Transmission Electron Microscopy (TEM)

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Presentation transcript:

Transmission Electron Microscopy (TEM) Basic Principles & Application in Thin Film Photovoltaic Materials Puvaneswaran Chelvanathan P65212 Principal Supervisor: Professor Dr. Nowshad Amin

Presentation Outline Introduction : Limitation of Visible Light Microscopy (VLM) Electron Wave-Like Nature TEM Components & Working Principle TEM Image Generation Interpretation of TEM Images Application in PV Research Field TEM Facility : Hi-Tech Ltd. Conclusion

Limitation of Light Microscopy

Resolution Illustration Diffraction Barrier Phenomena

Visible Light & λ Abbe’s Diffraction Limit : “ It is a poor comfort to hope that human ingenuity will find ways and means of overcoming this limit” 20 years later…….

Particle-Wave Duality P.E K.E Taking Relativistic Effect into account:

Accelerating Voltage Vs. λ

Light Vs. Electrons

Wave-Matter Interaction

Introduction to Electron Microcopy

Optical vs. TEM vs. SEM vs. CRT

TEM Working Principle

Electron Gun

Electron Gun Types

Electron Gun Types

Electron Lens

Electron Lens

Optical Lens vs. Electron Lens

Principle of Electron Lens

Electron Beam Alignment

Electron Beam Focusing

Imaging: “Seeing The Electrons”

Imaging vs. Diffraction Pattern (DP)

Imaging : Bright Field vs. Dark Field

Imaging : Bright Field vs. Dark Field

Imaging : Bright Field

Imaging : Bright Field

Diffraction Pattern

Diffraction Pattern

Diffraction Pattern

Diffraction Pattern

Diffraction Pattern

Diffraction Pattern

Application in PV Device/Materials

Application in PV Device/Materials

Application in PV Device/Materials

Application in PV Device/Materials

Application in PV Device/Materials

Application in PV Device/Materials

Application in PV Device/Materials

TEM Facility : Hitech, Puchong

Some Results…. MoS2

Some Results…. MoS2

XRD vs. SAED XRD SAED

Conclusion TEM Fundamental Limitation of VLM TEM Main components & operating principles Image generation: BF, DF and DP Interpretation of DP Application in PV research Jeol Electron Microscopy 1.25 MeV HVEM

* Remarks Topics Not covered: TEM Sample Preparation Convergent Beam Electron Microscopy (CBED) Analytical Electron Microscopy (AEM) - Electron Energy Loss Spectroscopy (EELS) - Cathodoluminescence (CL)