th April e - cloud meeting Taking an arbitrary 10% error in the pressure 3 rd order fit

28 th April e - cloud meeting 1.35, 1.85, 8.85,  s Taking an arbitrary 10% error in the pressure Should the solution be here? 3 rd order fit

28 th April e - cloud meeting 5 th order fit Almost same R as with 3 rd order fit, but lower SEY Another solution with higher SEY?

28 th April e - cloud meeting Thresholds comparison 0.6x10 11 p/bunch 0.8x10 11 p/bunch 1.1x10 11 p/bunch Courtesy G.Arduini

28 th April e - cloud meeting Thresholds comparison 0.6 ∙10 11 ppb 0.8 ∙10 11 ppb 1.1 ∙10 11 ppbP 1.1 /P 0.8 =1.6∙ | 0.05   1.1 /  0.8 =1.4∙ | 0.08   1.1 /  0.8 =8.8∙ | 0.25   1.1 /  0.8 =8.2∙ | 0.05   1.1 /  0.8 =8.0∙10 -4 More than one order of magnitude

28 th April e - cloud meeting Fitting - conclusions Fits with 3 rd and 5 th order polynoms have been applied to the logarithms of the raw data for each batch spacing The ratio of the different polynomial functions has been taken 3 rd order polynoms are normally better (or more secure), but 5 th order give a lower value of  2 None of the different possible solutions found with the SEY/R scan match well with the intensity threshold simulations Are the pressure values accurate enough for our purposes? How could we fit better our data? Are the results obtained with the fits more reliable?

Outline 1)New fittings 2)Other locations 3)Scrubbing run – 6/04/ th April e - cloud meeting

New location 28 th April e - cloud meeting Very similar SEY and R as with the other gauge

New location - fits 28 th April e - cloud meeting 3 rd order fit

New location - fits 28 th April e - cloud meeting 5 rd order fit

New location - fits 28 th April e - cloud meeting 5 rd order fit Within 10%

New location - fits 28 th April e - cloud meeting A new location (VGI.319.5L3.B.PR) have been tested for 2010 measurements The results agree quite well with the other location explored (VGI.141.6L4.B.PR) 3 rd and 5 th order fits have been done 5 th order fits continue giving a lower value of  2 A certain agreement has been found considering a 10% error in the pressure First conclusion: For this kind of gauges SEY ~1.85 and R~0.2 This results has to be taken just as tentative values Intensity thresholds for this location has to be investigated

Outline 1)New fittings 2)Other locations 3)Scrubbing run – 6/04/ th April e - cloud meeting

P vs. batch spacing experiment 6s6s 4s4s 2s2s 1s1s Injection interlock due to BIC sanity checks not performed in the last 25 hours Pressure close to the thresholds We wanted: 28 th April e - cloud meeting

P vs. batch spacing experiment 6s6s 4s4s 2s2s 2s2s P1P1 P2P2  P 1 >  P 2 28 th April e - cloud meeting

P vs. batch spacing experiment 28 th April e - cloud meeting ???

P vs. batch spacing experiment 28 th April e - cloud meeting 3 rd order fit

P vs. batch spacing experiment 28 th April e - cloud meeting 5 th order fit

P vs. batch spacing experiment 28 th April e - cloud meeting The experiment could not be carried out as planned due to several reasons Only three points (2 relative measurements) could be done for beam 1 Pressure does not stabilize in the time used for the first batch spacings Simulations don’t give a clear agreement (a 3 rd point would be needed for benchmarking) Nevertheless there is a possible solution in the same region as in the 2010 experiment 3 rd and 5 th order fits have been done, but no valid conclusions can be extracted 5 th order fits continue giving a lower value of  2