Scanning tunneling microscopy (STM) Atomic force microscopy (AFM) Scanning electrochemical microscopy (SECM) UV & visible spectroscopy Transmission experiments.

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Presentation transcript:

Scanning tunneling microscopy (STM) Atomic force microscopy (AFM) Scanning electrochemical microscopy (SECM) UV & visible spectroscopy Transmission experiments Specular reflectance & ellipsometry Internal reflection spectroelectrochemistry Second harmonic spectroscopy Vibrational spectroscopy: IR spectroscopy, Raman spectroscopy Electron & ion spectroscopy XPS, AES, LEED, HREELS, mass spectroscopy Magnetic resonance methods: ESR, NMR Quartz crystal microbalance X-ray methods: XAS, XRD A Scanning probe techniques. Spectroelectrochemistry (ch. 16/17)

Microscopy: optical → scanning electron or force → STM, AFM in situ vs. ex situ techniques Scanning tunneling microsocpy (STM) Scanning probe techniques (ch. 16)

Au(111) at 0.7 V vs. NHE in HCl

Electrochemical STM

STM images of HOPG STM images of Pt(111) with I-adlattice in HClO 4

STM images of Cu(111): effect of etching

Scanning tunneling spectroscopy (STS)

Atomic force microscopy (AFM)

Cantilever displacement vs. z-deflection for (left) attractive interaction and (right) repulsive interaction

AFM of Cu underpotential deposition (UPD) on Au(111) Electrochemical AFM

Scanning electrochemical microscopy (SECM)

Principles of SECM

SECM appoach curves for steady-state currents

Imaging surface topography & reactivity Ta oxide formation on Ta

Commercialized SECM

SECM applications Ag line formation Electrochemical Cu etching

Spectroelectrochemistry (Ch. 17) UV & visible spectroscopy 1. Transmission experiments

Cell for transmission spectroelectrochemistry

Responses for transmission spectroelectrochemistry

Spectra of cobalt complex at different potentials

Detector Power meter Potentiostat Electrochemical cell or EC devices He-Ne laser (633nm) In-situ transmittance test

2. Specular reflectance and ellipsometry

Elliptic polarization arising from a phase shift between parallel & perpendicular components

Specular reflection spectroscopy

Electroreflectance spectra of Ag in NaClO 4

Reflectance changes caused by halide adsorption on Au

Ellipsometer Ellipsometry

Ellipsometric results for anodization of Al in tartaric acid

Growth of passive film on Fe at 0.8 V vs. SCE

Growth of polyaniline film: experiemental (dotted) vs. fiited resluts (solid)

3. Internal reflection spectroelectrochemistry

Transient absorbance

Surface plasmon resonance (SPR)

SPR curves for Au and monolayers

4. Photoacoustic and Photothermal Spectroscopy

5. Second harmonic spectroscopy Second harmonic generation (SHG)

SHG response