4 Dec 2008G. Rakness (UCLA)1 Online Software Updates and RPC data in the RAT …including Pad Bit Mapping and Efficiency… Greg Rakness University of California,

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Presentation transcript:

4 Dec 2008G. Rakness (UCLA)1 Online Software Updates and RPC data in the RAT …including Pad Bit Mapping and Efficiency… Greg Rakness University of California, Los Angeles UCLA group meeting 4 December 2008

4 Dec 2008G. Rakness (UCLA)2 Online Software Updates for TMB firmware 18 Nov 2008 –Counters TMB class: updated EmuPeripheralCrateMonitor application (used to start/stop TMB counters and DCS monitoring jobs [XMAS] and to display the counters during data taking [and otherwise]) –Currently hardcoded for TMB counters beyond what is in TMB class –To be improved to make maintenance easier and less error-prone. In the meantime, Jinghua will update this… –Xml parameters added and removed, and TStore functions modified Add tmb_firmware_compile_type (default = a)  this specifies the type of firmware –Possible values = a, b, c, d Add alct_readout_without_trig (default = 0) Add clct_readout_without_trig (default = 0) Add match_readout_without_trig (default = 1) Add mpc_block_me1a (default = 1) Remove clct_stagger  this is implicit in tmb_firmware_compile_type Configuration database –N.B.: Will not be possible to remove parameters once we begin to use the configuration database is used –Will begin to use when we turn on next year –At first, only use it for bookkeeping (i.e., we won’t configure from database) –After tools are written to modify the configuration database, and we are used to using it, we can think about configuring from database…

4 Dec 2008G. Rakness (UCLA)3 Online Software (cont.) Configuration database –Talked to Jinghua Liu… –Note: It will not be possible to remove parameters once we begin to use the configuration database… –Plan to begin to use when we turn on next year –At first, only use it for bookkeeping This means we won’t configure the hardware directly from database, but only store the configuration that has been loaded… –I think we can think about making the step of configuring from database after… Tools are written to modify the configuration database We are used to using it (i.e., have verified again and again that reading from the database is reliable)

4 Dec 2008G. Rakness (UCLA)4 RPC data into RAT

4 Dec 2008G. Rakness (UCLA)5 Recall: RPC-TMB phase scan results for all ME+1 chambers… 49 chambers of Type “A” and “B” would work OK with delay = 11 Broken up by “Type”

4 Dec 2008G. Rakness (UCLA)6 Type “C” are pesky 19 chambers of type “C” come in clumps Have asked the RPC colleagues for input… Have set delay value = 11 for CRAFT data… Remove these chambers from the analysis…

4 Dec 2008G. Rakness (UCLA)7 Some numerology Run 67539: All detectors in the readout Number of triggers accumulated = 13.7M DT, RPC, HCAL (HPD noise), Random = 600Hz CSC trigger rate = 60Hz Number of events analyzed today = 3.25M  ~325k CSC triggers Number of events with single ME+1/3 chamber fired with 1 valid ALCT and 1 valid CLCT (clean events) = 37k

4 Dec 2008G. Rakness (UCLA)8 General CSC distributions

4 Dec 2008G. Rakness (UCLA)9 Occupancy of Cosmic Rays in ME+1/3 chambers Chamber illumination (  = excluded from analysis,  = CSC HV problem?) peaked at  /2 CLCT key ½-strip (  ) flat ALCT key-wiregroup (  ) Higher occupancy at big end CSC HV gaps clearly seen

4 Dec 2008G. Rakness (UCLA)10 ALCT key wiregroup vs. CLCT key ½-strip CLCT key ½-strip (  ) ALCT key wiregroup (  )

4 Dec 2008G. Rakness (UCLA)11 CLCT Pattern ID for Cosmic Rays No pattern = 0 or pattern = 1, as expected Lower pattern ID’s for Side chambers, as expected I was expecting flatter distribution for Top and Bottom chambers… ? Dip at pattern ID = 6 and 7?

4 Dec 2008G. Rakness (UCLA)12 General RPC data into RAT distributions

4 Dec 2008G. Rakness (UCLA)13 Number of RPC pad bits per event  Already can see lots of 0’s…

4 Dec 2008G. Rakness (UCLA)14 Time Bin of RPC Pad Bit in TMB Readout Window RPC data late w.r.t. CLCT pretrigger Width in RPC arrival time has contributions from… CLCT pretrigger jitter Chamber-to-chamber timing differences  to be investigated CLCT pretrigger Time bin (bx) (rpc_fifo_pretrig = 2)

4 Dec 2008G. Rakness (UCLA)15 (BXN + parity bit) Recall: RPC firmware defines parity bit so that total number of bits = odd number Software cut = one RPC bit  should only be an EVEN number of bits in the (BXN+parity bit) word (BXN+parity bit) has only even numbers of bits, as expected…  Phase scan worked…

4 Dec 2008G. Rakness (UCLA)16 RPC Pad Bit Mapping Determined from CSC data Require: Number of RPC pad bits =1 CLCT Pattern ID > 7 CLCT Quality = 6 ALCT Quality = 3

4 Dec 2008G. Rakness (UCLA)17 ALCT key wiregroup vs. CLCT key ½-strip: RPC pad bit = 0 CLCT key ½-strip (  ) ALCT key wiregroup (  )

4 Dec 2008G. Rakness (UCLA)18 ALCT key wiregroup vs. CLCT key ½-strip: RPC pad bit = 1 CLCT key ½-strip (  ) ALCT key wiregroup (  )

4 Dec 2008G. Rakness (UCLA)19 ALCT key wiregroup vs. CLCT key ½-strip: RPC pad bit = 2 CLCT key ½-strip (  ) ALCT key wiregroup (  )

4 Dec 2008G. Rakness (UCLA)20 ALCT key wiregroup vs. CLCT key ½-strip: RPC pad bit = 3 CLCT key ½-strip (  ) ALCT key wiregroup (  )

4 Dec 2008G. Rakness (UCLA)21 ALCT key wiregroup vs. CLCT key ½-strip: RPC pad bit = 4 CLCT key ½-strip (  ) ALCT key wiregroup (  )

4 Dec 2008G. Rakness (UCLA)22 ALCT key wiregroup vs. CLCT key ½-strip: RPC pad bit = 5 CLCT key ½-strip (  ) ALCT key wiregroup (  )

4 Dec 2008G. Rakness (UCLA)23 ALCT key wiregroup vs. CLCT key ½-strip: RPC pad bit = 6 CLCT key ½-strip (  ) ALCT key wiregroup (  )

4 Dec 2008G. Rakness (UCLA)24 ALCT key wiregroup vs. CLCT key ½-strip: RPC pad bit = 7 CLCT key ½-strip (  ) ALCT key wiregroup (  )

4 Dec 2008G. Rakness (UCLA)25 ALCT key wiregroup vs. CLCT key ½-strip: RPC pad bit = 8 CLCT key ½-strip (  ) ALCT key wiregroup (  )

4 Dec 2008G. Rakness (UCLA)26 ALCT key wiregroup vs. CLCT key ½-strip: RPC pad bit = 9 CLCT key ½-strip (  ) ALCT key wiregroup (  )

4 Dec 2008G. Rakness (UCLA)27 ALCT key wiregroup vs. CLCT key ½-strip: RPC pad bit = 10 CLCT key ½-strip (  ) ALCT key wiregroup (  )

4 Dec 2008G. Rakness (UCLA)28 ALCT key wiregroup vs. CLCT key ½-strip: RPC pad bit = 11 CLCT key ½-strip (  ) ALCT key wiregroup (  )

4 Dec 2008G. Rakness (UCLA)29 ALCT key wiregroup vs. CLCT key ½-strip: heuristic RPC pad-bit mapping… CLCT key ½-strip (  ) ALCT key wiregroup (  ) Bits for inner areas cover twice the linear dimension as do bits for outer areas

4 Dec 2008G. Rakness (UCLA)30 RPC pad bit efficiency

4 Dec 2008G. Rakness (UCLA)31 Choose muons hitting chambers on either side of the RPC Cuts: 1 ME+1/3 chamber with 1 ALCT and 1 CLCT 1 ME+2/2 chamber with 1 ALCT and 1 CLCT chamber number = ME+1/3 chamber…

4 Dec 2008G. Rakness (UCLA)32 ALCT wiregroup occupancies for events with ME+1/3/N and ME+2/2/N Equal inter-station chamber number event selection… Suppresses events with ME+1/3 large WG-number Suppresses events with ME+2/2 small WG-number … as expected…

4 Dec 2008G. Rakness (UCLA)33 RPC Pad Bit Efficiency Numerator = non-zero pad-bit data in RAT Denominator = muon going through ME+1/3 and ME+2/2 ME+1/3 chamber number RPC pad bit efficiency

4 Dec 2008G. Rakness (UCLA)34 Next… RPC data into RAT –Efficiency: More studies follow, selecting on CLCT and ALCT qualities and pattern ID’s to choose denominator events more selectively…  No difference in end result… –Pad bit mapping: Tried to make a plot of mapping with TWO adjoining pad bits to try to show edges (lot cleaner presentation)… need yet more statistics –Should I present this to somebody somewhere? CMS week next week –“Peripheral Crate and FED crate Operations” talk on Sunday Finish writing this talk tomorrow –Trigger talk on Tuesday Write this talk Monday Update ALCT configuration format into user PROM Work on expansion of trigger pattern tests… –CLCT+ALCT  TMB  MPC  SP (N.B. TMB  MPC already exists…)

4 Dec 2008G. Rakness (UCLA)35 Other slides…

4 Dec 2008G. Rakness (UCLA)36 Wiregroup difference from station 1 to station 2 No ALCT quality cut “IP pointing” muons for top and bottom chambers Low quality (flat) muons…

4 Dec 2008G. Rakness (UCLA)37 Wiregroup difference from station 1 to station 2 If we require ALCT quality = 3 for both stations… “IP pointing” muons for top and bottom chambers

4 Dec 2008G. Rakness (UCLA)38 CLCT ½-strip difference from station 1 to station 2 On both chambers require: CLCT Pattern ID > 7 CLCT Quality = 6 No CLCT requirements… Picking high quality CLCT candidates with large patterns selects tracks which go straight through the chambers…

4 Dec 2008G. Rakness (UCLA)39 Denominator for pad bit efficiency

4 Dec 2008G. Rakness (UCLA)40 FYI: ME+1/3 CLCT and ALCT qualities Wasn’t sure what to expect here…

4 Dec 2008G. Rakness (UCLA)41 Recall: CSC chamber labels “Top” CSC = 10 “Bottom” CSC = 28 “Side” CSC’s = 1 and 19