RENO PMT TEST  PMT type DAQ setup Single Photon Electron Resolution Dark Current After Pulse Ratio with two methods  Summary Kyung Ju Ma, 2007. Oct.

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Presentation transcript:

RENO PMT TEST  PMT type DAQ setup Single Photon Electron Resolution Dark Current After Pulse Ratio with two methods  Summary Kyung Ju Ma, Oct. 6 RENO Collaboration meeting

강 운구, 김 영덕, 마 경주, 공 대정 1, 김 동희 1, 김 우영 1, 김 지은 1, 서 준석 1, 사무엘 스테파냔 1, 아딜 칸 1, 안드레이 김 1, 박 인곤 2, 박 명렬 3, 안 정근 4, 이 효상 4, 김 수봉 5, 김 장호 5, 김 현수 5, 박 강순 5, 박 정식 5, 신 경하 5, 이 재승 5, 전 은주 5, 최 선호 5, 권 은향 6, 김 동현 6, 박 차원 6, 서 현관 6, 유 인태 6, 최 수용 6, 최 영일 6, 김 성현 7, 김 재률 7, 임 인택 7, 장 지승 7, 정 인석 7, 주 경광 7, 오 영도 8, YU. Krylov 9, G. Novokova 9, E. Yanovich 9, N. Danilov 10 세종대학교. 1 경북대학교. 2 경상대학교. 3 동신대학교. 4 부산대학교. 5 서울대학교. 6 성균관대학교. 7 전남대학교. 8 포항가속기연구소. 9 INR. 10 IPCE RENO Collaborators

8 ” and 10 ” PMTs Hamamatsu R5912 Photonis XP1806 Hamamatsu R7081 Signal from XP1806

Hp pulse/function generator 8116A R5912, XP1806 -data taking 100Mhz, FADC Module(shaped)PMT set with ice water & Dark Box DAQ SETUP

Single Photon Electron Resolution R [mV] 61.5 [mV] ※ qtot ∝ Charge of SPE  Clear single photon electron peak Peak-to-ValleygainSPE charge [pC] R 5912~ 4~10 7 (1300V)24.0 Xp1806~ 4~10 7 (1550V)12.3

Temp..[ o C]MeanError[±] x × × Gain dependence of temperature

Dark Current Temperature Dependence(R5912)  RENO expected Dark Current at 10 ~ 15 o C is ~ 6 K/s  6~10 K/s are measured for the expected region which are more higher than expected.  For the steep increase at 14 ~ 15 o C, the spent time after closed dark Box having been considered.

Dark Current Temperature Dependence(R7081)  linear dependence  show 8 K/s for the region of 10 ~15 o C  more higher than R5912 and XP1806

Dark Current Temperature Dependence(XP1806)  linear dependence  show 2 ~ 3 K/s for the region of around 10 o C

After Pulse Ratio using accumulated Method(R5912)  First After Pulse Ratio = 1.88 %  Second After Pulse Ratio= 3.65 %

After Pulse Ratio using accumulated Method(XP1806)  First After Pulse Ratio =3.26 %  Second After Pulse Ratio=2.47 %

After Pulse Ratio using accumulated Method(R7081)  First After Pulse Ratio =2.57 %  Second After Pulse Ratio=2.91 %

Pulse Ratio using clustering Method(R5912)  After Pulse Ratio = 2.6 ~3.9 %  After Pulse peaks are occurred after 0.7, 1.7 and 6.7 micro second.(Primary signal region (1300,1360) ⅹ 10ns Probability (No. of SPE /0.1.micro. sec.) 0.7 micro. Sec. 1.7 micro. Sec. 6.7 micro. Sec.

Pulse Ratio using clustering Method(xp1806) ⅹ 10ns Probability (No. of SPE /0.1.micro. sec.)  After Pulse peaks are occurred after 1.2 and 6.7 micro second. (Primary signal region (1310,1350) 1.2 micro. Sec.6.7 micro. Sec.

Pulse Ratio using clustering Method(R7081) ⅹ 10ns Probability (No. of SPE /0.1.micro. sec.)  After Pulse Ratio = 2.1 ~2.6 %  After Pulse peaks are occurred after 0.7 and 6.7 micro second. (Primary signal region (1010,1050) 0.7 micro. Sec.6.7 micro. Sec.

After Pulse Ratio using the clustering Method  Both PMT show 2 ~ 3 % which is correspond to the PMT specification  After Pulse don’t show temperature dependence. it has been known and convinced

SUMMARY  Tested PMT: Hamamatsu PMT(8 inch-R5912, 10inch-R7081), Photonis PMT(8 inch XP1806)  DAQ setup: 100Hz FADC, PMT set with ICE water, 10ns width Pulse generator  R5912, r7081 show the clear single photon electron resolution.  Gain and Dark Current show the temperature dependence.  Dark Currents are 6~10 K/s(R5912), 8K/s(R7081), 2~3K/s(XP1806) for the temp. range(10~15 o C)  After Pulse Ratio(APR) was tested using two method (Accumulating, Clustering ). - APR by Clustering Method for R5912, XP1806 and R7081 show 2 ~ 3 % which is correspond to the PMT specification - APR by Accumulated metod for R5912, XP1806 and R7081 show 5 ~5.7 % which is correspond to the PMT specification  R5912, XP1806 and R7081 have typical After Pulse shape as show fixed After Pulse time region after Primary Signal.  After Pulse don’t show temperature dependence.

NEXT STEP  XP1806 base noise problem fix and single photo electron resolution study.  Dark Current dependence on Spending time (after Dark Box closing, after HV turn on) and temperature.  study about the different result for After Pulse Ratio by Accumulated method and Clustering method.