Hardware Architecture A. Voto, I. Dai, P. Oleniuk, B. Todd Standardisation of Automated Industrial Test Equipment for Mass Production of Control Systems.

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Presentation transcript:

Hardware Architecture A. Voto, I. Dai, P. Oleniuk, B. Todd Standardisation of Automated Industrial Test Equipment for Mass Production of Control Systems Power converters and their controls electronics are key elements for the operation of the CERN accelerator complex, having a direct impact on its availability. They must be designed to achieve a high Mean Time Between Failure (MTBF) and hardware reliability must be ensured by board-level testing before hardware is assembled and installed. A key element to achieve this, is the development of the industrial testers used in the board production phases. The roles of these testers are: to validate mass production during the manufacturing phase and to provide a means to repair failed modules brought back from operation during exploitation. Recently, the National Instrument PCI Extension for Instrumentation (PXI) was chosen by the TE-EPC-CCE section at CERN as standard platform for the development of testers. PXI is a modular platform for measurement and automation systems offering a low cost and flexible solution providing the benefits of an open industry standard. Technology Department – Electrical Power Converters Group - Converter Controls Electronics Section, CERN, 1211 Geneva, Switzerland Before moving to the PXI solution, a Generic Test Chassis (GTC) was developed to validate the first version of the Function Generator Controller (FGC). The GTC hardware was complex, difficult to maintain and expensive. Every card to be tested required a test card to adapt its interfaces, to correctly control and observe the various resources, specific to that card. Every test card consisted of a microcontroller, a FPGA and a flash memory, all these have complicated the GTC's hardware and software. This is the reason why the TE-EPC-CCE section has chosen moving to the PXI Platform. The PXI Chassis consists of a processor running windows, using LabWindows CVI to give access to the PXI bus and execute test programs. In addition to the PXI crate, the generic test setup consists of a specific Test Control Card (TCC) designed to interface the PXI Chassis with the Device Under Test (DUT). The TCC is by definition the hardware part dedicated to each card or module that must be tested. This TCC is mainly used to realise the interface in terms of voltage level or signal translation, between the specific board to test and the PXI. Sometimes this TCC can have some programmable logic embedded inside. PXI Setup All PXIs have an identical setup: Hardware Software Barcode reader. Dallas ID reader. FPGA Programmer. Industrial Test Equipment Project The PXI Platform Solution Each tester is implemented by developing a control sequence written in LabWindows/CVI, a C-based language, providing an easily maintainable structure. PXI Software Windows based system. Running LabWindowsCVI: C-based Language Easy to maintain and understand Structured Template developed Reusable functions Excel support Conclusions Over the past years we evaluated different platforms for the development of testers. Several versions of a Generic Test Chassis (GTC) were developed. It has turned out that the complexity of the hardware, the software and the excessive cost became too problematic. Therefore, recently, the National Instrument PCI Extension for Instrumentation (PXI) was chosen by the TE-EPC-CCE section at CERN as standard platform for the development of testers. The outcome of the aforementioned actions was achieving the flexibility and increase in the test platform’s performance while decreasing the costs. Topical Workshop on Electronics for Particle Physics - Lisbon, 28 September – 2 October 2015 Software Architecture Module TypesDescription NI PXI-1042Q8-slot 3U PXI Chassis with Universal AC NI PXI GHz Dual-Core PXI Embedded Controller NI PXI-4110Triple-Output Programmable DC Power Supply NI PXI Analog Inputs, 2 Analog Output, 24 Digital I/O NI PXI-6509Low-Cost, High-Current, 96 Ch, 5 V TTL/CMOS Digital I/O INCAA DIO8TTL Digital I/O (Timing Module) Exoligent WorldFIPFIP designer Table 1. Parts of our PXI System Log File Detailed Log is created at the end of each test. A unique file created for each board. Information included: Date/Time Test list performed Dallas ID Barcode ID Temperature Test performed: PASS/FAIL/PENDING/SKIP/ERROR Measured parameters (if required) Example Project - FGClite Testers FGClite BoardDescription FGClite MBMain Board FGClite ABAnalogue Board FGClite CBCommunication Board FGClite XBAuxiliary Board FGClite PBPower Board FGClite IOBInput/Output Board FGClite RadDIMDiagnostic Interface Module The LHC has several thousand magnets, both warm and super-conducting, which are supplied with current by power converters. Each converter is controlled by a purpose-built electronic module called a Function Generator Controller (FGC). The new converter controls for the LHC are based on the radiation tolerant version of the Function-Generator Controller (FGClite) to be used in the radiation areas of the LHC. For each board of the FGClite crate, the PXI based tester has been developed to verify the electrical continuity of the boards. Table 3. Parts of FGClite FGClite AB Tester 3D Model TCC DUT Software/GUI NI LabWindows/CVI Reconfigurable Hardware PXI Instrumentation Excel Test List In order to be able to execute functions "from" Excel spreadsheet, a special library that associates strings in Excel Spreadsheet file cells with function names has been implemented in the CVI software. FGClite IOB Tester 3D Model FGClite XB Tester 3D Model FGClite CB Tester 3D Model PXI is a rugged PC-based platform for measurement and automation systems. PXI combines PCI electrical-bus features with the modular, Eurocard packaging of CompactPCI and then adds specialized synchronization buses and key software features. National Instruments provides many standard modules to choose from, each providing a different function. Third party vendors can also produce boards for the NI PXI system making the system extremely adaptable to any tester setup. This allows the testers to share the same hardware and software structure resulting in significant resources sharing, a quick turnaround time, and a lower per-unit cost than a complete in-house design. Module TypesDescription Embedded PCWindows based Embedded Controller MCU M32C/87Renesas Microprocessor Spartan 3AN-700 Xilinx FPGA Spansion FLASHFLASH Memory FAT16 USBUSB Device Table 2. Parts of GTC System Test Software Execution XB Tester Setup FGClite XB Tester FGClite AB Tester FGClite RadDIM Tester FGClite Boards FGClite PB Tester PXI Hardware PXI Chassis PXI Embedded Controllers. Programmable PSU. DAQ Modules. INCAA FPGA Module. Exoligent WorldFIP designer Module. PXI TCC Simple interface between PXI and DUT. No FPGAs or microcontrollers required. Low cost. GUI Virtual LEDs. Displays relevant information. Allow control of the test. Dallas Reader JTAG Programmer TCC DUT Tester GUI NI PXI PXI Platform GTC Platform