BLM AUDIT 2010Ewald Effinger BE-BI-BL BLM tunnel installation and data acquisition card (BLECF) Ewald Effinger AB-BI-BL

BLM AUDIT 2010Ewald Effinger BE-BI-BL Outline Introduction: the BLM System Tunnel hardware installation The data acquisition card (BLECF) Irradiation and additional tests Test of the monitors and cables Test of the acquisitions card Commissioning of the complete BLM system Tests during operation System changes due to internal Audit 2008

BLM AUDIT 2010Ewald Effinger BE-BI-BL Introduction: the BLM System 3893 Ionization chambers (IC) 289 Secondary emission monitors (SEM) 3 Little Ionization chambers (LIC) (for test measurements) 669 HV distribution boxes (BJBHT) 309 Signal patch boxes (BJBAP) Signal cables for 3m up to 800m length

BLM AUDIT 2010Ewald Effinger BE-BI-BL Introduction: the BLM System 669 BLM data acquisition cards (BLECF) –In the arc the cards are installed underneath the magnets in a 19’’ create –In the straight section the cards are installed in the nearby side-tunnels, because of reduced radiation level

BLM AUDIT 2010Ewald Effinger BE-BI-BL Introduction: the BLM System Optical links are connected to 342 threshold comparators (TC) with an optical receiver card on the surface 25 VME creates are distributed around the LHC Each create includes a PowerPC (data logging), a Combiner card (connected to the beam interlock system), and two timing cards (CISV, CTRP, BOBR) USB connected system for test and development Courtesy of C. Zamantzas

BLM AUDIT 2010Ewald Effinger BE-BI-BL Tunnel hardware installation Grounding scheme Shielded signal and high voltage cables Floating ground to avoid ground loops

BLM AUDIT 2010Ewald Effinger BE-BI-BL Tunnel hardware installation Schemes of the arc installation –6 Ionization chambers –Filter capacitors and resistors are installed in the IC –Signal cable length 3 to 11m

BLM AUDIT 2010Ewald Effinger BE-BI-BL Tunnel hardware installation Schemes of the straight section installation –Ionization chambers –Filter capacitors and resistors are installed in the IC –Signal cable length up to 800m

BLM AUDIT 2010Ewald Effinger BE-BI-BL Tunnel hardware installation Schemes of the collimation installation –Ionization chambers and secondary emission monitors –Additional 150kΩ resistor installed –Filter capacitors are installed in the BJBHT –Signal cable length up to 600m

BLM AUDIT 2010Ewald Effinger BE-BI-BL Tunnel hardware installation Schemes of the dump installation –Ionization chambers and secondary emission monitors –Additional 150kΩ resistor is used in the IC –Filter capacitors are installed in the BJBHT –Filter installed before the BJBAP

BLM AUDIT 2010Ewald Effinger BE-BI-BL Specification of the acquisitions card Radiation tolerant up to 500Gy (20 LHC lifetime) Reliability level SIL3 ( 10E-6 to 10E-7 failure/h) to damage of equipment Current measuring range 2.5pA to 1mA Accuracy 25% in the range from 1mA to 1nA Accuracy 100% in the range from 1nA to 10pA Integration time window 40us Input current protection ~ Input voltage protection ~ Redundant optical data transfer to surface Test features for system check Survey of the card voltage supplies Survey of detector high voltage supply

BLM AUDIT 2010Ewald Effinger BE-BI-BL The acquisitions card Essentials of the input circuit Current to frequency converter (CFC) Balanced charge integrator No charge loss (“no blind time”) Very large dynamic range Output frequency depends on input current Input CurrentOutput frequency 1mA5MHz 1uA5kHz 1nA5Hz 1pA5mHz

BLM AUDIT 2010Ewald Effinger BE-BI-BL The acquisitions card Measures to fulfill the specification Irradiation of single components (JFET, OP, Comparator, One shot, …) Insertion of fast protection diodes, high voltage capacitors, and leaded resistors on the input ADC added to decrease response time / increase dynamic range Automatic feedback loop with DAC to compensate leakage current due to integrated dose U nom. = 1500V Tested with puls Tested with puls 12 bit ADC AD bit DAC A5346 No change -30 to -80pA140pA No change At 500Gy

BLM AUDIT 2010Ewald Effinger BE-BI-BL The acquisitions card 8 current inputs (CFC) ADC AD41240 CERN ASIC LM4140 voltage reference FPGA for data combiner Two redundant GOH from CMS (including CERN ASIC) Line driver CRT910 CERN ASIC DAC AD5346

BLM AUDIT 2010Ewald Effinger BE-BI-BL The acquisitions card Actel antifuse FPGA A54SX72A 4024 sequential cells 2012 combinational cells Total logic usage: 85% Pin usage: 100% 40 MHz clock

BLM AUDIT 2010Ewald Effinger BE-BI-BL The acquisitions card GOH 1 GOH 2 CFC Tripled Input pins Tripled redundant logic 2 x 2 out of 3 voter connected to two GOHs

BLM AUDIT 2010Ewald Effinger BE-BI-BL Irradiation and additional tests Energy : [MeV] Run time : 4488 [sec] Fluence : 9.712e+11 [p/cm2] Dose : 4.914e+04 [rad] Flux : 2.164e+08 [p/cm2/sec] Doserate : 1.095e+01 [rad/sec FPGA irradiation up to 491Gy, no corrupt data package received (CRC Error =0)

BLM AUDIT 2010Ewald Effinger BE-BI-BL Irradiation and additional tests Single component irradiation tests 54SX72A (FPGA), malfunction at 480 to 790Gy, no SEP detected up to 1x 10¹² p/cm² 74HCT123 (one shot), malfunction at 300 to 350Gy components recovered when not irradiated All other components were working up to 1500Gy

BLM AUDIT 2010Ewald Effinger BE-BI-BL Irradiation and additional tests Installed test system at HERA, no CRC error occurred for several months Temperature test: 0 – 70C passed Magnetic field test: 1000Gauss passed, performed for CMS

BLM AUDIT 2010Ewald Effinger BE-BI-BL Test of the monitors and cables All ionization chambers checked with a radioactive source in the Gamma Irradiation Facility (GIF) All secondary emission monitors are checked with a radioactive source in the GIF and with beam in H4 All the cabling is tested for conductivity with a current source All the cabling are tested for leakage current with a pico ampere meter

BLM AUDIT 2010Ewald Effinger BE-BI-BL Test of the acquisitions card All inputs of the acquisition card are calibrated in two steps –Maximum current 1mA with Keithley current source –Minimum current 10pA with open inputs Automatic final check test of the acquisition card with the BLECFT system –Verification of the calibration and input linearity (10 steps) –Complete functionality of the FPGA including status bits, HV comparator levels and CRC check

BLM AUDIT 2010Ewald Effinger BE-BI-BL Commissioning of the complete BLM system Tunnel check test of the acquisitions card –Each acquisition card is checked after the installation in the tunnel with the BLECFT system Verification of the signal path of the complete system –Introducing of signal current using a 137 CS source on each ionization chamber –Verification of the signal in Control room display and database, with a crosscheck of the layout database

BLM AUDIT 2010Ewald Effinger BE-BI-BL Tests during operation Constant 10pA offset current - Check on channel availability - In case of exceeding limits (no count for more than 100s), a beam dump can be generated Continuous status monitoring - Monitoring of voltage supplies and other status information (CFC- Error, Integrator Level, Temperature, High voltage level) - Should failure occur, a beam dump can be generated

BLM AUDIT 2010Ewald Effinger BE-BI-BL Tests during operation Continuous check during data transmission - Checked at each transmission * Card identity number check * Frame identity number check * Cycle redundancy check - Should failure occur, a beam dump can be generated

BLM AUDIT 2010Ewald Effinger BE-BI-BL Tests during operation High Voltage (HV) activation test and HV modulation test 100pA added, dynamic test Capacitive current injection via chamber electrodes Degradation of complete chain can be detected In case limits are exceeded, no beam permission given To be carried out before each beam fill

BLM AUDIT 2010Ewald Effinger BE-BI-BL System changes due to internal Audit 2008 Spare production of tunnel equipment Production of 100 BLECF launched Purchase of LSS power supplies Spare production of tunnel chassis Additional irradiation test of the BLECF and power supplies Irradiation in neutron beam o E12 Neutrons/cm2 o Card was still working and no SEU observed Irradiation in mixed filed beam in the CNGS test facility o Total dose of 270Gy o MeV eq. neutrons [1e11*cm-2] o Hadrons>20MeV [1e11*cm-2] o Card was still working and no SEU observed

Implementation of a general power reset of the BLECF Mezzanine PCB added in all BLECF electronic and tested General reset possibility (per point) with to High voltage distribution (operational) Separate reset possibility (per BLECF) via WorldFip distribution (partly operational in point 6) BLM AUDIT 2010Ewald Effinger BE-BI-BL System changes due to internal Audit 2008

BLM AUDIT 2010Ewald Effinger BE-BI-BL Measurement results CFC input circuit Dynamic range over 8 decades from 1mA to 10pA Specified error 100% Down to 1nA max error of 6.5% Down to 10pA max error of 96%