Penn ESE370 Fall2011 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 28: November 16, 2011 Memory Periphery.

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Presentation transcript:

Penn ESE370 Fall DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 28: November 16, 2011 Memory Periphery

Today Decode Sensing Penn ESE370 Fall DeHon 2

Memory Bank Penn ESE370 Fall DeHon 3

Row Select Logically a big AND –May include an enable for timing in synchronous Penn ESE370 Fall DeHon 4 How many transistors (per bit)?

How tall is a row? Side length for cell of size: – – – Penn ESE370 Fall DeHon 5

6 How tall is an AND? Penn ESE370 Fall Townley & DeHon

Row Select How can we do better? –Area –Delay –Match to pitch of memory row Penn ESE370 Fall DeHon 7

Row Select Compute inversions outside array –Just AND appropriate line (bit or /bit) Penn ESE370 Fall DeHon 8

Row Select Share common terms Multi-level decode Penn ESE370 Fall DeHon 9

Row Select Same number of lines Half as many AND inputs Penn ESE370 Fall DeHon 10

Row Select: Precharge NAND Penn ESE370 Fall DeHon 11

Row Select: Precharge NOR Penn ESE370 Fall DeHon 12

Sensing Penn ESE370 Fall DeHon 13

Penn ESE370 Fall DeHon 14 SRAM Memory bit

Simulation W access =20 Penn ESE370 Fall DeHon 15

Sense Small Swings What do we have to worry about? Penn ESE370 Fall DeHon 16

Sense Small Swings Variation Common mode noise Penn ESE370 Fall DeHon 17

Differential Sense Amp Goal: –Reject common shift Penn ESE370 Fall DeHon 18

Differential Sense Amp Penn ESE370 Fall DeHon 19

What doe this do? Output when: –In=Gnd? –In=Vdd? –Transfer curve? Penn ESE370 Fall DeHon 20

“Inverter” Input high –Ratioed like grounded P Input low –Pulls itself up –Until V dd -V TP Penn ESE370 Fall DeHon 21

DC Transfer Function Penn ESE370 Fall DeHon 22

Differential Sense Amp Penn ESE370 Fall DeHon 23

Diffamp Transfer Function in=/in, looks like “inverter” Deliberately low gain in mid region Penn ESE370 Fall DeHon 24

Differential Sense Amp “Inverter” output controls PMOS for second inverter Sets PMOS operating point –current Penn ESE370 Fall DeHon 25

Differential Sense Amp View: –Current mirror –Biases where inverter operating Penn ESE370 Fall DeHon 26

Differential Sense Amp View: – adjusting the pullup load resistance –Changing the trip point for “inverter” Penn ESE370 Fall DeHon 27

DC Transfer /in with in=0.5V Penn ESE370 Fall DeHon 28

DC Transfer Various in Penn ESE370 Fall DeHon 29

After Inverter Penn ESE370 Fall DeHon 30

Ramp 50mV Offset Penn ESE370 Fall DeHon 31

Closeup 50mV Offset Penn ESE370 Fall DeHon 32

Connect to Column Equalize lines during precharge Penn ESE370 Fall DeHon 33

Singled-Ended Read Penn ESE370 Fall DeHon 34

5T SRAM Penn ESE370 Fall DeHon 35

Single Ended Given same problems –How sense small swing on single-ended case? Penn ESE370 Fall DeHon 36

Single Ended Need reference to compare against Want to look just like bit line Equalize with bit line Penn ESE370 Fall DeHon 37

Split Bit Line Split bit-line in half Precharge/equalize both Word in only one half –Only it switches Amplify difference Penn ESE370 Fall DeHon 38

Open Bit Line Architecture For 1T DRAM Add dummy cells Charge dummy cells to V dd /2 “read” dummy in reference half Penn ESE370 Fall DeHon 39

Memory Bank Penn ESE370 Fall DeHon 40

Energy Penn ESE370 Fall DeHon 41

Single Port Memory What fraction is involved in a read/write? What are most cells doing on a cycle? Reads are slow –Cycles long  lots of time to leak Penn ESE370 Fall DeHon 42

ITRS nm Penn ESE370 Fall DeHon 43 High Performance Low Power I sd,leak 100nA/  m50pA/  m I sd,sat 1200  A/  m560  A/  m C g,total 1fF/  m0.91fF/  m V th 285mV585mV C 0 =  m × C g,total

High Power Process V=1V d=1000  =0.5 W access =W buf =2 Full swing for simplicity C sc = 0 –(just for simplicity, typically <C load ) BL: C load =1000C 0 ≈ 45 fF = 45× F W N = 2  I leak = 9×10 -9 A P= (45× ) freq ×9×10 -9 W Penn ESE370 Fall DeHon 44

Relative Power P= (45× ) freq ×9×10 -9 W P= (4.5× ) freq + 9×10 -6 W Crossover freq<200MHz How partial swing on bit line change?  Reduce dynamic energy  Increase percentage in leakage energy  Reduce crossover frequency Penn ESE370 Fall DeHon 45

Consequence Leakage energy can dominate in large memories Care about low operating (or stand-by) power Use process or transistors with high V th –Reduce leakage at expense of speed Penn ESE370 Fall DeHon 46

Admin Project –Should Have memory cell –Add drivers and amps Penn ESE370 Fall DeHon 47

Idea Minimize area of repeated cell Compensate with periphery –Amplification (restoration) Match periphery pitch to cell row/column –Decode –Sensing –Writer Drivers Penn ESE370 Fall DeHon 48