Punch-through protection in ATLAS SCT sensors A.Chilingarov, Lancaster University, UK Meeting on Investigations into the effect of beam splash on SCT Modules.

Slides:



Advertisements
Similar presentations
Silicon Technical Specifications Review General Properties Geometrical Specifications Technology Specifications –Mask –Test Structures –Mechanical –Electrical.
Advertisements

Quality Assurance of Silicon Strip Detectors and Monitoring of Manufacturing Process Thomas Bergauer Institute f. High Energy Physics HEPHY, Vienna SiLC.
January 22, Run IIB Silicon workshop Purdue University Bortoletto Daniela, Bolla Gino, Canepa Anadi Hamamatsu testing I-V characteristics up to 1000V.
Current-Voltage Characteristics of a bulb In this experiment you are going to investigate how the current through a bulb changes according to the.
A. Chilingarov, A. Weidberg, Bart Hommels PTP location studies – AUW 20/04/2010, DESY Punch-through location in ATLAS SCT sensors A.Chilingarov, Lancaster.
Vex 1.0 © 2005 Carnegie Mellon Robotics Academy Inc. In this lesson you will learn: How a potentiometer works as a variable resistor and a voltage divider.
Special Diodes. Describe and analyze the function and applications of:  Zener Diodes.
Influence of the humidity on the IV curves A.Chilingarov Lancaster University UK-Valencia Cluster Meeting RAL,
SEMICONDUCTORS Zener diodes.
Lecture 3: Bridge Circuits
Silicon pad detector for an electromagnetic calorimeter at future linear collider experiments: characterisation and test beam results Antonio Bulgheroni.
We are Group5 Weatherstation The team Members are : Saran Jackson Robert Howard Robert Garvey Gene Fitzgerald Steven Dowling.
The Ohmic Region The slope of the characteristic curve in the ohmic region is the dc drain-to- source conductance G DS of the JFET. Thus, the dc drain-to-source.
EMT111 CHAPTER 1 Introduction to Semiconductor By Pn
Institute of Physics ASCR, Prague Strip Sensors R&D for SCT and ITk Marcela Mikeštíková.
Twenty Questions Electricity 1. Twenty Questions
Electricity Current Voltage Resistance Current, Voltage, Resistance characteristics AC DC Plugs Earth Fuses Power.
Susanne Kersten, Wuppertal University November 21/22, 2013.
Silicon pad detectors for LCCAL: characterisation and first results Antonio Bulgheroni University of Milan – Italy on behalf of LCCAL: Official INFN R&D.
Temperature dependence of sensor leakage current Contents Introduction Measurement Result Summary Junkichi Asai (RIKEN BNL Research Center) (Hiroki kanoh.
Alumina Oxide Treatment Effect on Bias Resistance BZ1 W277 P19 Untreated (Grounds Tied) BZ1 W230 P7 Alumina Treated (Grounds Not Tied) Bias Voltage (V)
Medipix sensors included in MP wafers 2 To achieve good spatial resolution through efficient charge collection: Produced by Micron Semiconductor on n-in-p.
Chapter 5 Transistor Bias Circuits
Silicon Microstrip detector Single sided and double sided K.Kameswara rao, Tariq Aziz, Chendvankar, M.R.Patil Tata institute of fundamental research, Mumbai,
Full-size ATLAS Sensor Testing On behalf of the ATLAS R&D group Development of n-in-p Silicon Sensors for very high radiation environment Jan Bohm Institute.
Quality Test of L1 sensors HPK 10 sensors –Tested all, 6 sent to Fermilab – Test structures, HPK 133 L00 CDF ELMA 9 sensors –Tested 6 of 9.
Status of the Low-Resistance (LowR) Strip Sensors Project CNM (Barcelona), SCIPP (Santa Cruz), IFIC (Valencia) Contact person: Miguel Ullán.
Electrical characteristics of un-irradiated ATLAS07 mini strip sensors A.Chilingarov, Lancaster University ATLAS Tracker Upgrade UK Workshop Coseners House,
Evaluation of the Low Resistance Strip Sensors (Low-R) Fabricated at CNM CNM (Barcelona), SCIPP (Santa Cruz), IFIC (Valencia) Contact person: Miguel Ullán.
MALVINO Electronic PRINCIPLES SIXTH EDITION.
8 July 1999A. Peisert, N. Zamiatin1 Silicon Detectors Status Anna Peisert, Cern Nikolai Zamiatin, JINR Plan Design R&D results Specifications Status of.
Status of Hamamatsu Silicon Sensors K. Hara (Univ of Tsukuba) Delivery leakage current at 150V & 350V number of defect channels wafer thickness & full.
Andrea Di Simone Andrea Di Simone – INFN Roma2 Andrea Di Simone CERN PH/ATC and INFN-CNAF On behalf of ATLAS RPC groups: Lecce, Napoli, Protvino, Roma2.
Low Resistance Strip Sensors – RD50 Common Project – RD50/ CNM (Barcelona), SCIPP (Santa Cruz), IFIC (Valencia) Contact person: Miguel Ullán.
Lecture 3: Bridge Circuits
IFR Praha 2004, 16 th April 2004Václav Vrba, Institute of Physics, AS CR 1 Václav Vrba Institute of Physics, AS CR, Prague Silicon sensors status.
Paul Dolejschi Progress of Interstrip Measurements on DSSDs SVD.
SP & DC-DC Considering the benefits of combining serial powering and DC-DC conversion technologies in powering ATLAS SCT upgrade modules & staves Richard.
Voltage Regulator Circuits
Copyright © The McGraw-Hill Companies, Inc. Permission required for reproduction or display. MALVINO & BATES SEVENTH EDITION Electronic PRINCIPLES.
Vacuum Studies of LHCb Vertex Locator Sensors Gwenaëlle Lefeuvre, Ray Mountain, Marina Artuso Department of Physics, Syracuse University Abstract : The.
Punch through protection and p-stop ion concentration in HPK strip mini-sensors Jan Bohm, Institute of Physics ASCR, Prague Peter Kodys, Pavel Novotny,
Interstrip PT Updates John Wright. Introduction In DC PT tests it was previously assumed that PT occurred between the implant and the bias rail only,
Paul Dolejschi Characterisation of DSSD interstrip parameters BELLE II SVD-PXD Meeting.
Distortion of the CV characteristics by a high current A.Chilingarov, Lancaster University, UK Vidyo meeting
1 Updates on Punch-through Protection H. F.–W. Sadrozinski with C. Betancourt, A. Bielecki, Z. Butko, A. Deran, V. Fadeyev, S. Lindgren, C. Parker, N.
Prepared by: Garima Devpriya ( ) Jamila Kharodawala ( ) Megha Sharma ( ) ELECTRONICS DEVICES AND CIRCUITS G.H.Patel.
RPCs with Ar-CO2 mix G. Aielli; R.Cardarelli; A. Zerbini For the ATLAS ROMA2 group.
ECE 333 Linear Electronics
Influence of humidity on the IV characteristics A.Chilingarov Lancaster University ATLAS SCT Week CERN,
A simple model for the equivalent circuit of heavily irradiated Si diodes in standard CV measurements D.Campbell, A.Chilingarov, T.Sloan Lancaster University,
Study of the Radiation Damage of Hamamatsu Silicon Photo Multipliers Wander Baldini Istituto Nazionale di Fisica Nucleare and Universita’ degli Studi di.
DC bias circuit effects in CV measurements A.Chilingarov, D.Campbell Lancaster University, UK 9 th RD50 Workshop CERN,
Solving circuits step by step (traditional)
Ohm’s Law.
Electrical Properties of MPPC/SiPM/GMAPD’s
Irradiation and annealing study of 3D p-type strip detectors
Tests of the irradiated ATLAS-12 sensors
What if…?.
Diode Equation and Models
Potential Divider Aims What is a potential divider
Characterization of a Pixel Sensor for ITK
Ohm’s Law The relationship between voltage, current and resistance is known as Ohm’s Law: V = IR Voltage (V) = Current (I) x Resistance (R) Volts.
The measurement set-up
Semiconductors Chapter 25.
THE RESISTOR Forward characteristic Reverse characteristic Circuit.
Comparing Series and Parallel Circuits
Resistance in Series and Parallel
Circuit Components.
Presentation transcript:

Punch-through protection in ATLAS SCT sensors A.Chilingarov, Lancaster University, UK Meeting on Investigations into the effect of beam splash on SCT Modules CERN,

A.Chilingarov, Punch-through protection in ATLAS SCT sensors 2 Outline 1.Measurement method 2.Main results reported in Some recent results

A.Chilingarov, Punch-through protection in ATLAS SCT sensors 3 A  RbRb R str R dyn 1. Punch-through (PT) resistance measurement method Positive DC potential, U strip, varying from 0.5 to 50 V is applied to the strip implant and the resulting current, I strip, is measured. The slope dU s /dI s gives an effective dynamic resistance, R eff, between the strip and the bias rail. Note that the PT behaviour is not necessarily polarity independent. R eff consists of the bias resistor, R b, with R dyn + R str in parallel. R dyn is the dynamic resistance of the 8  m punch- through gap. Above the PT onset voltage R dyn decreases quickly with U strip. The R str is the strip implant resistance between the punch-through gap and the contact point.

Measurement of the punch-through protection voltage for ATLAS SCT sensors A.Chilingarov, Lancaster University, UK (extracts) Meeting on Silicon Strip Sensors for ATLAS Upgrade CERN, Main results reported in 2007

A.Chilingarov, Punch-through protection in ATLAS SCT sensors 5 The punch-through protection voltage U pth was measured with the detectors biased by 100 V, which is above U d for all detectors. The positive bias from a separate source-meter was applied to the strip implant and the resulting current was measured as a function of bias. At low volts the slope of the IV curve reflects the value of the polysilicon bias resistor. The punch- through appears as a soft breakdown in the IV.

A.Chilingarov, Punch-through protection in ATLAS SCT sensors 6 Differential resistance dU/dI was calculated from the measured IV curves. It has a similar shape for all 7 detectors A non-smooth behaviour of some characteristics is an artefact related to an insufficient precision of the voltage settings in earlier measurements. This was fixed later (e.g. for the measurements with w and w31-225). PT onset voltage lies between 8 and 14 V.

A.Chilingarov, Punch-through protection in ATLAS SCT sensors 7 3. Some recent results PT operation was tested up to ~1 mA strip current with the sensor w under 150 V bias at room temperature and ~50% RH. The measurements were performed with four different strips.

A.Chilingarov, Punch-through protection in ATLAS SCT sensors 8 For all strips the PT onset voltage is ~8.5 V and the minimum dynamic resistance is slightly above 10 k .

A.Chilingarov, Punch-through protection in ATLAS SCT sensors 9 Concluding remarks 1.The punch-through protection in the SCT sensors seems to work as expected. 2.The PT onset voltage lies between 8 and 14 V. 3.All reported measurements were made at about +21 o C temperature and 30-50% relative humidity.