Nanonics Renishaw NSOM/Raman Combination 12.01.2003 Nanonics NSOM/SPM Systems Are The Only Scanned Probe Microscopes : Capable Of Being Integrated With.

Slides:



Advertisements
Similar presentations
Scanning near-field optical microscopy (SNOM) for magneto-optics Paolo Vavassori INFM - National Research Center on nanoStructures and Biosystems at Surfaces.
Advertisements

School of Biomedical Engineering, Science & Health Systems V 1.0 SD [020327] Kambiz Pourrezaei, Ph.D. Drexel University.
Nanonics SPM Probes Nanonics probes Product Presentation.
Detection of Percolating Paths in PMMA/CB Segregated Network Composites Using EFM and C-AFM Jacob Waddell, Runqing Ou, Sidhartha Gupta, Charles A. Parker,
Atomic Force Microscopy Andrew Rouff and Kyle Chau.
SCANNING PROBE MICROSCOPY By AJHARANI HANSDAH SR NO
DMR :Electronic Correlations in Carbon Nanotube Apparao M. Rao José Menéndez Damping of vibrations in carbon nanotubes Tunneling and optical experiments.
AFM-Raman and Tip Enhanced Raman studies of modern nanostructures Pavel Dorozhkin, Alexey Shchekin, Victor Bykov NT-MDT Co., Build. 167, Zelenograd Moscow,
Reasoned innovations. Products: ► Centaur ► Centaur HR ► Snotra ► Certus Optic ► Certus Standard ► Certus Light ► Ratis Where to use: ► Biology ► Chemistry.
1 The Use of the Atomic Force Microscope to Study Biological Membranes Brandy Perkins Materials Science Engineering REU Program Summer 2001 Purdue University.
Surface Characterization by Spectroscopy and Microscopy
Nonlinear Near-Field Tomography George Y. Panasyuk University of Pennsylvania Philadelphia, PA.
Muhammad Khurram Farooqi (CIIT/FA11/MSPHY/006/LHR) Department of Physics CIIT Lahore 1 Scanning Probe Microscopy Submitted by Report ( Submitted to) Dr.
UNIT IV LECTURE 61 LECTURE 6 Scanning Probe Microscopy (AFM)
STM / AFM Images Explanations from
Atomic Force Microscop (AFM) 3 History and Definitions in Scanning Probe Microscopy (SPM) History Scanning Tunneling Microscope (STM) Developed.
Copyright © 2005 SRI International Scanning Probe Microscopy “Seeing” at the nanoscale.
Surface Characterization Techniques Topics: –Contact Angle Analysis –Light Microscopy –X-ray Photoelectron Spectroscopy (XPS) –Fourier-Transform Infrared.
Scanning Probe Microscopy (SPM) Real-Space Surface Microscopic Methods.
Scanning Probe Lithography (SPL)
BMFB 3263 Materials Characterization Scanning Probe Microscopy & Relates Techniques Lecture 5 1.
Auger electron spectroscopy is a surface sensitive analytical technique used mainly to determine elemental compositions of material and, in certain cases.
Three-dimensional Silicon composite nanostructures, taken with a scanning electron microscope.
Electron Microscopy 1 Electron Microscopy (EM) Applying Atomic Structure Knowledge to Chemical Analysis.
TAPPINGMODE™ IMAGING APPLICATIONS AND TECHNOLOGY
Electron Microscopes Used to count individual atoms What can electron microscopes tell us? Morphology – Size and shape Topography – Surface features (roughness,
Nanonics MultiView 2000™ Product Presentation. MultiView 2000 ™ Complete System MultiView 2000™ Product Presentation.
Nanonics General SPM The Nanonics SPM Advantage Standard Atomic Force Imaging at the Highest of Resolutions and Quality Coupled with the Unique.
FEMTOSECOND LASER FABRICATION OF MICRO/NANO-STRUCTURES FOR CHEMICAL SENSING AND DETECTION Student: Yukun Han MAE Department Faculty Advisors: Dr. Hai-Lung.
Defect Review in the Photonics Revolution Aaron Lewis Nanonics Imaging Ltd. The Manhat Technology Park Malcha, Jerusalem ISRAEL Tel:
Nanonics CryoView 2000™ CryoView 2000™ Product Presentation.
Reminders for this week Homework #4 Due Wednesday (5/20) Lithography Lab Due Thursday (5/21) Quiz #3 on Thursday (5/21) – In Classroom –Covers Lithography,
Today –Homework #4 Due –Scanning Probe Microscopy, Optical Spectroscopy –11 am NanoLab Tour Tomorrow –Fill out project outline –Quiz #3 in regular classroom.
5 kV  = 0.5 nm Atomic resolution TEM image EBPG (Electron beam pattern generator) 100 kV  = 0.12 nm.
Figure 3.1. Schematic showing all major components of an SPM. In this example, feedback is used to move the sensor vertically to maintain a constant signal.
Ferroelectric Nanolithography Extended to Flexible Substrates Dawn A. Bonnell, University of Pennsylvania, DMR Recent advances in materials synthesis.
Characterization of Nanomaterials…
I. Trace evidence=  Physical evidence found at a crime scene in small but measurable amounts  Examples: hair, glass, fibers, paint, pollen, gunshot.
FNI 2A Tools1 Tools of Nanoscience Microscopy  Optical  Electron SEM TEM  Scanning Probe STM AFM NSOM Spectroscopy  Electromagnetic  Mass  Electron.
Tools of a Biologist MICROSCOPY Two factors play an important role in microscopy: 1. Magnification compares real size of a specimen with the one viewed.
MultiView 1000™ Product Presentation Nanonics MultiView 1000™
EEM. Nanotechnology and Nanoelectronics
United facilities … … on your bench top! SPM High resolution optical microscopy Tomography Raman & Luminescence spectroscopy High- throughput screening.
The Microscope An optical instrument used for viewing very small objects invisible to the naked eye, typically magnified several hundred times.
라만 의 원리와 그의 응용 (Normal,SERS,TERS)
Tools of the Biologist Simple Microscope- Magnifying glass Light Microscope- Using light to produce an enlarged view of the object Magnification- The ratio.
Types of Electron Microscopes Electron microscopes use a beam of electrons rather than visible light to illuminate the sample. They focus the electron.
Outline Sample preparation Instrument setting Data acquisition Imaging software Spring 2009AFM Lab.
Date of download: 6/28/2016 Copyright © 2016 SPIE. All rights reserved. Optogenetic tools and light tissue penetration: (a) schematic representation of.
METHODOLOGY Nanotechnology Prof. Dr. Abdul Majid Department of Physics
The Next Evolution In AFM Nanonics produces AFM/SPM systems with unique design for overcoming limitations of standard SPM system. Nanonics offers unique.
Topic 1 Microscopes and Microscopy. Light Microscopes  How do they work?  Optical magnification  Images pass through a lens or a series of lenses 
Scanning Probe Microscopy: Atomic Force Microscope
Laboratory equipment Lecture (3).
MultiView 400™ Product Presentation Nanonics MultiView 400™
Hybrid plasmonic multichannel spectroscopic sensor platform
MODULE B-3: SCANNING TUNNELING MICROSCOPY
Scanning Probe Microscope
Various Instruments for the Study of Microstructure
Surface-Sensitive Raman Spectroscopy of Collagen I Fibrils
INSPECTION TECHNIQUES
Microscopes.
Nanocharacterization (III)
Nanocharacterization (II)
Types of Microscopy Type Probe Technique Best Resolution Penetration
Scanning Probe Microscopy
Atomic Force Microscope
Atomic Force Microscopy
Mechanical properties of SiC fibers grown by laser-induced CVD
Thomas A. Cellucci, Ph.D., MBA President
Presentation transcript:

Nanonics Renishaw NSOM/Raman Combination Nanonics NSOM/SPM Systems Are The Only Scanned Probe Microscopes : Capable Of Being Integrated With Renishaw Standard microRaman Systems which, like all microRaman systems, are generally based on upright microscopes which are preferred for their high light throughput Capable Of Being Used to Obtain: Patented Shadow NSOM Raman TM & Scattering NSOM Raman TM Combined with Photon Tunneling Capable Of Being Configured to Be Used Also With: Infrared Microscopes & SEMs, TEMs & FIBs WHY?

Nanonics Renishaw NSOM/Raman Combination Probe Lens Standard SPM Technology is not microRaman, Optical or Electron/Ion Beam Friendly From The Top or Bottom or Both Sample Cylindrical Piezo

Nanonics Renishaw NSOM/Raman Combination >20 mm clear optical axis 7 mm thin scanner mms of rough scanning and >70 micron of fine scanning in X, Y and Z directions All Nanonics SPM Technology is microRaman & Optically & Electron/Ion Beam Friendly The Award Winning NSOM/SPM-100 Confocal TM World of Integrated Imaging Fiber AFM Probes 3D Flat Scanner TM 1996 Photonics Circle of Excellence Award

Nanonics Renishaw NSOM/Raman Combination Tip & Sample Scanning 3D Flat Scanners 3D Flat Scanning Technology Permits SPM Possibilities Not Previously Achievable All Nanonics’ Systems have the Hallmark of a Free Optical or Electron/Ion Optical Axis They also permit new avenues of flexibility both in terms of SPM instrumentation and probes

Nanonics Renishaw NSOM/Raman Combination Standard Silicon Cantilevers Cantilevered Protruding Tip Optical Fiber Probes Nanonics’ Provides the Only Systems Completely Compatible with Any Available SPM Sensor Deep Trench Probe Cantilevered Nanopipettes for Gas & Liquid Chemical Delivery 0 V Cantilevered Multichannel & Multiwire Glass Probes 70 V Cantilevered Nanoparticle Probes

Nanonics Renishaw NSOM/Raman Combination Nanonics Systems are the Only SPMs that Allow for Transparent Integration of The Previously Separate Worlds of Raman and SPM 2002 Photonics Circle of Excellence Award

Nanonics Renishaw NSOM/Raman Combination Renishaw & Nanonics Provides For Full Integration of Instrumentation, Software & Photonic Signals What new possibilities does this combination permit?

Nanonics Renishaw NSOM/Raman Combination Shadow NSOM Raman TM Can Only Be Performed by the Complete Renishaw/Nanonics Integration Raman Spectroscopy with CCD detection is ideal for difference spectroscopy Nanonics has produced AFM sensors with an opaque nanoparticle exposed to the optical axis Shadow NSOM Uses the Best Attributes of the Renishaw miroRaman with the Nanometric Positioning Ability of an On line AFM Lens

Nanonics Renishaw NSOM/Raman Combination Scattering NSOM Raman TM Can Only Be Performed by the Complete Renishaw/Nanonics Integration Only the complete integration that Renishaw and Nanonics Provides allows for Evanescent Field NSOM Raman TM No fiber connection or software connection allows for such measurements Lens

Nanonics Renishaw NSOM/Raman Combination In addition to these New Modalities of NSOM/Raman Only a Fully Integrated Raman/AFM Allows Integrating AFM & Raman Imaging Correlate, As in the AFM Image & Spectra Above, Silicon Strain with Topographical Position in a NanoIndentation Correlate Carbon Nanotube AFM Topography and Electrical Properties with Raman Signature Bands Correlate Protein Pulling with Amide I and Other Vibrational Modes Correlate Polymer Elasticity and Other Mechanical Properties with Vibrational Frequency

Nanonics Renishaw NSOM/Raman Combination Viewing the AFM sensor on- line in a SEM All Nanonics Platforms Allow The Integration of the Worlds of Electron and Ion Optics with SPM Another First for Nanonics Nanonics Sample Scanning Obstruction Free SPM Platform