SiD EMCal Testbeam Prototype M. Breidenbach for the SiD EMCal and Electronics Subsystems.

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Presentation transcript:

SiD EMCal Testbeam Prototype M. Breidenbach for the SiD EMCal and Electronics Subsystems

ECAL 2SiD Meeting August 2012 D 2. 5 m L m t 142 mm 20 layers 2.5 mm W (5/7 X0) 10 layers 5 mm W (10/7 X0) 30 gaps 1.25 mm w Si pixels sensors 29 X 0 ; 1 λ ΔE/E = 17%/  E; Effective Moliere radius = 13 mm Prototype Goals: Replicate full EMCal stack and test – 30 sensors.

Detail of Structure.

Boundary Conditions  We have 40 nominally good Hamamatsu sensors.  We have ~20 nominally bad “mechanical prototype” sensors.  We have 28 remaining KPiXa (1024 channels).  The KPiXa’s come from TSMC with eutectic Sn-Pb bumps in place in wells on the chip.  The Hamamatsu sensors (EMCal and Tracker) come with Al pads, so there is a layer of Al 2 O 3 which must be removed… 4 SiD Meeting August 2012

Under Bump Metallization (UBM)  UCD put a huge effort into UBM: » Used the mechanical prototype sensors » Zincate – chemistry to remove the Al 2 O 3 and plate a stack ending with Au. » Sputtering – to directly implant Ti and then a stack ending with Au.  With miserable results! » Possible explanation is that there is something else on the pads, but SEM sees only Al and O.  We finally went to IZM in Germany who use a sputtering process. » They have bonded two KPiXa’s to two mechanical prototype sensors. 5 SiD Meeting August 2012 X-ray image of bumps - IZM

Bonded Sensor » UCD has bonded a cable to one; it is being tested at SLAC. » UO is probe testing the other. First results ~now. 6 SiD Meeting August 2012 KPiX bump bonded to sensor Cable bump bonded to sensor Assembly 1 mm high

Results…  752 pixels seem ok.  114 pixels appear disconnected – no apparent increase in noise as expected from increased C.  158 pixels do not calibrate properly – leakage?  But this is a mechanical prototype!!!  UO has probed a few other prototype sensors, and sees ~3% opens.  We do not yet have the corresponding good/open/bad pixel numbers for the UO sensor. 7 SiD Meeting August 2012

8 Cross talk Study: Red: 4 pixels pulsed at 500 fC, All other channels shown. Blue: no pixels pulsed. First Performance Studies Cosmic telescope trigger

Performance Comments  The first version of the electronics reading out KPiX gave excellent “analog” performance – e.g. self triggered multiplicity was ~1, and there were no “everything lights up” events.  This indicates that KPiX and its sensor, cable, and enclosure environment is satisfactory.  The new electronics, suitable for 32 KPiX, is not quiet.  It is probably ok for the testbeam (short window), but the system needs work.

Silicon sensors: Meet specs. for SiD Ecal low leakage current; DC coupled sufficient number for prototype (30 layers) KPiX: prototypes meet SiD specs.: low noise (10% of MIP) large dynamic range: ~10 4 full digitization and multiplexed output passive cooling (power pulsing) Interconnects: Flex cable R&D ok so far – successful attachment to dummy sensors and 1 mechanical prototype. Main focus of recent R&D is the KPIX – sensor interconnects … recently successful – we think… Prototype module – circa LOI Prototype 10SiD Meeting August 2012

Prototype – Engineering Model 11 SiD Meeting August 2012

Layer Assembly 12 SiD Meeting August 2012

Adding hold-down tabs 13SiD Meeting August 2012

Layer 14 SiD Meeting August 2012

Assembly Tooling 15SiD Meeting August 2012

Study showing concentrator board 16SiD Meeting August 2012

With Cover 17SiD Meeting August 2012

18 Cable Transition Board » Clock & trigger LVDS termination » Power supply filtering » Bias filtering » Edge connector Right angle 0.1” pins 18 pins Cable Clk Term TrigTerm Bias Filter PowerFilter Edge Connector Signals -Power AVVD (2 pins) AGND (2 pins) DVDD (2 pins DGND (2 pins) -Bias Bias Pos (1 pins) Bias Neg (1 pins) -Signal Clock (2 pins) Trigger (2 pins) Reset (1 pin) Command (1 pin) Data (1 pin) Return (1 pin) SiD Meeting August 2012

19 Cable Concentrator Board » Bias input and distribution » KPIX power input and distribution Direct AVDD/DVDD feed or local linear regulator » Clock, trigger & reset distribution » Per sensor command & data connection » Concentrator FPGA » Optical control and data interface 3.125gbps PGP » Optical timing / trigger interface Embedded EVR firmware Optional TTL trigger input » Separate FPGA power connector Edge Connectors (30) Bias Conn Power Conn Optional Regulators Clock Dist. Trigger Dist. Reset Dist. Cmd / Data Buffers FPGA Control & Data Fiber Clock & Trig Fiber Optional Trig. Conn. Pwr Conn SiD Meeting August 2012

Production  All W plates are in hand.  Conceptual design drawings for mechanics complete; final drawings shortly.  40 good sensors have been sent to IZM.  28 KPiXa’s (all we have) are on their way to IZM.  IZM will produce 1 batch of 15 for evaluation.  We hope to do a production run on more KPiX 1024 channel chips.  Probe testing available at UO.  UCD will manufacture and attach cables.  Testing of cabled sensors at SLAC.  Assembly and testing of system (pre-testbeam) at SLAC. 20 SiD Meeting August 2012

Software  A new back end system that will handle 32 KPiX is being built, and data and calibration formats have been set.  Data will be accessible with JAS3, and single KPiX testing is underway.  UO has built a single event display. 21 SiD Meeting August 2012

ESTB Mission and Layout  ESTB will be a unique HEP resource » World’s only high-energy primary electron beam for large scale Linear Collider MDI and beam instrumentation studies » Exceptionally clean and well-defined primary and secondary electron beams for detector development » Will serve a broad User community 22 SiD Meeting August 2012 Pulsed magnets in beam switch yard to send LCLS beam to ESA Test EMCal

Test Expectations  Expect to take data with a precisely synchronous bunch – what KPiX was designed for.  Expect to take data at a range of energies and with mean e + multiplicity ~1.  Measure energy and spatial resolution.  Characterize KPiX in “synchronous” mode: noise, cross talk, channel uniformity, etc.  Most important – look for problems with the basic approach. 23 SiD Meeting August 2012