High-Performance Analog-to-Digital Converters: Evolution and Trends

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High-Performance Analog-to-Digital Converters: Evolution and Trends Pedro Figueiredo pmff@synopsys.com Topical Workshop on Electronics for Particle Physics 2015 28th September 2015

Outline ADC performance: Evolution ADC architectures: Relationships, Speed, Performance Technology Scaling: Difficulties and Opportunities Synopsys digitally calibrated Pipeline and SAR ADCs

The Analog-to-Digital Converter Translates an analog input signal into its binary coded representation (N bit), at a certain rate (fs) Energy Efficiency

Evolution of ADC performance Data from Prof. Murmann’s Survey [1] ~80x Energy Efficiency improves 2x [2]: Low/Medium Resolution: every ~1.6 yrs High Resolution: every ~5.4 yrs

Evolution of ADC performance Walden’s FOM=P/(2ENOB.fs) Assumptions: 1 extra bit  P increases 2 Power scales linearly with fs Range of applicability Best FOM: 10/12b 40kS/s-4MS/s low VDD 6-8b >1 GSPS ADCs Lower power efficiency

Evolution of ADC performance Power per conversion-step as a function of fs 7 pJ/conv.step 100 fJ/conv.step 0.5 pJ/conv.step Many more high frequency ADCs (though max reported fs increased only ~2x) 10 fJ/conv.step But still a significant number of publications in this frequency range 1 fJ/conv.step Record FOM values Wireless Sensor Networks Internet of Things

Evolution of ADC performance Some of Synopsys ADC implementations

ADC architectures ADC architectures typically presented as different and (somewhat) unrelated alternative solutions… … each with its own pros and cons … … each best suited to certain resolution and fs Here we will focus on fundamental operations and how they are related [3]

Single and Multi-bit ADCs ADC fundamental operations: sampling and quantization Single bit ADC: Multi-bit ADC: ... i.e. minimize the residue ... ... and then use bout=ddac Conversion Process: Search the DAC output that best approaches the sampled input...

SAR ADC SAR ADC is the direct implementation of the elementary multi-bit architecture Very efficient: Re-uses same hardware in each cycle Necessary number of cycles grows linearly with resolution: N cycles for N bits Performance limited by DAC nonlinearity

Speed Increase: Parallelization in the code-search process If DAC provides several outputs simultaneously: possible to search several codes in parallel Different codes are searched by different paths Faster: N/NC cycles to complete a conversion Number of parallel paths: 2Nc Differences between them degrade performance Examples: 2 and 3 bit per cycle SAR ADCs [4,5] Multi-step Cyclic Subranging ADC

Speed Increase: Parallelization in the code-search process Taking this parallelization to the limit: NC=N All codes are searched simultaneously Flash ADC

Speed Increase: Pipelining Another possibility is pipelining: Quantization process is divided in several steps that occur in a pipelined fashion: Typically, quantizers have low resolution  low parallelization in the code search process At a given clock cycle, the ADC is quantizing several different samples

Speed Increase: Pipelining Pipelined ADCs: Practical considerations lead to the structure shown below. Each stage constituted by: Quantizer Residue calculator/amplifier block – MDAC Residue: error signal corresponding to what is left to quantize

Speed Increase: Pipelining Quantizer specifications are relaxed (low resolution) MDAC non-idealities limit performance Gain error of S/H, DAC and residue amplifier limit overall linearity In practice this translates into stringent gain specifications of the amplifier implementing the MDAC

Speed Increase Technique  Limitations Non-linearity of the DAC(s) limits performance Additionally: Use of Pipelining  Residue Amplification  Relaxed Quantizers  Performance limited by amplification blocks Use of Parallelization in the code search process  Quantizer only ADCs  Many parallel paths Performance limited by differences between parallel paths (offsets) SAR ADCs use none of the above: limited only by DAC non-linearity

Parallelization: in time domain Another parallelization possibility is time-interleaving Different samples processed by independent paths Differences of offset, gain, sampling instants degrade performance Unit ADCs use the parallelization/pipelining techniques previously discussed Nch ADCs  fs increases Nch times Example: 6b 90GS/s ADC with 64 unit SAR ADCs [6]

ADC implementations in advanced technologies Technology Scaling – the bad Reduction of gm/gds Headroom limitations caused by VDD reduction Bad CMOS switches Higher variability Transistor properties and matching more and more dependent on surroundings Higher interconnect delays … and the good Faster devices Digital processing is increasingly powerful, cheap and low power - available to overcome limitations in the analog sub-blocks of ADCs Digitally Assisted Analog

ADCs with residue calculation/amplification Typical 1.5b MDAC circuit f1: Sampling f2: Residue Amplification Negative feedback around a high-gain amplifier sets residue amplification gain very accurately Increasingly difficult to attain high gain in nanoscale technologies Class A amplifiers not power efficient

ADCs with residue calculation/amplification Techniques to improve power efficiency: Opamp switching reduces power consumption during reset phase, but introduces speed or headroom limitations [7-9] Opamps can be shared between stages in order to ensure they are being used at all times [10-13] Class AB amplifiers [14] may be used, but are more complex and have limited effectiveness

ADCs with residue calculation/amplification Techniques to improve power efficiency: Use of low gain amplifiers and digital calibration Opamp substituted by comparator + current source [15,16]. No stability and gain-bandwidth product limitations Stops consuming when the desired voltage is reached

ADCs with residue calculation/amplification Techniques to improve power efficiency: Open loop amplifiers based on transconductances [17,18]: Gain is parasitic and PVT dependent, and non-linearity is non-negligible. Complex digital calibration required Open loop amplifiers that are not based on transconductances: Parametric amplification [19,20] Bucket brigade circuits [21,22] Even larger non-linearity and dependence of parasitics/PVT Digital calibration complexity is further increased

12b 200MS/s digitally calibrated pipeline ADC Calibration of amplifier finite gain and capacitor mismatches Fast startup time and robustness against VDD/Temp variations Stages with reduced output swing Opamp switching technique with no speed or signal swing limitations .

12b 200MS/s digitally calibrated pipeline ADC Gain error of S/H, and residue amplifier, and mismatches of the DAC cause GEi and GEo1 Digital gain calibration: Multiply by 1/GEo .

12b 200MS/s digitally calibrated pipeline ADC Determination of digital coefficients Foreground (Fast Startup) U.S. Patent 8 742 961 Background (Adapt coef. as VDD/Temp varies)

12b 200MS/s digitally calibrated pipeline ADC Capacitor CD: Injects the Pseudo-Random Binary Sequence on the central segment Shifts L/R segments in order to reduce signal swing Lower amplifier non-linearity Relaxed settling specifications U.S. Patent 8 797 196

12b 200MS/s digitally calibrated pipeline ADC Amplifier: Single stage, high-swing  A016dB only Switching of CB reduces power consumption in f1 No speed or signal swing limitations U.S. Patent 8 610 422

12b 200MS/s digitally calibrated pipeline ADC Measurement results: Calibration off Calibration on

Quantizer-only ADCs No need for highly linear or gain accurate blocks  better adapted to nanometer technologies Non-linearity of the DACs inside the quantizers: Caused by random deviations on its constitutive elements Matching improved by using devices with larger area Resistive ladder DACs: increased parasitics Switched capacitor DACs: sets a minimum limit for the value of the capacitors (as does noise) May also be addressed by digital calibration

Quantizer-only ADCs Performance of flash/subranging/time-interleaved SAR ADCs limited by comparator offsets Add pre-amplifier with offset sampling Static consumption Non-negligible residual offset [23]

Quantizer-only ADCs Offset calibration: Programmable capacitor or current source arrays in dynamic comparator [24,25] Auxiliary diff pair and switched capacitor integrator [23,26] No speed reduction Marginal power increase High calibration-range/calibration-step ratio (Almost) perfect offset removal

Quantizer-only ADCs Averaging [23,27,28] Offset of comparators is a weighted sum of several amplifiers Offsets become correlated Lower area devices may be used

Quantizer-only ADCs Stochastic flash ADCs [29,30]: Fully synthesized in a digital flow >>2N minimum size comparators with the same VREF Output code obtained by counting the number of ‘1’ Nonlinear transfer function: Gaussian cumulative distribution  Linearization through digital calibration

12b 80MS/s digitally calibrated SAR ADC Asynchronous architecture. Operation independent of clk duty cycle Low noise fully dynamic comparator Use of time-interleaving: 12b 160MS/s and 320MS/s ADCs

12b 80MS/s digitally calibrated SAR ADC DAC with capacitive dividers avoids the exponential increase on the number of (small) unit capacitors Digital calibration: addresses random capacitor mismatches and sensitivity to parasitics in the capacitive divider nodes. Measures capacitor ratios at startup Corrects the raw code provided by the SAR

12b 80MS/s digitally calibrated SAR ADC Measurement results: Calibration bypassed Calibration on

Conclusions Reviewed ADC performance evolution in the last 10 years Main trend: energy efficiency improvement

Conclusions ADC architectures SAR ADC is the direct implementation of the elementary multi-bit ADC architecture Speed increase: use parallelization in the code-search process or pipelining This yields ADCs based only on quantizers, and those based on residue amplification for further quantization …which have significantly different trade-offs Speed also increases by parallelizing in time-domain: time-interleaving

Conclusions Reviewed challenges/benefits introduced by technology scaling Digitally Assisted Analog trend: Relaxed analog circuits’ complexity… …traded favorably by extra digital complexity Disclosed a few details about Synopsys 12b digitally calibrated pipeline and SAR ADCs Illustrated how the use of digital calibration can dramaticaly improve performance

References B. Murmann, http://www.stanford.edu/~murmann/adcsurvey.html G. Manganaro, Advanced Data Converters. Cambridge University Press, 2012. P. Figueiredo, “Recent advances and trends in high-performance embedded data converters” in High Performance AD and DA Converters, IC Design in Scaled Technologies, and Time-Domain Signal Processing. P. Harpe, A. Baschirotto, and K. Makinwa, Ed. Springer, 2014. H. Hong et al., “A 8.6 ENOB 900MS/s time-interleaved 2b/cycle SAR ADC with a 1b/cycle reconfiguration for resolution enhancement,” in Proc. ISSCC Dig. Tech. Papers, pp. 470-471, Feb. 2013. C-H. Chan et al., “A 5.5 mW 6b 5GS/s 4x-interleaved 3b/cycle SAR ADC in 65nm CMOS,” in Proc. ISSCC Dig. Tech. Papers, Feb. 2015. L. Kull et al., “A 90GS/s 8b 667mW 64× interleaved SAR ADC in 32nm digital SOI CMOS,” in Proc. ISSCC Dig. Tech. Papers, pp. 378-379, Feb. 2014. J. Crols and M. Steyaert, “Switched-Opamp: an approach to realize full CMOS switched-capacitor circuits at very low power supply voltages,” IEEE J. of Solid-State Circuits, pp. 936-942, Aug. 1994. H. Kim, D. Jeong, and W. Kim, “A 30mW 8b 200MS/s pipelined CMOS ADC using a switched-opamp technique,” in Proc. ISSCC Dig. Tech. Papers, pp. 284-285, Feb. 2005. H. Choi et al., “A 15mW 0.2mm2 10b 50MS/s ADC with wide input range,” in Proc. ISSCC Dig. Tech. Papers, pp. 842-843, Feb. 2006. K. Nagaraj et al., “A 250-mW, 8-b, 52-Msamples/s parallel-pipelined A/D converter with reduced number of amplifiers,” IEEE J. of Solid-State Circuits, pp. 312-319, Mar. 1997. B.-M. Min et al., “A 69-mW 10-bit 80-MSample/s pipelined CMOS ADC,” IEEE J. of Solid-State Circuits, pp. 2031-2039, Dec. 2003.

References L. Sumanen, M. Waltari, and K. Halonen, “A 10-bit 200-MS/s CMOS parallel pipeline A/D converter,” IEEE J. of Solid-State Circuits, pp. 1048-1055, Jul. 2001. Y. Yao, D. Ma and F. Dai, “A 12-bit interleaved opamp-sharing pipeline ADC for extreme environment applications,” in Proc. IEEE ICSICT, pp. 394-396, Nov. 2010. J. Kim and B. Murmann, “A 12-bit, 30-MS/s, 2.95-mW pipelined ADC using single-stage class-AB amplifiers and deterministic background calibration,” in Proc. ESSCIRC, pp. 378-381, Sep. 2010. L. Brooks and H.-S. Lee, “A 12b 50MS/s fully differential zero-crossing-based ADC without CMFB,” in Proc. ISSCC Dig. Tech. Papers, pp. 166-167, Feb. 2006. D.-Y. Chang et al., “A 21mW 15b 48MS/s zero-crossing pipeline ADC in 0.13m CMOS with 74dB SNDR,” in Proc. ISSCC Dig. Tech. Papers, pp. 204-205, Feb. 2014. B. Murmann and B. Boser, "A 12-bit 75 Ms/s pipelined ADC using open-loop residue amplifier," IEEE J. of Solid-State Circuits, pp. 2040-2050, Dec. 2003. F. Goes et al., “A 1.5mW 68dB SNDR 80MS/s 2× interleaved SAR-assisted pipeline ADC in 28nm CMOS,” in Proc. ISSCC Dig. Tech. Papers, pp. 200-201, Feb. 2014. P. Figueiredo and J. Vital, “The MOS capacitor amplifier,” IEEE Trans. Circuits Syst. II, pp. 111-115, Mar. 2004. J. Oliveira et al., “An 8-bit 120-MS/s interleaved CMOS pipeline ADC based on MOS parametric amplification,” IEEE Trans. Circuits Syst. II, pp. 105-109, Feb. 2010. M. Anthony et al., “A process-scalable low-power charge-domain 13-bit pipeline ADC,” in Proc. of the IEEE Symp. on VLSI Circuits, pp. 222-223, Jun. 2008. N. Dolev, M. Kramer, and B. Murmann, "A 12-bit, 200-MS/s, 11.5-mW pipeline ADC using a pulsed bucket brigade front-end", in Proc. of the IEEE Symp. on VLSI Circuits, pp. 98-99, Jun. 2013.

References P. Figueiredo and J. Vital, Offset Reduction Techniques in High-Speed Analog-to-Digital Converters, Springer, 2009. G. Plas. S. Decoutere, and S. Donnay, “A 0.16pJ/conversion-step 2.5mW 1.25GS/s 4b ADC in 90nm digital CMOS process,” in Proc. ISSCC Dig. Tech. Papers, pp. 566-567, Feb. 2006. T. Danjo et al., “A 6b, 1GS/s, 9.9mW interpolated subranging ADC in 65nm CMOS,” in Proc. of Int. Symp. on VLSI Design, Automation and Test, pp. 1-4, Apr. 2012. P. Figueiredo et al., “A 90nm CMOS 1.2 V 1GS/s two-step subranging ADC,” in Proc. ISSCC Dig. Tech. Papers, pp. 568-569, Feb. 2006. K. Kattmann and J. Barrow, “A technique for reducing differential non-linearity errors in flash A/D converters,” in Proc. ISSCC Dig. Tech. Papers, pp. 170-171, Feb. 1991. P. Figueiredo and J. Vital, “Averaging technique in flash analog-to-digital converters,” IEEE Trans. Circuits Syst. I, pp. 233–253, Feb. 2004. S. Weaver et al., “Stochastic flash analog-to-digital conversion,” IEEE Trans. Circuits Syst. I, pp. 2825–2833, Nov. 2010. S. Weaver et al., “Digitally synthesized stochastic flash ADC using only standard digital cells,” IEEE Trans. Circuits Syst. I, pp. 84–91, Jan. 2014.

pmff@synopsys.com