FEST ECE 477 Fall 2011 TEAM 5 Gloria Budiman Alexander Kidarsa Christopher Sakalis Vishal Gala.

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Presentation transcript:

FEST ECE 477 Fall 2011 TEAM 5 Gloria Budiman Alexander Kidarsa Christopher Sakalis Vishal Gala

FEST  Far  End  Speakerphone  Test  System

 State Machine Different phases of test Optimize power consumption based on current state  Interrupt Driven Flexible peripheral control Minimize waste of CPU time SOFTWARE DESIGN

 I2C  SCI Mux1: Serial LCD Mux2: SPL  SPI A: SD card B: Codec I/O  PWM + ADC PERIPHERALS  Timer2: 100Hz 100 interrupts for “natural one second” (hint: BCD) 20 interrupts for buttons sampling  Timer0: 16kHz for codec

 Boring Boilerplate Adc.c CpuTimers.c Epwm.c I2C.c PieCtrl.c PieVect.c Sci.c Spi.c SysCtrl.c usDelay.asm … +16 more CODEBASE  FatFS ff.c  Made in EE063 Main.c dialog.c gpioSetup.c F28035_FLASH.cmd* mmc-c28x.c* fft.c … more coming

 FAT32 filesystem handler  Requires low-level driver mmc-c28x.c in our case  Requires 100Hz timer FATFS

 Initialization spree GPIO PLL (Set to 60MHz) Low Speed Peripherals Clock Prescaler (LOSPCP) Interrupt Vectors Initialize peripherals  Entry: (Hard) Reset  Next state: Always THE MACHINE: STATE0

 Hello World! User! Initialize LCD Initialize Codec Wake the SD card up Set LOSPCP as slow as possible  Entry: User interaction, immediate from State0  Next state: User interaction THE MACHINE: MAIN

 Test options Full Duplex Far End only Near End only  Source file selection, loop, test length  Entry: User interaction  Next state: User interaction THE MACHINE: CONFIGURATION

 Test output level Volume digitally adjusted by re-programming the codec  Using Sound Pressure Level Characterize and equalize the speaker  Entry: User interaction  Next state: User interaction THE MACHINE: CALIBRATION

 Time delay  Frequency response  THD (+N?)  InterModulation Distortion  Crosstalk  …+n! more  Entry: User interaction  Next state: SD card present THE MACHINE: PRESET TEST

 Marathon burn-in test  Entry: SD card present  Next state: User interaction, pre-programmed timer exceeded, SD card full THE MACHINE: FREE-RUN TEST

 Detection: f_write() returns ByteWritten less than ByteToWrite  Entry: see above  Next state: Trap state, user intervention required THE MACHINE: FULL

MEMORY MAP Not to scale As defined in F28035_FLASH.cmd RAM usage will increase as FFT joins the party

Coding ProgressFrustration Level ADCDNE Interrupt FunctionsCompletedTestedVerified EPWM_Init()CompletedTestedVerified EPWM_Dynamic()DNE I2C_Init()CompletedTestedVerified I2C_Send_Data()CompletedTestedVerified Sci_Init()CompletedTestedVerified LCD_Init()Not needed? LCD_SendMessage()CompletedSimulated SPL_RequestData()DNE Spi_Init()Completed Spi_Codec_TxRx()DNE FatFS: mmc-c28x.cPartial FFT()CompletedSimulated AutoCorrelation()Partial dialog()CompletedTested {… additional DSP algorithm}DNE

CODE BUSTER  LCD is 20x4 (non-graphical) No means of conveying graphical data Preset Test result has to be stored somewhere if SD card is not present  f_getfree() returns number of free cluster Problem: out-of-sync file system structure returns incorrect count

 Minimize critical section Prevent file system collapse on apocalypse CODE BUSTER

QUESTIONS?