2016/6/4 Taka Kondo (KEK) 1 Issues of the SCT Digitization model 2 nd meeting of SCT Digitization TF 2010.5.25 Taka Kondo (KEK) 1.Current SCT digitization.

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2016/6/4 Taka Kondo (KEK) 1 Issues of the SCT Digitization model 2 nd meeting of SCT Digitization TF Taka Kondo (KEK) 1.Current SCT digitization scheme (updated) 2.Effects to be studied 3.Models of the bulk electric field 4.Timing of pulses 5.Quick summary

2016/6/4 2 SCT Digitization model G4 hit begin G4 hit end 1. Move each step center by  y =  z  tan  L (green) 2. Calculate drift time t drift (using flat diode model) 3. Add diffusion in x/y : Gauss(sqrt(2Dt drift )) (red) 4. Find the strip # : N strip 5. Calculate # of eh pairs : n pair = dE/dX/n step /3.62eV 6. Calculate total time : t total = t drift + t TOF + t surf 30 ns N strip N strip +1 t total 1.Calculate height at t thres =30 ns 2. Sum up all hole contributions 3. Hit = 1 if summed height >1fC Divide into n step short steps of ~5  m long. Distribute dE/dX equally to the center of each step. q strip = e  n pair  0.93  0.9 q crosstalk = e  n pair  0.93  0.05 yy 1.Select strips randomly from non-hit strips to accomplish the given NO. 2.Give 2 fC (fixed) to selected strips. Taka Kondo (KEK) HV plane

parametersValuesVariable names and their originscalculation depletionDepth d depletion SiLorentzAngleSvc.cxx #L457Eq-1 meanElectricField E mean SiLorentzAngleSvc.cxx #L461Eq-2 drift mobility  d [cm 2 /V/s]SiliconProperties::calcHoleDriftMobility(T,E)Eq-3  LA o SiLorentzAngleSvc.cxx#L482Eq-4 diffusion constant D11.14 [cm 2 /s]SiliconProperties::calcDiffusionConstantEq-5 Drift time t drift SCT_SurfaceChargesGenerator::DriftTime(zhit)Eq-6 Surface drift time t surf SCT_SurfaceChargesGenerator::SurfaceDriftTime(ysurf)Eq-7 Diffusion  SCT_SurfaceChargesGenerator::DiffusionSigma(zhit)Eq-8 Amplifier response a(t) SCT_Amp::response(q, t thres ) Eq-9 Crosstalk function b(t) SCT_Amp::crosstalk(q, t thres )Eq-10 Correction factor C 1 SCT_Amp.cxx#L052, m_NormConstCentralEq-11 Correction factor C 2 SCT_Amp.cxx#L053-54, m_NormConstNeighEq-12 dE/dX to eh pairs 3.62 eVSiliconProperties.cxx #L015 Threshold timing t thres 30 nsSCT_FrontEnd.cxx #L067 Crosstalk factor K neighbour 0.1 SCT_Amp.cxx#L21, m_CrossFactor2sides loss to backplane K back 0.07SCT_Amp.cxx#L22, m_CrossFactorBack Peaking time  21 nsSCT_Amp.cxx#L23, m_PeakTime 2016/6/4 3 Parameters user in SCT Digitization Taka Kondo (KEK)

2016/6/4 4 Equations used in SCT digitization Taka Kondo (KEK)

2016/6/ Effects to be studied Taka Kondo (KEK) Electric field: Current SCT digitization model assumes uniform Electric field in the bulk. Actual Electric field is non-uniform due to the presence of positive charges (doping concentration) in the depleted region. Also the discrete structure of strips creates distorted field shapes near the strips. Charges: Current SCT digitization model handles only hole charges arriving at the strip electrodes. Even before reaching the strips, charges are excited due to induction. Motion of electrons gives certain contribution in the induced charges. Timing of threshold: Current SCT model has a fixed time of threshold at 30 ns. This may have large effects in cluster size. There is no mechanism to give Tbin information. MC gives always 010.

2016/6/4 6 A strategy of study Taka Kondo (KEK) (1)Construct a program to simulate the electron/hole transportation in order to estimate quantitatively how close (or how far) the current SCT digitization model is. (2)In order to simulate as realistic as possible, the new program should include: (a) realistic electric field distribution, (b) effects of induced charge (instead of arriving hole charge). (3) Compare the results with real SCT data by optimizing contributing parameters. (4) Find ways to improve the SCT digitization model based on the studies. For example, develop an optimized installation of Tbin information..

3. Models of the bulk electric field Uniform field model FEM field model 2016/6/4 7 Neglect depleted charges Flat electrodes Flat diode model Depleted charges Flat electrodes Depleted charges Discrete strip electrodes E field by FEM solution strip planesrip plane strip HV plane Taka Kondo (KEK)

2016/6/4 8 Using 2-dimensional Finite Element Method (FEM) ( free soft) 20  m80  m HV plane (V B ) strips Potential at V B =150V Geometry and meshes Effective doping concentration N eff is adjusted to achieve the full depletion at V B =65V. Taka Kondo (KEK)

2016/6/4 9 E field and Lorentz Angle at B= 2 Tesla, T = 273 K Thus the “measured LA” is a mixture of various local LA values. In addition, it may be affected by e/h trajectory distortion in the bulk. Taka Kondo (KEK)

Transporting electrons and holes at B = 2 Tesla Uniform field model used in current SCT digitization FEM field model V B =150V V B =50V 2016/6/4 10 Taka Kondo (KEK)

4. Timing of pulses SCT digitization model 2016/6/4 11 Taka Kondo (KEK) t hole obtained by tracing holes in the FEM field model. Current SCT digitization model handles only holes arriving at the strips. The timing of arrival is calculated using certain formulae.

Time distribution of charges and amplifier outputs (1) 2016/6/4 12 Taka Kondo (KEK) 5 MIP (108 eh /  m) tracks penetrates with different incoming positions relative to the strip center. x in = -40, -20, 0, 20, 40  m strip= -1 strip= 0 x in = -40  m

Time distribution of charges and amplifier outputs (2) 2016/6/4 13 Taka Kondo (KEK) x in = 0  mx in = -20  m

Time distribution of charges and amplifier outputs (3) 2016/6/4 14 Taka Kondo (KEK) x in = +40  mx in = +20  m

5. Quick summary (1)The Current SCT digitization model was digested by going through the SCT digitization code, though not completed yet. (2)Realistic electric field is calculated using 2 dimensional FEM, showing the “measured LA” is a mixture of various local LAs. (3)An e/h transportation program is being developed including the induced charge effects. (4)An initial comparison with the current SCT digitization model shows some (but not large) differences in time dependence as well as pulse heights. 2016/6/4 15 Taka Kondo (KEK)