Defects. Types of defects Structures of the solids considered have been ideal, i.e. devoid of defects. Structures of the solids considered have been ideal,

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Presentation transcript:

Defects

Types of defects Structures of the solids considered have been ideal, i.e. devoid of defects. Structures of the solids considered have been ideal, i.e. devoid of defects. Real materials contain structural defects which can dominate their physical and chemical behaviour. Real materials contain structural defects which can dominate their physical and chemical behaviour. ? Disordered? Disordered?

Definition: A structural defect is thus a configuration in which an atom, or group of atoms does not satisfy the structural rules belonging to the ideal reference state of the materials. A structural defect is thus a configuration in which an atom, or group of atoms does not satisfy the structural rules belonging to the ideal reference state of the materials. There are many different types of structural defects. Defects are spatially localized in some way, i.e. defects are structurally inhomogeneous. There are many different types of structural defects. Defects are spatially localized in some way, i.e. defects are structurally inhomogeneous.

Zero-dimensional (point) defects: An atom may be missing from a lattice site, thereby forming an atomic vacancy. An atom may be missing from a lattice site, thereby forming an atomic vacancy. Another type of atom may be present at a lattice site, forming a substitutional impurity defect. Another type of atom may be present at a lattice site, forming a substitutional impurity defect. An atom may be situated at an interstritial site between lattice sites. An atom may be situated at an interstritial site between lattice sites.

One-dimensional (line) defects Translational displacements of atoms (dislocations). Translational displacements of atoms (dislocations).

Rotational displacements (disclinations).

Two dimensional (planar) defects Low angle grain boundary Low angle grain boundary

V-shaped crystals in CVD prepared diamond film grown on Si substrate P.B. Barna

Amorphous cases? Types of defects?

Dangling bond (positive U) It is simple a broken or unsatisfied bond in a covalent solid. A simple dangling bond normally contains one electron and electrically neutral. But! Under certain circumstances the electronic occupancy can change! It is simple a broken or unsatisfied bond in a covalent solid. A simple dangling bond normally contains one electron and electrically neutral. But! Under certain circumstances the electronic occupancy can change! (U is Hubbard energy; electron-electron interaction) (U is Hubbard energy; electron-electron interaction)

In amorphous silicon the atoms form a continuous random network. Not all the atoms within amorphous silicon are fourfold coordinated. Some atoms have a dangling bond. These dangling bonds are defects in the continuous random network, which cause anomalous electrical behavior. In amorphous silicon the atoms form a continuous random network. Not all the atoms within amorphous silicon are fourfold coordinated. Some atoms have a dangling bond. These dangling bonds are defects in the continuous random network, which cause anomalous electrical behavior. Dangling bond (DB) has ESR signal! Dangling bond (DB) has ESR signal! D 0 ; D + ; D - D 0 ; D + ; D -

Avoid DB If desired, the material can be passivated by hydrogen, which bonds to the dangling bonds and can reduce the dangling bond density by several orders of magnitude. Hydrogenated amorphous silicon (a-Si:H) has a sufficiently low amount of defects to be used within devices. If desired, the material can be passivated by hydrogen, which bonds to the dangling bonds and can reduce the dangling bond density by several orders of magnitude. Hydrogenated amorphous silicon (a-Si:H) has a sufficiently low amount of defects to be used within devices.

Dangling bond (negative U) VI. column elements: VI. column elements: a. End of chains, one coordinated atoms. a. End of chains, one coordinated atoms. b. Junction, three-fold coordinated atoms. b. Junction, three-fold coordinated atoms. No ESR signal. Electron-Phonon interaction No ESR signal. Electron-Phonon interaction Coordination defects

Wrong bonds A-A, B-B bonds in AB alloys instead of A-B bonds A-A, B-B bonds in AB alloys instead of A-B bonds

Electrical conductivity

General aspects Electrical conduction of amorphous semiconductors consists of : Electrical conduction of amorphous semiconductors consists of : 1. band conduction 1. band conduction 2. hopping conduction 2. hopping conduction

1.Band conduction (electron and hole) Band conduction in undoped amorphous semiconductor characterized by Band conduction in undoped amorphous semiconductor characterized by б=б o exp { - E a / k b T} б=б o exp { - E a / k b T} where б and б o are electrical conductivity and a prefactor. E a, k b and T are the activation energy, the Boltzmann constant and temperature. where б and б o are electrical conductivity and a prefactor. E a, k b and T are the activation energy, the Boltzmann constant and temperature.

2. Hopping conductivity a./ nearest-neighbour hopping a./ nearest-neighbour hopping Nearest neighbour hopping is well known in crystalline semiconductors, in which electrons hop the nearest-neighbouring sites by emitting or absorbing phonons in n-type (p-type) semiconductors. Nearest neighbour hopping is well known in crystalline semiconductors, in which electrons hop the nearest-neighbouring sites by emitting or absorbing phonons in n-type (p-type) semiconductors.

b./ variable-range hopping b./ variable-range hopping Variable-range hopping is particularly associated with tail states, in which electrons or holes in tail states hop to the most probable sites. This type of hopping conductivity is characterized by temperature variation as follows: Variable-range hopping is particularly associated with tail states, in which electrons or holes in tail states hop to the most probable sites. This type of hopping conductivity is characterized by temperature variation as follows: б p =б po exp { - B/ T 1/4 }