Mixed-Signal Option for the Teradyne Integra J750 Test System Group:May08-12 Emily Evers Vincent Tai

Team Leader: Emily Evers Communications Coordinator: Vincent Tai Advisor: Dr. Weber Client: ECpE Department

Requirement Specification Problem Statement Concept Sketch System Block Diagram System Description User Interface Description Research Requirements Deliverables

Problem Statement The Teradyne system has been updated to allow for analog circuits to be tested. Although the tester is capable of testing analog circuits, there is no easy to use documentation and test procedures for the mixed-signal option.

Concept Sketch Daughterboard Socket Converter Teradyne J750 IG-XL Software

System Block Diagram Devices Mapping of DIB and Dautgherboard IX-GL Software Testing Documentation

System Description Devices Mapping Analog-to-Digital Converters Digital-to-Analog Converters High Speed Op Amp Mapping Device Interface Board (DIB) Connects daughter board to tester via pogo pins Daughter Board Connects device to DIB

System Description IX-GL Software Testing Documentation Test Plan Pin and Channel Map AC and DC Specs Timing Pattern Testing Documentation

Users Electrical and Computer Engineering Faculty Graduate Students interested in IC testing Students in EE 418

User Interface Description IG-XL Software

Market and Literary Research Previous Groups Work Previous Cookbooks Current Documentation of Project Progress Website Teradyne Lab Materials Digital Lab Books Mixed-Signal Option Lab Books Teradyne Website

Risks and Risk Management Risk: New Program maybe hard to learn Risk Management: Read Teradyne Manuals and Previous Risk: Limited team members Risk Management: Time Management

Functional Requirements The cookbook will be written so that a new user can understand The testing instructions will cover five different devices Two Analog-to-Digital converters Two Digital-to-Analog converters High Speed Op-amp Only one device will be tested at a time A test program will be created for the devices using IG-XL and will allow for easy manipulation for similar devices Upon successful testing and mating of the devices a cookbook will be made to allow future users to test these devices The project will be easy to trouble shoot using proper documentation

Non-functional Requirements The room environment needs to be kept at a consistent temperature of 30°C ± 3° Electrostatic discharge wrist bands must be worn when using the tester Access is limited to the lab

Deliverables DIB and Daughterboard Mapping Functioning IG-XL code for each device Completed testing for all devices Documentation for all devices

Deliverables Weekly Reports Website Project Plan Design Plan Final Report

Project Plan Work Breakdown Structure Resource Requirements Project Schedule

Work Breakdown Structure Review Status Look over previous groups work Read Teradyne training manuals External Mapping DIB mapping Daughterboard mapping

Work Breakdown Structure Create Test Plan Use IG-XL software Run Tests Successfully Write Cookbook

Resource Requirements Time Requirements Review Status IC Interface Test Plan Development Testing Documentation Reporting Total Hours Evers, Emily 30 50 100 75 60 40 355 Tai, Vincent Total 200 150 120 80 710 Financial Requirements Item Cost Materials Poster $35.00 Daughterboard TBA Subtotal Labor ($10.00/hour) Emily Evers $3550.00 Vincent Tai $7100.00 Total

Project Schedule

Thank You Questions?