Implantation of heavy ions 86 Kr and 132 Xe in emulsion with energy 1.2 A MeV K.Z. MAMATKULOV LHEP, JINR, Dubna, Russia. DjPI, Uzbekistan. “Workshop on.

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Presentation transcript:

Implantation of heavy ions 86 Kr and 132 Xe in emulsion with energy 1.2 A MeV K.Z. MAMATKULOV LHEP, JINR, Dubna, Russia. DjPI, Uzbekistan. “Workshop on Nuclear Track Emulsion and its Future”, Predeal, Romania, October , 2013

Setting for irradiating the polymer film. Pull-out part of the vacuum chamber with the board for mounting samples. Board put up at an angle of 45 ° to the beam of ions Emulsion layers with size 9 × 12 cm 2 and with thickness ~ 100 (Xe) and ~ 180 (Kr) μm on a glass substrate with thickness ~ 2 mm, placed at an angle 45 0 to the beam axis. Tilting plate has provided observability tracks of ions in the emulsion. Placing detectors

View of emulsion layers after photochemical processing. Kr Xe

x10 х20 x60 х90 Examples of microphotograph of tracks (Kr) in emulsion.

Examples of microphotograph of tracks (Xe) in emulsion. x10 х20 x60 х90

Irradiation angle before (red) and after (blue) correction shrinkage ratio.

Definition energy of ions 86 Kr and 132 Xe by the measured track length. Dots - experimental data, squares - calculation by the model SRIM.

 Demonstrated the possibilities of the newly reproduced nuclear emulsion for research with heavy ions at extremely low energies ( 86 Kr and 132 Xe).  Defined angular spread of ions in the beam, which amounted 3.8 and 3.9 for Kr and Xe, respectively.  Measured ion range at the energy 1.2 A MeV in the emulsion amounted (L Kr = ± 0.15 μm, RMS = 0.9 μ m) and L Xe = ± 0.15 μ m, RMS = 0.99 μ m), which corresponds to the calculated value obtained by the model SRIM.  The results of this experiment are interest as a calibration for future research on the physics of nuclear fission, laser plasma, search for particles of dark matter, as well as applied purposes. Conclusion:

 The present work is result of collaboration with specialists of accelerator IC-100, LNR, JINR. THANK YOU ATTENTION!