Effects of RF Pulses on Circuits and Systems – Pieces UMCUUI C 1 UIUCUH Longer-Term Coupling Analysis Pieces Develop Understanding of Complex Coupling.

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Presentation transcript:

Effects of RF Pulses on Circuits and Systems – Pieces UMCUUI C 1 UIUCUH Longer-Term Coupling Analysis Pieces Develop Understanding of Complex Coupling Incorporate into Topological Models Validate Simpler Topological Models (Twelve to Twenty-Four Months)

Effects of RF Pulses on Circuits and Systems – Pieces UMCUUI C 2 UIUCUH Long-Term Problems Nested Boxes with Slots and Wires Develop understanding of complex coupling Boxes with wires and slots Nested boxes with wires and slots Coupled boxes with wires and apertures Embed pieces in topological structures

Effects of RF Pulses on Circuits and Systems – Pieces UMCUUI C 3 UIUCUH Wire thru Hole in Box with Interior Feature

Effects of RF Pulses on Circuits and Systems – Pieces UMCUUI C 4 UIUCUH Nested Boxes with Wire thru Holes

Effects of RF Pulses on Circuits and Systems – Pieces UMCUUI C 5 UIUCUH Alternate Wire Route & Slotted Box

Effects of RF Pulses on Circuits and Systems – Pieces UMCUUI C 6 UIUCUH Multiple Boxes in Box with Wire

Effects of RF Pulses on Circuits and Systems – Pieces UMCUUI C 7 UIUCUH Multiple Boxes, Slotted Boxes, Wire through Walls

Effects of RF Pulses on Circuits and Systems – Pieces UMCUUI C 8 UIUCUH Rectangular Cavity Coupled to Coaxial Cavity via Wire in Hole

Effects of RF Pulses on Circuits and Systems – Pieces UMCUUI C 9 UIUCUH Coupled Cavities Rectangular-Coaxial-Rectangular

Effects of RF Pulses on Circuits and Systems – Pieces UMCUUI C 10 UIUCUH Long-Term Problems Covered (Shielded) Apertures Develop understanding of shielded apertures Slot in screen covered by “grounded” shield Slot in upper plate of parallel plate guide covered by covered by “grounded” shield Embed in topological structure

Effects of RF Pulses on Circuits and Systems – Pieces UMCUUI C 11 UIUCUH Shielded Slot in Screen

Effects of RF Pulses on Circuits and Systems – Pieces UMCUUI C 12 UIUCUH Shielded Slot in Plate of Guide

Effects of RF Pulses on Circuits and Systems – Pieces UMCUUI C 13 UIUCUH Long-Term Problems Fast Time-Domain Methods Development Fast time-domain integral equation methods for inhomogeneous material regions Accurate TDIE for weak penetration through apertures

Effects of RF Pulses on Circuits and Systems – Pieces UMCUUI C 14 UIUCUH Proposed Effort (Year 1): Algorithms and Implementations Develop “low frequency” stable PWTD / TDIE solver (12 mo) –Hybridize loop/star/tree and time Galerkin schemes (Industry strength implementation) Develop stable/accurate TDIE solvers for cavities with very small holes / seams / cracks (18 mo).

Effects of RF Pulses on Circuits and Systems – Pieces UMCUUI C 15 UIUCUH Proposed Effort (Year 1): Demonstration of Capabilities Analyze coupling into a nonlinear circuit (amplifier) in a realistic enclosure (12 mo) –Geometry: Slots, cavities, pins, nonlinear circuitry. –Demonstrates all capabilities of solver –Validation: through comparison to FDTD solution. slot circuitry cavity boards + pins

Effects of RF Pulses on Circuits and Systems – Pieces UMCUUI C 16 UIUCUH Long-Term Problems Fast Frequency-Domain Methods Development Fast frequency-domain integral equation methods for exterior-to-interior coupling problem Fast frequency-domain integral equation methods for very low frequencies (for FFT) Fast hybrid methods Accurate fast frequency-domain integral equation methods for weak penetration through apertures

Effects of RF Pulses on Circuits and Systems – Pieces UMCUUI C 17 UIUCUH EMI Threat to Aircraft Systems Airborne Transmitter Ground-based or ship-board Transmitter PEDS Lightening External Threat Coupling from other Aircraft Systems Natural Environmental Effects (Lightening, Static Electricity) Man Made Sources External to the aircraft (High Intensity Radiated Fields - HIRF) Internal Threat Portable Electronic Devices (PEDS) carried by passengers Picture from NASA-Langley

Effects of RF Pulses on Circuits and Systems – Pieces UMCUUI C 18 UIUCUH Penetration through Loaded Slots with Wire Bundles Adapt hybrid frequency domain methods for coupling characterization in presence of wire bundles through loaded geometries Develop an understanding of good shielding practices and relative levels of penetration among the various slots geometries Develop methods for equivalent circuit extraction

Effects of RF Pulses on Circuits and Systems – Pieces UMCUUI C 19 UIUCUH Coupling through Antennas Antennas are ‘doors’ to coupling from external excitations into structures For coupling studies, details such as wires, feed structures and loading are crucial Provide an understanding of coupling (in-band and out of band)

Effects of RF Pulses on Circuits and Systems – Pieces UMCUUI C 20 UIUCUH Coupling though Slots in Loaded Structure Develop general purpose frequency domain techniques for coupling into loaded geometries Develop hybrid methods appropriate to structure and material: finite element method, integral equations with multilayer Green’s functions, and fast multipole integral methods Validate and compare

Effects of RF Pulses on Circuits and Systems – Pieces UMCUUI C 21 UIUCUH Long-Term Problems Application of EIGER Analysis of complex coupling problems Use as a check on more problem-specific analyses Coupling to PC board traces, for example

Effects of RF Pulses on Circuits and Systems – Pieces UMCUUI C 22 UIUCUH Aperture Coupling to PCB Traces Analysis should include mutual coupling effects between traces. Requires efficient layered-media periodic Green’s function (Ewald acceleration, etc.). IC E inc

Effects of RF Pulses on Circuits and Systems – Pieces UMCUUI C 23 UIUCUH Cable Coupling to PCB Traces Analysis should account for cable propagation to traces. Analysis should also account for aperture/cable radiation effects. IC

Effects of RF Pulses on Circuits and Systems – Pieces UMCUUI C 24 UIUCUH Coupling to PCB Traces Thevenin equivalent circuits can be obtained to model both aperture and cable penetration. Thevenin equivalent circuits model all EM effects up to the IC pin. This allows for convenient de-coupling between EM analysis and IC analysis. IC + - ZTZT VTVT