State Scientific Center of Russian Federation Institute for Theoretical and Experimental Physics ( ITEP )

FAIR meeting on 19 March 2009 (Protvino) FAIR. Expression of interest from ITEP SIS 300 beam diagnostics

FAIR meeting on 19 March 2009 (Protvino) Diagnostic elements Comfort'In house'In collaboration' SIS 100BPM50% Closed orbit feedback 10% Wall current monitor50% Ionization profile monitor60% SEM grid50% SIS 300BPM50% Wall current monitor50% Ionization profile monitor60%>60% SEM grid50%>50% CRBPM50% Wall current monitor50% Ionization profile monitor 40% SEM grid50% RESRBPM50% Ionization profile monitor 40% HESRBPM50% >50%

FAIR meeting on 19 March 2009 (Protvino) Beam position monitor challenges  Wide range of currents  Tight requirements for position accuracy for intense beams – Δx < 0.1mm, x = ±100mm Beam position monitor features  A special attention to pick-up construction  Careful design of front-end electronics

FAIR meeting on 19 March 2009 (Protvino) BPM Applications distortion SIS100/300 Turn-by-turn variation of any bunch in the train Closed orbit feedback Bunch-by-bunch operation to get a distinguish between bunches reaction Lattice function

FAIR meeting on 19 March 2009 (Protvino) Example of a electrode arrangement for a linear-cut BPM and the scheme of the position determination.

FAIR meeting on 19 March 2009 (Protvino) BPM electronics

FAIR meeting on 19 March 2009 (Protvino) BPM basestation with analog front-end

FAIR meeting on 19 March 2009 (Protvino) BPM timetable (rough estimation)

FAIR meeting on 19 March 2009 (Protvino) Ionization profile monitor  Advanced concept with high resolution and fast profile measurements  IPM is a subject of GSI-ITEP collaboration

FAIR meeting on 19 March 2009 (Protvino) Ionization profile monitor. Fast profile readout.

FAIR meeting on 19 March 2009 (Protvino) Permanent magnet quadrupole at one of the ITEP synchrotron output channel Examples of ion beam optic elements constructed in ITEP on the base of permanent magnets PM Lens design and rods magnetization scheme for 352 MHz Prototype Alvarez DTL Tank for the CERN SPL

Secondary emission monitor FAIR meeting on 19 March 2009 (Protvino) Construction drawing (overview from the front side) of a typical profile grid. To reduce the number of required signal processing channels, a larger spacing outside the center has been chosen. Roughly estimated number of secondary electrons per incident ion with the energy of incident ion as a parameter. The data have been scaled ~z1.5 from various data found in the literature

FAIR meeting on 19 March 2009 (Protvino) SEM-grid timetable (rough estimation)

FAIR meeting on 19 March 2009 (Protvino) Wall Current Monitor Scheme of an inductive wall current monitor and the realization for CERN LINAC 2 The realization of a wall current monitor at a Ø 40 mm beam pipe for CTF

FAIR meeting on 19 March 2009 (Protvino) WCM electronics timetable (rough estimation)

FAIR meeting on 19 March 2009 (Protvino) Diagnostic elements Comfort'In house'In collaboration' SIS 100BPM50% Closed orbit feedback 10% Wall current monitor50% Ionization profile monitor 60% SEM grid50% SIS 300BPM50% Wall current monitor50% Ionization profile monitor60%>60% SEM grid50%>50% CRBPM50% Wall current monitor50% Ionization profile monitor60% SEM grid50% RESRBPM50% Ionization profile monitor60% HESRBPM50% >50%

FAIR meeting on 19 March 2009 (Protvino)