A confocal Raman microprobe analysis of partial discharge activity in gaseous voids N A Freebody 1*, A SVaughan 1, G C Montanari 2 and L Wang 2 1 University.

Slides:



Advertisements
Similar presentations
Moisture effect on the dielectric response and space charge behavior of mineral oil impregnated paper insulation Jian Hao1, 2, George Chen2, Ruijin.
Advertisements

A Raman Microprobe Study of Corona Ageing in a Controlled Atmosphere N.A. Freebody, A.S. Vaughan 19 January 2011.
The Functionalisation and Analysis of Silica-based Nanofillers C. Yeung and A. S. Vaughan University of Southampton, Southampton, UK Introduction The interest.
The use of Raman and FTIR Spectroscopy for the Analysis of Silica-based Nanofillers C. Yeung, G. Gherbaz and A. S. Vaughan University of Southampton, Southampton,
Influence of Ageing and Temperature on the Polarization/Depolarization Current Behaviour of Paper Immersed in Natural Ester Jian Hao 1, 2*, Ruijin Liao.
SEM & TEM in Polymer Characterization
Lecture 11. Microscopy. Optical or light microscopy involves passing visible light transmitted through or reflected from the sample through a single or.
Scanning Probe Microscopy
AAS and FES (Ch 10, 7th e, WMDS)
Measurement of mobility of positive charge carriers in polyethylene J Zhao, G Chen and P L Lewin University of Southampton, Southampton, UK Positive charge.
Sergey Kucheryavski Raman spectroscopy Acquisition, preprocessing and analysis of spectra.
VTSLM images taken again at (a) 4.5  (T=84.7K), (b) 3.85  (T=85.3K), (c) 22.3  (T=85.9K), and (d) 31.6  (T=86.5K) using F-H for current and A-C for.
Surface Characterization by Spectroscopy and Microscopy
The Maryland Optics Group Far-Field Optical Microscope with Nanometer-Scale Resolution Igor I. Smolyaninov and Christopher C. Davis Department of Electrical.
Fig 10: I-V characteristics of Au/PDNC/Al/Au junction. This shows that the molecule has rectification towards the positive bias. Current (A) M I A M I.
© 2012 HORIBA Scientific. All rights reserved. Applications of Raman microspectroscopy to fluid inclusions phase identification. S. Mamedov *, R. S. Darling.
Microscope.
Microscopy.
Scanning Electron Microscopy
Microscopy Chapter 6. Objectives To be able to describe the light path through a simple lens To be able to define a compound microscope and describe the.
Chapter 7 THE MICROSCOPE.
Structural characterization of worm and spider silk on cross section surface Weizhen Li Evgeny Klimov Joachim Loos.
Simple to Complex – Life’s Levels of Organization
Forensic Instrumentation
SEM (SCANNING ELECTRON MICROSCOPE) Özgen Buğdaycı Elif Topçuoğlu Yavuz Duran Hacettepe University
Naomi Kinjal Asaad Binoy
 For AC ramp breakdown testing a Phenix AC Dielectric Test Set, Type 600C was used with a custom built test cell.  The test cell used mushroom electrodes.
Electron Microscope and Spectral Analysis of Sense Wires used in COMPASS Drift Chambers Vivek Britto, Soobin Lim, IhnJea Choi, Pedro Montuenga – University.
Modelling the Non-equilibrium Electric Double Layer at Oil-Pressboard Interface of High Voltage Transformers H. Zainuddin*, P. L. Lewin and P. M. Mitchinson.
A Comparison between Electroluminescence Models and Experimental Results D. H. Mills 1*, F. Baudoin 2, G. Chen 1, P. L. Lewin 1 1 University of Southampton,
Other modes associated with SEM: EBIC
Influence of Copper on the By-products and Dielectric Properties of Different Oil-paper Insulations Jian Hao 1, 2, Ruijin Liao 1, George Chen 2 and Chao.
A Raman spectrum gives a unique chemical signature of a specimen The Raman microscopy is used extensively in the following applications: Pharmaceuticals.
Space Charge Behaviour of Mineral Oil/Kraft Paper Insulation with Different Ageing Conditions Jian Hao 1, 2*, G Chen 2, Ruijin Liao 1 and Wei Li 1 1 University.
Tao Yuan, Jingzhou Xu, and Xicheng Zhang Rensselaer Polytechnic Institute, Troy, New York Scanning THz Emission Microscope Abstract A THz image system.
Powerpoint Templates Page 1 Depth Effects of DEP Chip with Microcavities Array on Impedance Measurement for Live and Dead Cells Cheng-Hsin Chuang - STUST.
Magnification Calibration Interlaboratory SEM Study: Part 1.
TEM charcaterization Basic modes – Bright field microscopy – Dark field Microscopy –STEM – EDAX – EELS.
日 期: 指導老師:林克默、黃文勇 學 生:陳 立 偉 1. Outline 1.Introduction 2.Experimental 3.Result and Discussion 4.Conclusion 2.
Characterization of nuclear transmutations by 638 nm laser beams ( ¹ ) STMicroelectronics, via Tolomeo, Cornaredo Milano-I ( ² ) Applied Electronics.
AC Breakdown characteristics of LDPE in the presence of crosslinking byproducts. N. Hussin and G. Chen University of Southampton, Southampton, UK Weibull.
SEM Scanning Electron Microscope
Nanonics Renishaw NSOM/Raman Combination Nanonics NSOM/SPM Systems Are The Only Scanned Probe Microscopes : Capable Of Being Integrated With.
Electron probe microanalysis Low Voltage SEM Operation Modified 9/23/10.
The Effect of Nanofiller on Polyethylene System K. Y. Lau 1, 2, *, A. S. Vaughan 1, G. Chen 1 and I. L. Hosier 1 1 University of Southampton, Southampton,
Numerical Modelling of Needle-Grid Electrodes for Negative Surface Corona Charging System Y. Zhuang*, G. Chen and M. Rotaru University of Southampton,
Lithography in the Top Down Method New Concepts Lithography In the Top-Down Process New Concepts Learning Objectives –To identify issues in current photolithography.
GIST 24 Meeting GERB Mirror Pitting Update 14 th December 2005 Presenter: S.Kellock (Imperial)
Images of healthy human hair.
Using Technology to Study Cellular and Molecular Biology.
Electron Microscope and Spectral Analysis of Sense Wires used in COMPASS Drift Chambers Vivek Britto, Soobin Lim, IhnJea Choi, Pedro Montuenga – University.
November 2005NASA Electronic Parts and Packaging (NEPP) Program Tin Whiskers Growing Inside ~45 Year Old AF114 Germanium Transistors Parts Analysis by:
Microscopy.
Reporter: Chien-Chung Tsai
Microscope.
Research stoichiometric of heterogeneity of lithium niobate crystals by IR spectroscopy Paranin V.D., Pantelei E.
Optical Non-Invasive Approaches to Diagnosis of Skin Diseases
Starter: Microscopes Which image is from the light microsope? How do you know?
Laboratory equipment Lecture (3).
3.3 Other types of microscopy
What is XPS? XPS (x-ray photoelectron spectroscopy) is also known as ESCA (electron spectroscopy for chemical analysis). XPS provides chemical information.
Date of download: 11/9/2017 Copyright © ASME. All rights reserved.
NANO 230 Micro/NanoFabrication
Optical Non-Invasive Approaches to Diagnosis of Skin Diseases
Surface and Interface Characterization of Polymers
Layered and scrolled nanocomposites with aligned semi-infinite graphene inclusions at the platelet limit by Pingwei Liu, Zhong Jin, Georgios Katsukis,
Nanocharacterization (III)
Laboratory Exercise 2 “Microscopy”.
Electron probe microanalysis
Chapter 7 The Microscope
Presentation transcript:

A confocal Raman microprobe analysis of partial discharge activity in gaseous voids N A Freebody 1*, A SVaughan 1, G C Montanari 2 and L Wang 2 1 University of Southampton, UK 2 University of Bologna, Italy Raman Results Micrograph and SEM Results Introduction Samples and Method Conclusions Electrical ageing in polymeric insulators used in high voltage cables and transformers is often thought to originate in small gas filled voids within the bulk of the material. Understanding this ageing process is vital as it can lead to electrical treeing and, in some cases, complete electrical failure of the material as an insulator. This paper investigates the chemical processes in electrically aged voids via confocal Raman microprobe spectroscopy (CRMS), a technique well suited to this analysis due to its ability to probe sub surface artefacts in the sample and a resolution of approximately 2 μm in the optical plane. The surfaces of the voids were analysed using CRMS in conjunction with both air and oil immersion lenses and data were compared to and discussed in conjunction with SEM images obtained of the surfaces of the voids which were exposed via microtomy. N Freebody, University of Southampton, Highfield, Southampton, SO17 1BJ, UK Contact details :  CRMS is a useful tool in the determination of chemical variations beneath the surface of a sample and would be an effective tool in the analysis of ageing and breakdown in dielectric materials.  Depth profiles of voids show the spectral peaks of PE within the bulk of the sample but not within the void and the presence of a range of peaks between 200 and 600 cm -1.  Aged samples show traces of fluorescence (a phenomena previously linked with ageing) which increases in intensity at the surface of the void.  Oil immersion enables a more accurate Raman study of the void surface due to the reduction in refraction effects.  Non destructive imaging of the void surface can be achieved with the use of oil immersion however SEM imaging is still recommended when possible.  Micrographs and SEM imaging revealed the presence of debris and the possibility of micropiting.  Further study into the application of oil immersion is needed in order to determine the exact nature of the peaks within the Raman spectra. As well as this further tests are needed in order to determine the origin and composition of the debris found within the aged voids as seen with the SEM in order to see if it is caused by micropitting as the literature suggests.  Data were collected using a Lecia microscope coupled to a Renishaw Raman RM1000 system using a 785 nm CW diode laser of power 25 mW, set up in line with Renishaw’s recommendations for confocal operation.  Spectra were obtained using an extended scan and were built up of the accumulation of 25 scans of 10 s with a laser power of 25% to minimize sample damage.  Samples were probed at various intervals along the z-axis and at a number of points in the horizontal plane, for comparison, using both air and oil immersion lenses.  Samples were then cut open using an RMC MT-7 ultra microtome equipped with a CR-21 cryo-system set at -50 o C in order to expose the internal walls of the voids. The microtomed surfaces were sputter coated with gold and examined by scanning electron microscopy (SEM). Figure 1: Schematic showing structure and dimensions of layered void samples Figure 6: optical micrograph of aged (157h) void surface using an oil immersion objective Figure 7: SEM images of unaged void, a) exposed void, b) edge of void. Figure 8: SEM images of aged void (156h), a) exposed void, b) edge of void. Figure 2: Raman depth profiles (in air) of a) unaged void and b) aged (157h) non void Figure 5: Raman spectra of the aged (157h) void surface (in air) Figure 4: Raman depth profiles of aged (157h) void, a) in air, b) in oil  With the unaged void, the spectral peaks of PE can be seen up to 150 μm into the surface of the sample.  Once the surface of the void can be found approximately 100 μm into the surface of the sample.  Between 600 and 200 cm -1 a range of spectral peaks can be seen of varying intensity.  When an aged non void is profiled, the same spectral features as before can be seen throughout the sample.  When oil immersion lens and a suitable immersion oil (silicone oil) is used, it is possible to eliminate refraction effects at the sample surface.  Using oil immersion it is possible to image the top surface of the void in a non destructive way.  Evidence of micropitting on void surface, with pits of approximately 1-2 μm in diameter.  Although a destructive method for obtaining data, SEM provides valuable complimentary information.  SEM images of exposed voids showed the following:  No evidence of a boundary/change in morphology between the XLPE and LDPE.  With the non aged void the walls of the void are very smooth with very few small (< 1μm) features on the surface  When the sample is aged, the void appears to contain ‘debris’ and features 8-10 μm can be found protruding from the void surface  The size of the void appears unchanged regardless of ageing time leading to ambiguity to the nature and origin of the debris  Voided samples were made by hot pressing 2 sheets of cross linked polyethylene (XLPE) on either side of a layer of LDPE in which a microcavity was embedded and then aged under an AC field. Figure 3: Raman depth profile of aged (157h) void in air  In air, similar results to the non aged void can be found with the addition of fluorescence.  Spectra obtained using an oil immersion objective enables a more accurate depth profile due to a reduction in noise  Depth profiles in air and oil show:  PE within the sample,  increased fluorescence within the void.  a range of peaks (possibly due to oxygenated bi products) throughout the sample at lower wavenumbers.  Raman spectra of the void surface revealed large amounts of fluorescence and evidence of the presence of carbon. 10 μm