Consider the formation of a p-n junction by placing two n- doped and p-doped crystals side-by-side:  (doping density) NdNd NaNa e-e- Positive charges.

Slides:



Advertisements
Similar presentations
P-N JUNCTION.
Advertisements

1 Chapter 5-1. PN-junction electrostatics You will also learn about: Poisson’s Equation Built-In Potential Depletion Approximation Step-Junction Solution.
Chapter 6-1. PN-junction diode: I-V characteristics
CHAPTER 4 CONDUCTION IN SEMICONDUCTORS
Lecture #5 OUTLINE Intrinsic Fermi level Determination of E F Degenerately doped semiconductor Carrier properties Carrier drift Read: Sections 2.5, 3.1.
P – n junction Prof.Dr.Beşire GÖNÜL.
Lecture 5 OUTLINE PN Junction Diodes I/V Capacitance Reverse Breakdown
© Electronics ECE 1312 Recall-Lecture 2 Introduction to Electronics Atomic structure of Group IV materials particularly on Silicon Intrinsic carrier concentration,
1 Fundamentals of Microelectronics  CH1 Why Microelectronics?  CH2 Basic Physics of Semiconductors  CH3 Diode Circuits  CH4 Physics of Bipolar Transistors.
ECE 4339: Physical Principles of Solid State Devices
Integrated Circuit Devices
MALVINO Electronic PRINCIPLES SIXTH EDITION.
Semiconductor Physics - 1Copyright © by John Wiley & Sons 2003 Review of Basic Semiconductor Physics.
© 2012 Eric Pop, UIUCECE 340: Semiconductor Electronics ECE 340 Lectures P-N diode in equilibrium So far we studied:  Energy bands, doping, Fermi.
p – n junction barrier height,
Department of EECS University of California, Berkeley EECS 105 Fall 2003, Lecture 9 Lecture 9: PN Junctions Prof. Niknejad.
OUTLINE pn junction I-V characteristics Reading: Chapter 6.1
Lecture 27: PN Junctions Prof. Niknejad.
Department of EECS University of California, Berkeley EECS 105 Fall 2003, Lecture 8 Lecture 8: Capacitors and PN Junctions Prof. Niknejad.
Ideal Diode Model.
Department of Information Engineering256 Semiconductor Conduction is possible only if the electrons are free to move –But electrons are bound to their.
EE105 Fall 2011Lecture 3, Slide 1Prof. Salahuddin, UC Berkeley Lecture 3 OUTLINE Semiconductor Basics (cont’d) – Carrier drift and diffusion PN Junction.
MatE/EE 1671 EE/MatE 167 Diode Review. MatE/EE 1672 Topics to be covered Energy Band Diagrams V built-in Ideal diode equation –Ideality Factor –RS Breakdown.
ECE 663 P-N Junctions – Equilibrium P N W V appl = 0 V bi = (kT/q)ln(N A N D /n i 2 ) W =  2k s  0 V bi (N A +N D )/q(N A N D ) V bi EFEF.
EE580 – Solar Cells Todd J. Kaiser Lecture 05 P-N Junction 1Montana State University: Solar Cells Lecture 5: P-N Junction.
Spring 2007EE130 Lecture 17, Slide 1 Lecture #17 OUTLINE pn junctions (cont’d) – Reverse bias current – Reverse-bias breakdown Reading: Chapter 6.2.
Unit-II Physics of Semiconductor Devices. Formation of PN Junction and working of PN junction. Energy Diagram of PN Diode, I-V Characteristics of PN Junction,
 “o” subscript denotes the equilibrium carrier concentration. Ideal diode equation.
Drift and Diffusion Current
EXAMPLE 8.1 OBJECTIVE To determine the time behavior of excess carriers as a semiconductor returns to thermal equilibrium. Consider an infinitely large,
Copyright © The McGraw-Hill Companies, Inc. Permission required for reproduction or display. ECE 255: Electronic Analysis and Design Prof. Peide (Peter)
EXAMPLE 9.1 OBJECTIVE pn(xn) = 2.59  1014 cm3
Department of Electrical Engineering Arizona State University
ENE 311 Lecture 9.
ISAT 436 Micro-/Nanofabrication and Applications P-N Junction Diodes David J. Lawrence Spring 2004.
Carrier Concentration in Equilibrium.  Since current (electron and hole flow) is dependent on the concentration of electrons and holes in the material,
Empirical Observations of VBR
© 2013 Eric Pop, UIUCECE 340: Semiconductor Electronics ECE 340 Lecture 23 Current Flow in P-N diode Last time, we talked about unbiased P-N junction.
1 Detectors RIT Course Number Lecture N: Lecture Title.
President UniversityErwin SitompulSDP 8/1 Dr.-Ing. Erwin Sitompul President University Lecture 8 Semiconductor Device Physics
EE130/230A Discussion 6 Peng Zheng.
Introduction to semiconductor technology. Outline –4 Excitation of semiconductors Optical absorption and excitation Luminescence Recombination Diffusion.
 P-N Junction Diodes  Current Flowing through a Diode I-V Characteristics Quantitative Analysis (Math, math and more math)
President UniversityErwin SitompulSDP 6/1 Dr.-Ing. Erwin Sitompul President University Lecture 6 Semiconductor Device Physics
Physics of Semiconductor Devices
ELECTRONICS II VLSI DESIGN Fall 2013
pn Junction Diodes: I-V Characteristics
MOS Device Physics and Designs Chap. 3 Instructor: Pei-Wen Li Dept. of E. E. NCU 1 Chap 3. P-N junction  P-N junction Formation  Step PN Junction  Fermi.
CHAPTER 4: P-N JUNCTION Part I.
President UniversityErwin SitompulSDP 3/1 Dr.-Ing. Erwin Sitompul President University Lecture 3 Semiconductor Device Physics
President UniversityErwin SitompulSDP 11/1 Lecture 11 Semiconductor Device Physics Dr.-Ing. Erwin Sitompul President University
ספרות עזר : פרופ ' אדיר בר - לב, מוליכים למחצה והתקנים אלקטרוניים, עמ ' P.A. Tipler, Modern Physics, pp Mc Kelvey, Solidstate and Semiconductor.
Univ. of Inchon 6 pn Junction Diode : I-V Characteristics 반도체 소자 연구실 박 종 태
6 pn Junction Diode : I-V Characteristics. 6.1 THE IDEAL DIODE EQUATION Qualitative Derivation.
CSE251 CSE251 Lecture 2 and 5. Carrier Transport 2 The net flow of electrons and holes generate currents. The flow of ”holes” within a solid–state material.
CSE251 CSE251 Lecture 2. Carrier Transport 2 The net flow of electrons and holes generate currents. The flow of ”holes” within a solid–state material.
Band Theory of Electronic Structure in Solids
Intro to Semiconductors and p-n junction devices
Lecture 11 OUTLINE pn Junction Diodes (cont’d) – Narrow-base diode – Junction breakdown Reading: Pierret 6.3.2, 6.2.2; Hu 4.5.
Recall-Lecture 3 Atomic structure of Group IV materials particularly on Silicon Intrinsic carrier concentration, ni.
PN-junction diode: I-V characteristics
Recall-Lecture 3 Atomic structure of Group IV materials particularly on Silicon Intrinsic carrier concentration, ni.
Lecture 10 OUTLINE pn Junction Diodes (cont’d)
Recall-Lecture 3 Atomic structure of Group IV materials particularly on Silicon Intrinsic carrier concentration, ni.
4.4.6 Gradients in the Quasi-Fermi Levels
Deviations from the Ideal I-V Behavior
Lecture 3 OUTLINE Semiconductor Basics (cont’d) PN Junction Diodes
Lecture 10 OUTLINE pn Junction Diodes (cont’d)
PN-JUNCTION.
Presentation transcript:

Consider the formation of a p-n junction by placing two n- doped and p-doped crystals side-by-side:  (doping density) NdNd NaNa e-e- Positive charges occur when donors on the n-side are ionized during the electron transfer to the p-side. n-type p-type 0 x Negative charges form when holes are ionized by the capture of electrons. Electrons (e - ) flow to the p-side holes (h + ) flow to the n-side. Consider a p-n junction in equilibrium: Assume that non-degenerate conditions hold for all x. “Abrupt junction model” (1) There is a transfer of charge between the n- and p-type regions in order to equalize the Fermi-level (or chemical potential) on both sides. h+h+ Before: p-siden-side ECEVECEV   After: p-side n-side  ( E F ) ECEVECEV

In order to describe the spatial variation in the band edges, E C and E V, we introduce a potential function,  (x), such that each level is shifted by -e  (x). That is, E C  E C - e  (x) and E V  E V - e  (x). Therefore, the carrier concentrations can be expressed by Consider limits at x =  (2)

We can solve for the difference of the two potentials at  The electric field is related to the potential by Gauss’s Law: for our 1D problem. We assume that donor and acceptor impurities are fully ionized at all x. (3) We can substitute Eqs. (1) and (2) into Eq.(3) to get a difficult nonlinear differential equation.

We can make some important approximations to simplify and solve: Assume that the potential change  occurs in a finite region near the junction that is defined by -d p  x  d n. This is referred to as the depletion region. Also n << N d and p << N a in this region since  is closer to the middle of the gap (i.e., midgap). We can solve this problem assuming an abrupt junction model which will give a simple linear second order ordinary differential equation: Note that we have first used the boundary conditions at the edges of the depletion region (see graph on next slide) to solve for  (x): The potential must be its limiting value at the boundaries of the depletion region. The electric field must be zero outside the depletion region for equilibrium to hold.

NdNd NaNa Carrier density n c (x) p v (x) n-typep-type -dp-dp dndn 0 Depletion layer Charge density  (x) eN d -eN a dndn -dp-dp x x dndn -dp-dp (x)(x)  ()()  (-  ) x Graphical illustration of the Abrupt-junction model.

dndn -dp-dp (x)(x)  ()()  (-  ) x x Comparison of the potential and electric field in the abrupt-junction model: There are important relations that we get by imposing continuity of  (x) and  ’(x). Continuity of the derivative gives:

Secondly, continuity of  (x) gives Together with the derivative condition: N d d n =N a d p this gives For N a,d ranging from to cm -3  d n,p ranges from 10 4 to 10 2 Å The total depletion width is L D = d n +d p We can also write this in a numerically convenient form: The maximum electric f ield within the depletion layer is of the order of  / (d n+a d p ) and ranges from 10 5 to 10 7 volts/m.

Charge density,  (x) -eN a dndn -dp-dp x dndn -dp-dp x dndn -dp-dp x (x)(x)  o  o - |V 1 |  o + |V 2 | 1(x)1(x) 2(x)2(x) Consider the effect of an applied voltage on the depletion width of a p-n junction: p n V = 0 “zero-bias” V 1 > 0 “Forward-Bias” p n V 2 < 0 “Reverse-Bias” The potential simply changes according to  =  o  |V| - sign: “Forward bias” + sign: “Reverse bias” We are changing the size of the depletion region by applying an external voltage.

The formula for the depletion width can easily be modified to include the effects of a voltage bias: Zero-bias depletion length Consider rectification by a p-n junction. The symbol J is used for # of carriers /(area·time). The lower case symbol j is more commonly used for current density and has units j = coulombs/ (area·time). Note j e = -e J e and j h = e J h. p-side n-side  ( E F ) ECEVECEV Consider electron and hole generation currents. These carriers are generated by thermal excitation as we saw before according to Note: The generation currents involve minority carriers. e-e- h+h+

In a band diagram, electrons fall down hill and holes “float” uphill (both towards lowest energy). In the process of the generation currents, holes (from n-side)  p-side, electrons (from p-side)  n-side. Secondly, consider another kind of current, Recombination current. With this kind of current holes (from p-side)  n-side. Electrons from the n-side  p-side. This current involves majority carriers, and it is made possible by thermal excitation over the barrier, as shown below: p-side n-side  ( E F ) ECEVECEV  o - |V 1 | e-e- h+h+ Consider the hole recombination current. The current is approximated well by assuming thermionic emission over the barrier: The middle equation is a statement that no net current can flow during equilibrium when V=0.

The total hole current from the p to the n-side is given by the recombination current minus the generation current: The last equation includes the currents of both holes and electrons, since the same analysis will also apply to electrons. It is obvious to understand the rectifying properties of a p-n junction (diode) from this equation. p n V V j Rectifying behavior of a p-n junction (diode). Saturation Reverse bias (V<0)Forward bias (V>0) We still need to calculate this term in terms of fundamental parameters describing transport. Note: In our notation J h and J p will mean the same thing.

In a more general treatment, it is not necessary to separate into generation and recombination currents. Note that to solve for the following five fundamental quantities (J e (x), J h (x), n(x), p(x), and  (x)), we need five equations. In the equilibrium case with V=0, J e (x)= J h (x)=0, we need three equations to solve the three unknowns, including Poisson’s equation for the potential. In the presence of a field E and  n and  p, we can write the electron and hole current densities as: Where  n and  p are the electron and hole mobilities in units of cm 2 /V·s, and D n and D p are the electron and hole diffusion constants in units of cm 2 /s When dn/dx=0, From the Dude theory (m  v=F  t) recall Therefore, Which expresses  in terms of the collision time and masses, based on the Drude model.

Now, recall that At equilibrium, These last two relations are known as the Einstein relations. Consider continuity equations for transport of charge: If V  0 and carriers are conserved. We have to include two other processes which act as a source and drain for carriers: (i) Generation by thermal excitation (ii) Recombination (electron  hole) ECEVECEV (i)(i)(ii) As a result the continuity equations need to include these additional terms:

The g-r terms act to restore the system to equilibrium when the system deviates from equilibrium. These terms can be further described by electron and hole lifetimes (  n and  p ): where n o and p o are equilibrium concentrations as determined by the law of mass action. Note that  n >>  n col and  p >>  p col ; typically  n ~10 -9 s and  n col ~ s Very often we deal with a steady state condition in which This gives p n V For V  0, we are not in equilibrium but we have a steady state for V = const. Note that J e = J h = 0 for V = 0  n = n o and p = p o. Now suppose that E  0, i.e., the electric field is negligible. Then Fick’s Law for Diffusion

Therefore, further give the following 2 nd order ordinary differential equations which are referred to as diffusion equations: Note n o and p o are equilibrium values. The solutions are easily written as: The diffusion lengths L p and L n are given by Note that when E  0, the majority carrier density is constant and the carriers in the diffusion equation are for the minority carriers. For example if we have a p-type material pn = n i 2 and p >> n so that electrons (n p ) are minority carriers. The notation is slightly changed to be more precise: p-typen-type

Examine the meaning of the diffusion lengths, L n and L p. Since From the equipartion theorem and Drude approximation: ½ mv th 2 = 3/2 k B T Further, the mean free path l n is given by l n =v th  col where v th is the thermal velocity of a carrier. The interpretation here is as follows: When a carrier undergoes N collisions before recombination, the net displacement will be The factor of 3 comes from the number of degrees of freedom (3D). This is basically a “random walk” problem Note that  n >>  n col and  p >>  p col ; typically  n ~10 -9 s and  n col ~ s  N  3000 as the number of collisions before recombination in GaAs.

We need to improve our understanding of transport across the p-n junction. Consider an equivalent description of Boltzmann statistics at thermal equilibrium: Remember that where n i is the intrinsic carrier concentration E F =  is the Fermi-level (or chemical potential), and E i is the position of the chemical potential for the intrinsic case. Let us define potentials  = -E i /e and  = -E F /e. At thermal equilibrium pn=n i 2 (V=0 across the junction). For the case of V  0, we can write the carrier concentrations as Where  n and  p are called quasi-Fermi levels or imrefs (imaginary references). The advantage of this formalism is that the potential difference V across the junction is just the difference in the quasi-Fermi levels, i.e.

E (eV) ECEC EVEV E F (  ) -e  p -e  n p-siden-side -d p 0 d n Potential pp nn -d p 0 d n  V log(n,p) -d p 0 d n p po p no n po n no pnpn npnp nini Forward-Bias Conditions -e  p -e  n -d p 0 d n p-siden-side Reverse-Bias Conditions ECEC EVEV E F (  ) pp nn -d p 0 d n -V log(n,p) -d p 0 d n p po p no n po n no pnpn npnp nini xx  x x xx Potential E (eV) Note that (d p +d n ) for reverse bias is greater than (d p +d n ) for forward bias.

For a forward bias V =  p -  n > 0 and pn > n i 2 in the junction. The opposite is the case for a reverse bias V =  p -  n < 0 and pn < n i 2. Now consider the current density and write in terms of  and  : Note that Our previous notation was Similarly, In the depletion layer –d p < x <d p since n and p are sharply decreasing functions in the depletion layer. Also, we assume that passage of carriers across the junction is very fast so that generation and recombination currents in the depletion region are negligible. This leads to assumption that J e and J p are constant in the depletion region –d p < x <d p For  p and  n constant, J e and J p are 0.

Consider n at x = -d p (on the p-side): Note that n po is the electron density on the p-side at x = - . Similarly, at x = +d n And p no is the hole density on the n-side at x = +  These equations serve as boundary conditions for the I-V equation of the ideal p-n junction. Recall that just outside of the depletion region (i.e. |x| > d n, d p the region is neutral, E  0, and this is called the diffusion region. In these regions, the following diffusion equations apply for the respective minority carrier densities: (1) (2) Using boundary conditions (1) and (2), the solutions are: Note that the expected limits are observed: n p  n po at x = -  while p n  p no at x = + 

We can now calculate the electron and hole currents entering the diffusion region where E  0. At x = d n for the n-side. for the p-side. The total current is given by J = J e + J p where This result is the well known Shockley equation. Previously we wrote the current in terms of electron and hole generation currents: Note that (on n-side)(on p-side) and Contains fundamental parameters describing the rectifying behavior.

Examine the minority carrier densities and current densities for forward and reverse bias: n,p -d p 0 d n p no n po pnpn npnp x J -d p 0 d n x J=J n +J p JnJn JpJp p-siden-side n,p -d p 0 d n p no n po pnpn npnp x p-siden-side J -d p 0 d n x J=J n +J p JnJn JpJp Note that (d p +d n ) for reverse bias is greater than (d p +d n ) for forward bias. Forward Bias (V >0)Reverse Bias (V<0)

Possible to examine details of diffusion, using the Haynes-Shockley Experiment Consider changes in minority carrier density with time: For E = 0, the solution follows the solution of the diffusion equation: Where N= number of holes/Area generated (laser light pulse). If E  0, x  x -  p Et h 0 L Sample t V Oscilloscope V t 1 (E = 0) t 2 t 3 t 1 t 2 (E > 0)  Et 1  Et 2