LIGO-G020381-00-M LIGO R&D1 Report of the Optics Working Group Dave Reitze, UF Working Session on Sapphire »Committee to “down select” AdL test mass material:

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Presentation transcript:

LIGO-G M LIGO R&D1 Report of the Optics Working Group Dave Reitze, UF Working Session on Sapphire »Committee to “down select” AdL test mass material: –David Shoemaker (chair), Jordan Camp, Marty Fejer, Sam Finn, Peter Fritschel, Jim Hough, Peter Saulson, Phil Willems »near term “priority” action items identified for evaluation –Q on large sapphire samples (Glasgow, Caltech) –trace element analysis from “Rosetta” sapphire using neutron activation, X-ray fluorescence, EXAFS to correlate absorption data (SUBR) –refinement of FFT/Melody analysis of interferometer with adaptive thermal compensation, reasonable distributions for sapphire absorption inhomogeneity (CIT, Stanford) »general agreement that shifting “down select” decision to Jan 2003 would allow incorporation of near term action items –no hit on critical path

LIGO-G M LIGO R&D2 Report of the Optics Working Group Working Session on Coatings »coating stress identified (remembered!) as important loss mechanism –coating vendors to provide stress monitor data for all coatings »most work to date focused on fused silica coatings; sapphire coatings need to be looked at!!! »New coating materials materials to be looked at –mandated by identification of tantala as ‘bad actor’ in standard tantala/silica coatings –alumina/silica and Niobia identified as good candidates »TNI to look at coating thermal noise

LIGO-G M LIGO R&D3 Report of the Optics Working Group Working session on high power »multi-dimensional analysis of parametric instabilities in excitation of TM modes (D’Ambrosia, CIT) –sapphire is susceptible »Gingin High Power Test Facility (Jacobs, UWA) –coming along nicely; vacuum, electronics in place; optical plant designed »FFT modeling of imperfect core optics (Ganezer, CSDH) –analysis of sensitivity impact from mirror deformations »remote test mass sensing (Khazanov, IAP) –suite of high sensitivity techniques for heating contamination »high power photodiode development (Jackrel, Stanford) –InGaAs, GaInNAs rear-illuminated diodes; 300 mW linearity