Characterization of CsI:Tl recrystalization after liquid phase deposition Ulrik Lund Olsen, Ph.D. student supervisors: H.F. Poulsen, S. Schmidt SCINT’07,

Slides:

Advertisements

Similar presentations

Focused ion beam (FIB) 1.Overview. 2.Ion source and optics. 3.Ion-solid interaction, damage. 4.Scanning ion beam imaging. ECE 730: Fabrication in the nanoscale:

Advertisements

Ion Beam Analysis techniques:

Electron Microscopy for Catalyst Characterization Dr. King Lun Yeung Department of Chemical Engineering Hong Kong University of Science and Technology.

Formation of pn junction in deep silicon pores September 2002 By Xavier Badel, Jan Linnros, Martin Janson, John Österman Department of Microelectronics.

PROVIDED BY EMAD BEHDAD SPECIALIZED PROTECTION AND CORROSION OF MATERIALS LECTURERS H.MONAJATI,PHD JAFARI,PHD ISLAMIC AZAD UNIVERSITY OF NAJAFABAD BARANCH.

Tomsk Polytechnic University1 A.S. Gogolev A. P. Potylitsyn A.M. Taratin.

Introduction Superconductors are a class of material that when cooled to low temperatures, conduct electricity with zero resistance. The main use of superconductors.

3D X-Ray Diffraction Microscopy Larry Margulies. 200 µm Metal Structures Heat Defor- mation 200 µm 5 µm Challenges: - Multiple lengthscales - Heterogeneities.

XPS and SIMS MSN 506 Notes.

X-ray Microtomography National School on Neutron and X-ray Scattering August Group D Jiong Hua Vaibhav Kohli Soonjoo Seo Lu Zou Paul J. Sideris.

Surface Characterization by Spectroscopy and Microscopy

Spectroscopy FNI 1C.

SEM microscope By: Doug, Holly & Oleg. Scanning Electron Microscope vs. Optical Microscope Advantages Continuously variable magnification High resolution.

Do it with electrons !. Microscopy Structure determines properties We have discussed crystal structure (x-ray diffraction) But consider now different.

Detectors The energy loss of particles in matter can be used detect and identify those particles. There are different types of “detectors”: - Gas-filled.

Neutron Generation and Detection Lee Robertson Instrument & Source Division Oak Ridge National Laboratory 17 th National School on Neutron and X-ray Scattering.

Seminar Author: Bojan Hiti Mentor: doc. dr. Matjaž Kavčič Determination of trace impurities on Si wafers with x-ray fluorescence.

Scanning Electron Microscopy

III. Analytical Aspects Summary Cheetham & Day, Chapters 2, 3 Chemical Characterization of Solid-State Materials Chemical Composition: Bulk, Surface, …

Surface Analysis Surface interface controls many aspects of chemistry

Centre de Toulouse Radiation interaction with matter 1.

Auger Electron Spectroscopy (AES) 1. Brief History Auger Effect discovered in 1920’s Meitner published first journal Auger transitions considered noise.

Effective lens aperture Deff

Nano-Materials Characterization Yoram Shapira, EE Nano-bio-electronics Growth and Processing Characterization and Analysis Design and Modeling.

Monte Carlo simulation of the imaging properties of a scintillator- coated X-ray pixel detector M. Hjelm * B. Norlin H-E. Nilsson C. Fröjdh X. Badel Department.

Electron Microscopes Used to count individual atoms What can electron microscopes tell us? Morphology – Size and shape Topography – Surface features (roughness,

Advanced Analytical Chemistry – CHM 6157® Y. CAIFlorida International University Updated on 9/28/2006Chapter 6Electron Spectroscopy Chapter 6 Electron.

Ion Beam Analysis Dolly Langa Physics Department, University of Pretoria, South Africa Blane Lomberg Physics Department, University of the Western Cape,

FRANK LABORATORY OF NEUTRON PHYSICS ION BEAM ANALYSIS STANCIU-OPREAN LIGIA SUPERVISOR DR. KOBZEV ALEXANDER.

Stanford Synchrotron Radiation Laboratory More Thin Film X-ray Scattering: Polycrystalline Films Mike Toney, SSRL 1.Introduction (real space – reciprocal.

Advanced FE-SEM : from Nano-imaging to Chemical and Structural Analyses Chi Ma Division Analytical Facility Division of Geological and Planetary Sciences,

Scanning Electron Microscope (SEM)

PHYS 430/603 material Laszlo Takacs UMBC Department of Physics

Tshepo Mahafa P-LABS Necsa 1 CHARGED PARTICLE IRRADIATION EFFECTS ON ZIRCALOY-4 Necsa_Wits Workshop, 10 – 11 September 2015, Necsa, Pelindaba.

1 2. Focusing Microscopy Object placed close to secondary source: => strong magnification The smaller the focus, the sharper the image! Spectroscopy, tomography.

Overview of Characterization Methodology Michael J. Kelley College of William & Mary and Jefferson Lab

Shining Synchrotron Light on Supercritical Fluids Alan J. Anderson St. Francis Xavier University.

TEM charcaterization Basic modes – Bright field microscopy – Dark field Microscopy –STEM – EDAX – EELS.

NANO 225 Micro/NanoFabrication Electron Microscopes 1.

Reminders for this week Homework #4 Due Wednesday (5/20) Lithography Lab Due Thursday (5/21) Quiz #3 on Thursday (5/21) – In Classroom –Covers Lithography,

VCI2010 Photonic Crystals: A Novel Approach to Enhance the Light Output of Scintillation Based Detectors 11/19/2015 Arno KNAPITSCH a, Etiennette AUFFRAY.

Plan : lattices Characterization of thin films and bulk materials using x-ray and electron scattering V. Pierron-Bohnes IPCMS-GEMME, BP 43, 23 rue du Loess,

NANO 225 Intro to Nano/Microfabrication

Characterization of Nanomaterials…

Scanning Electron Microscopy. The Scanning Electron Microscope is an instrument that investigates the surfaces of solid samples.

SEM Scanning Electron Microscope

Passivation of HPGe Detectors at LNL-INFN Speaker: Gianluigi Maggioni Materials & Detectors Laboratory (LNL-INFN) Scientific Manager: Prof. Gianantonio.

Lithography in the Top Down Method New Concepts Lithography In the Top-Down Process New Concepts Learning Objectives –To identify issues in current photolithography.

FNI 2A Tools1 Tools of Nanoscience Microscopy  Optical  Electron SEM TEM  Scanning Probe STM AFM NSOM Spectroscopy  Electromagnetic  Mass  Electron.

Application of optical techniques for in situ surface analysis of carbon based materials T. Tanabe, Kyushu University Necessity of development of (1) in-situ.

The Muppet’s Guide to: The Structure and Dynamics of Solids Material Characterisation.

Questions/Problems on SEM microcharacterization Explain why Field Emission Gun (FEG) SEM is preferred in SEM? How is a contrast generated in an SEM? What.

METAL DETECTORS: PERFORMANCES AND APPLICATIONS Oleksandr Okhrimenko Institute for Nuclear Research NAS of Ukraine, Kiev.

Metal micro-detector TimePix imaging synchrotron radiation beams at the ESRF Bio-Medical Beamline ID17 Andrii Chaus Institute for Nuclear Research National.

Study of some gilded film/glass interfaces and of one standard type of “liquid gold” XVI ICF TECHNICAL EXCHANGE CONFERENCE 9 th -12 th October 2004 Karlovy.

Do it with electrons !. Microscopy Structure determines properties We have discussed crystal structure (x-ray diffraction) But consider now different.

Anne-Marie VALENTE-FELICIANO On behalf of the HEPTHF Collaboration.

Outline History(TEM) Background Components Specimen Preparation Imaging method Contrast formation Modifications STEM References.

Introduction to Scanning Electron Microscope by Sameer S

METALLURGICAL MICROSCOPE

NANO 230 Micro/NanoFabrication

Extending IBA Analysis:

Nucleation kinetics and grain growth during aluminum solidification

Kinetics of Phase Transformations

Do it with electrons !.

ION BEAM ANALYSIS.

Characterization of Thin Films

Nanocharacterization (II)

Radhabai Kale Mahila Mahavidhyalaya, Ppt. name:- x-Ray techniques

Surface analysis techniques part I

Presentation transcript:

Characterization of CsI:Tl recrystalization after liquid phase deposition Ulrik Lund Olsen, Ph.D. student supervisors: H.F. Poulsen, S. Schmidt SCINT’07, Salem Winston, June

Aims of project Diffracted Beam Grain in Aluminum Sample Scintillator Mirror Microscope Lens CCD photons 540nm X-rays 50keV Submicron grains structure resolved at high energy (30-100keV) at fast kinetic low flux diffraction meassurements. fundamental relationship between scintillator thickness and resolution

Principle - Structured Scintillator CsI:Tl SiO2 Si

Electrochemical etching HF solution etches surfaces with positive donors Light induced donors are guided by an applied electric field Field determined by silicon resistivity and bias HF e R.L. Smith and J.D. Collins, J. Appl. Phys. 71, 8, R1 (1992)

Pore Structure 10µm 1µm SiO2

Pore Filling Process CsI:Tl powder on Silicon surface Sealed sample holder Tube furnace Controlled cooling rate

Bulk characterization Focused Ion Beam(FIB) milling 4µm 10µm Ions

Crystal characterization - EBSD Grain size Distribution Electron Backscatter Diffraction

Compositional characterization - Fluorescence Flourescence exited with 90keV synchrotron radiation: local (w/ focused beam) large lead(Pb) background Au Sn Kβ1Kβ1 Kβ1Kβ1 Kα1Kα1 Kα1Kα1 Kα2Kα2 fit

Compositional characterization - PIXE Particle induced X-ray Emission: 40keV protons bulk information (250µm penetration) global probe (2mm 2 beam)

Compositional characterization - PIXE manufacturers specs on as-received was 0.2 wt% (GB crystals)

Composition characterization - SIMS Secondary Ion Mass Spectroscopy: local information surface probing high compositional sensitivity (>ppm) uneven sensitivity to different species No.Ion CentMass CI 1I Cs ^203Tl Tl Cs_

Conclusion Multiple characterization tools needed textural information from high resolution EBSD absolute composition from PIXE meso-scale relative composition from x-ray induced fluorescence local composition – SIMS Thanks to: T. Martin (ESRF) V. Honkimaki (ESRF) M. di Michiel (ESRF) X. Badel (KTH) J. Linnros (KTH) N.B. Larsen (RISØ) J.C. Grivel (RISØ) C. Gundlach (ESRF) Funding: Danish Fundamental Research Foundation &