FeaturesBenefits MagniVu™ acquisitionAvoid missing events completely in either timing or state acquisition mode with higher sampling resolution (up to.

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Presentation transcript:

FeaturesBenefits MagniVu™ acquisitionAvoid missing events completely in either timing or state acquisition mode with higher sampling resolution (up to 20 ps) on all channels iCapture™ multiplexingEliminate double probing with simultaneous digital and analog acquisition through a single logic analyzer probe iView™ displayGain complete system visibility with time-correlated, integrated analog and digital data on one display iVerify™ analysisQuickly find signal integrity issues with multi-channel bus analysis using oscilloscope-generated eye diagram Automated measurementsEasily summarize your design’s performance with sophisticated measurements such as: frequency, period, pulse width, duty cycle, and edge count Drag & drop triggersQuickly isolate events through simple and intuitive trigger setup. Triggers include: Channel Edge, Channel Value, Bus Value, Multi-Group Value, Glitch, Setup and Hold Violation, or Trigger on Anything Featuring:  Modular mainframes provide flexibility and expandability, from 2-slot TLA7012 and 6-slot TLA7016  All measurement modules are fully interchangeable between TLA7012 and TLA7016  68/102/136 channel modules with up to 128 Mb record length  Up to 20 ps (50 GHz) high-speed timing resolution  Up to 156 ps (6.4 GHz)/128 Mb deep memory timing analysis  Up to 1.4 GHz / 3.0 Gb/s state acquisition analysis  Control and monitor the TLA Series remotely over the network  PCI Express Gen 1 through Gen 3 Including Gen 3 Protocol to Physical Layer Analysis for Link Widths from x1 through x16 The speed you need, the visibility you want, the flexibility you desire Performance you can see Product Fact Sheet TLA7000 Series Logic Analyzer Breakthrough solutions for real-time digital systems analysis

Key ApplicationsBenefits  Signal integrity  Find elusive glitches and events with MagniVu™ acquisition’s high speed timing resolution of up to 20 ps  Memory  Perform complete validation of digital timing performance for the latest speeds of DDR3 and GDDR  FPGA  Easily measure signals inside Altera or Xilinx FPGA designs and select which group of internal signals to probe without having to recompile  Serial data  Analyze from the protocol to the physical layer for PCI Express Gen 1 through Gen 3 with up to 8.0 GT/s acquisition rates and up to 16 GB deep memory (for x16 Link)  MIPI  Verify protocol and analyze proprietary versions of the DigRF standard without specialized external hardware 2/11 JS/WWW 54W Copyright © 2011 Tektronix All rights reserved. Modules Channels/Lanes (per module) State Clock Rate Record Length (Qtr/Half/Full CH) Timing (Qtr/Half/Full CH) Timing (MagniVu™ acquisition) TLA7SAxx 4, 8 lanes (2 modules for x16) Up to 8 GT/s Up to 16 GB (x16) (160 MSym/Lane) -- TLA7ACx 68, 102, 136 ch 235 MHz std; 450 MHz opt. 8/4/2 Mb to 512/256/128 Mb 500 ps / 1 ns / 2 ns125 ps TLA7BBx68, 102, 136 ch 750 MHz std; 1.4 GHz opt. --/4/2 Mb to --/128/64 Mb ps / ps / 625 to 50 ns 20 ps Key Options TLA7012Portable mainframe; 2 modules; built-in 15 inch (38.1 cm) display Opt. 18 Optional touch screen Opt. 1CAdd iView™ external oscilloscope interface kit Opt. 1KAdd LACART logic analyzer cart Opt. R3/R53 or 5 year repair service plan Opt. C3/C53 or 5 year calibration service plan TLA7016Benchtop mainframe; 6 modules; requires external computer Opt. 1CAdd iView™ external oscilloscope interface kit Opt. 1KAdd LACART logic analyzer cart Opt. R55 year repair service plan Opt. C3/C53 or 5 year calibration service plan Recommended Probes and Accessories PG3AMODDigital pattern generator module A wide variety of probes are recommended, including: P67SAxx08 or 16-Differential Inputs (x4 or x8) PCI Express midbus P67SA16G216-Differential Inputs PCI Express Gen2 midbus P67SAxxS08 or 16-Differential Inputs PCI Express slot interposer P67SA01SD1-channel PCI Express solder-down P channel general-purpose P channel high-density P channel single-ended high-density with D- Max® probing technology P channel (optimized for half channel mode) single-ended high-density with D-Max® probing technology P channel (optimized for qtr channel mode) single-ended high-density with D-Max® probing technology P channel differential high-density with D- Max® probing technology Product Fact Sheet TLA7000 Series Logic Analyzer Key specifications and ordering information