Berkeley Lab IH Monitoring Issues at Accelerators Jim Floyd Advanced Light Source LBL

Berkeley Lab Chemical monitoring in user facilities Staff vs. Users Similar Exposure Groups (SEGs) for Users

Berkeley Lab Engineered Nanomaterials Notice N456.1 “Using best available hazard information, conduct exposure assessment for all nanotechnology activities involving UNP.” Sampling issues —Desire to use real-time particle counters Signal to noise problems Establishing technical bases

Berkeley Lab Example Collect Particle counts and filters from: both the source material and the work observation Analyze filters by microscopy and bulk analytical methods

Berkeley Lab Nano example

Berkeley Lab Nano example Nanostructures consistent with the source material accounted for ~0.3 particles/cc Nanoparticles/nanostructures not consistent with the source material accounted for ~40 particles/cc

Berkeley Lab Nano Sampling —Developing this technical basis at our nano science center —Hope to be able to apply it at elsewhere Standards —Carbon nanotube (CNTs)

Berkeley Lab Lasers Baseline eye exams —Standard practice —Acceptance of third-party exams (“portability”) —Exemptions if under escort

Berkeley Lab Other non-ionizing radiation Magnetic fields —5 gauss work areas RF UV

Berkeley Lab Noise Most work is well below below ACGIH thresholds —85 dBA (for 8 hours) But ubiquitous “nuisance noise” —Starting to use Preferred Speech Interference Level (PSIL) for guidance on prioritizing mitigations. —72 dB (at 500, 1000, 2000 Hz)

Berkeley Lab Oxygen Deficiency Standardized application for accelerator tunnels, etc. (FNAL, et al.) Application to lab environments is a little tricky

Berkeley Lab The Usual Suspects Peeling Lead Paint on DomeSoldering Station