A4 1 Barto "Sequential Circuit Design for Space-borne and Critical Electronics" Dr. Rod L. Barto Spacecraft Digital Electronics Richard B. Katz NASA Goddard.

Slides:



Advertisements
Similar presentations
Basic Finite State Machines 1. 2 Finite State Machines Binary encoded state machines –The number of flip-flops is the smallest number m such that 2 m.
Advertisements

Finite State Machines (FSMs)
Reliable Data Processor in VLSI
10/14/2005Caltech1 Reliable State Machines Dr. Gary R Burke California Institute of Technology Jet Propulsion Laboratory.
VIII - Working with Sequential Logic © Copyright 2004, Gaetano Borriello and Randy H. Katz 1 Finite state machine optimization State minimization  fewer.
TOPIC : Finite State Machine(FSM) and Flow Tables UNIT 1 : Modeling Module 1.4 : Modeling Sequential circuits.
Give qualifications of instructors: DAP
Digital Electronics Chapter 5 Synchronous Sequential Logic.
Circuits require memory to store intermediate data
DSD 2007 Concurrent Error Detection for FSMs Designed for Implementation with Embedded Memory Blocks of FPGAs Andrzej Krasniewski Institute of Telecommunications.
Unit 13 Analysis of Clocked Sequential Circuits Ku-Yaw Chang Assistant Professor, Department of Computer Science and Information.
CS 151 Digital Systems Design Lecture 37 Register Transfer Level
CS 151 Digital Systems Design Lecture 25 State Reduction and Assignment.
Quantum Error Correction SOURCES: Michele Mosca Daniel Gottesman Richard Spillman Andrew Landahl.
The Control Unit: Sequencing the Processor Control Unit: –provides control signals that activate the various microoperations in the datapath the select.
Contemporary Logic Design Sequential Case Studies © R.H. Katz Transparency No Chapter #7: Sequential Logic Case Studies 7.1, 7.2 Counters.
Embedded Systems Hardware:
Dr. Turki F. Al-Somani VHDL synthesis and simulation – Part 3 Microcomputer Systems Design (Embedded Systems)
Give qualifications of instructors: DAP
Chapter 4 Processor Technology and Architecture. Chapter goals Describe CPU instruction and execution cycles Explain how primitive CPU instructions are.
Spring 2002EECS150 - Lec15-seq2 Page 1 EECS150 - Digital Design Lecture 15 - Sequential Circuits II (Finite State Machines revisited) March 14, 2002 John.
1 Advanced Digital Design Asynchronous Design: Research Concept by A. Steininger and M. Delvai Vienna University of Technology.
ENEE 408C Lab Capstone Project: Digital System Design Fall 2005 Sequential Circuit Design.
Embedded Systems Hardware: Storage Elements; Finite State Machines; Sequential Logic.
DIGITAL ELECTRONICS CIRCUIT P.K.NAYAK P.K.NAYAK ASST. PROFESSOR SYNERGY INSTITUTE OF ENGINEERING & TECHNOLOGY.
ENGIN112 L25: State Reduction and Assignment October 31, 2003 ENGIN 112 Intro to Electrical and Computer Engineering Lecture 25 State Reduction and Assignment.
EE345: Introduction to Microcontrollers Register and Counters Prof. Ahmad Abu-El-Haija.
1 Fault-Tolerant Computing Systems #2 Hardware Fault Tolerance Pattara Leelaprute Computer Engineering Department Kasetsart University
Finite State Machines. Binary encoded state machines –The number of flip-flops is the smallest number m such that 2 m  n, where n is the number of states.
Suggestions for FPGA Design Presentation
Labs Practicing in Design of Combinational Networks and FSM with Concurrent Error Detection Tatjana Stanković, Goran Djordjević, Mile Stojčev 2075 Microprocessor.
CS3502: Data and Computer Networks DATA LINK LAYER - 1.
FORMAL VERIFICATION OF ADVANCED SYNTHESIS OPTIMIZATIONS Anant Kumar Jain Pradish Mathews Mike Mahar.
جلسه هشتم شبکه های کامپیوتری به نــــــــــــام خدا.
Linear Feedback Shift Register. 2 Linear Feedback Shift Registers (LFSRs) These are n-bit counters exhibiting pseudo-random behavior. Built from simple.
Synthesis Of Fault Tolerant Circuits For FSMs & RAMs Rajiv Garg Pradish Mathews Darren Zacher.
CS3505: DATA LINK LAYER. data link layer  phys. layer subject to errors; not reliable; and only moves information as bits, which alone are not meaningful.
Error Detection in Hardware VO Hardware-Software-Codesign Philipp Jahn.
Electrical and Computer Engineering University of Cyprus LAB 1: VHDL.
DLD Lecture 26 Finite State Machine Design Procedure.
Digital Logic Design.
D_160 / MAPLD Burke 1 Fault Tolerant State Machines Gary Burke, Stephanie Taft Jet Propulsion Laboratory, California Institute of Technology.
12004 MAPLDReset Circuit Topologies Reference: Analysis of POR Circuit Topologies
Digital Computer Concept and Practice Copyright ©2012 by Jaejin Lee Control Unit.
Digital System Design using VHDL
Digital System Design using VHDL
Digital Circuits Introduction Memory information storage a collection of cells store binary information RAM – Random-Access Memory read operation.
EEE515J1_L4-1/12 EEE515J1 ASICs and DIGITAL DESIGN EGBCDCNT.pdf An example of a synchronous sequential machine.
A Simplified Approach to Fault Tolerant State Machine Design for Single Event Upsets Melanie Berg.
© 2009 Pearson Education, Upper Saddle River, NJ All Rights ReservedFloyd, Digital Fundamentals, 10 th ed Digital Logic Design Dr. Oliver Faust.
Coding No. 1  Seattle Pacific University Digital Coding Kevin Bolding Electrical Engineering Seattle Pacific University.
Gunjeet Kaur Dronacharya Group of Institutions. Outline I Random-Access Memory Memory Decoding Error Detection and Correction Read-Only Memory Programmable.
COMBINATIONAL AND SEQUENTIAL CIRCUITS Guided By: Prof. P. B. Swadas Prepared By: BIRLA VISHVAKARMA MAHAVDYALAYA.
Chapter 3 Boolean Algebra and Digital Logic T103: Computer architecture, logic and information processing.
Counters In digital logic and computing, a counter is a device which stores (and sometimes displays) the number of times a particular event or process.
1 Chapter 1 Basic Structures Of Computers. Computer : Introduction A computer is an electronic machine,devised for performing calculations and controlling.
DIGITAL SYSTEMS ECE-273, Digital Systems Dr. Herb Kaufman Electrical and Computer Engineering UofM-Dearborn 1.
1 Modeling of Finite State Machines Debdeep Mukhopadhyay Associate Professor Dept of Computer Science and Engineering NYU Shanghai and IIT Kharagpur.
Self-Checking Circuits
Digital Electronics Multiplexer
Control Unit Lecture 6.
Digital Electronics Multiplexer
Sequential circuits and Digital System Reliability
Control Unit Introduction Types Comparison Control Memory
RAID Redundant Array of Inexpensive (Independent) Disks
CSE 370 – Winter Sequential Logic-2 - 1
Lecture 17 Logistics Last lecture Today HW5 due on Wednesday
Lecture 17 Logistics Last lecture Today HW5 due on Wednesday
ECE 352 Digital System Fundamentals
CSE 370 – Winter Sequential Logic-2 - 1
Presentation transcript:

A4 1 Barto "Sequential Circuit Design for Space-borne and Critical Electronics" Dr. Rod L. Barto Spacecraft Digital Electronics Richard B. Katz NASA Goddard Space Flight Center

A4 2 Barto Two Most Common Finite State Machine (FSM) Types Binary: Smallest m (flip-flop count) with 2 m  n (state count), highest encoding efficiency. –Or Gray Coded, a re-mapping of a binary FSM One Hot: m = n, i.e., one flip-flop per state, lowest encoding efficiency. –Or Modified One Hot: m = n-1 (one state represented by 0 vector). Issue: How To Protect FSMs Against Transient Errors (SEUs and MEUs): Illegal State Detection Adding Error Detection and Correction (EDAC) Circuitry

A4 3 Barto Encoding Efficiency: Binary vs. One Hot

A4 4 Barto Binary and Gray Code FSM State Sequences bit Reflected Gray Code Binary Code Binary sequence can have 0 (hold), 1, 2,..., n bits changing from state to state. Gray code structure ensures that either 0 (hold) or 1 bit changes from state to state. Illegal states in either type are detected in the same way, i.e., by explicit decoding.

A4 5 Barto Gray Code Illegal Transition Detection Next State Logic State Bit Register Last State Register >1 logic 1 Bit-wise XOR inputs outputs illegal transition False illegal transition indications can also be triggered by errors in the Last State Register, and doubling the number of bits doubles the probability of an SEU.

A4 6 Barto One Hot FSM Coding Many (2 n -n) unused states - not "reachable" from VHDL 2. Illegal state detection circuitry complex Parity (odd) will detect all SEUs, not MEUs Binary Code One Hot Coding 2 "The Impact of Software and CAE Tools on SEU in Field Programmable Gate Arrays," R. Katz, et. al., IEEE Transactions on Nuclear Science, December, 1999.

A4 7 Barto One Hot FSM Coding Lockup States One Hot FSM without protection. SEU FSM is locked up.

A4 8 Barto Modified One Hot FSM Coding One Hot Coding Modified One Hot Coding Note: Often used by synthesis when one hot FSM specified. Modified one hot codings use one less flip-flop.

A4 9 Barto Modified One Hot FSM Illegal State Detection Error detection more difficult than for one hot –1  0 upsets result in a legal state. –Parity will not detect all SEUs. –If an SEU occurs, most likely the upset will be detectable Recovery from lockup sequence simple  If all 0's (NOR of state bits), then generate a 1 to first stage. –If multiple 1's (more difficult to detect), then will wait until all 1's are "shifted out."

A4 10 Barto Is There a Best FSM Type, and Is It Best Protected Against Transient Errors By Circuit-Level or System- Level EDAC? Circuit-level EDAC –Expensive in power and mass if used to protect all circuits –Can be defeated by multiple-bit transient errors System-level EDAC –Required for hard-failure handling –Relies on inherent redundancy in system, high-level error checking, and some EDAC hardware

A4 11 Barto System-Level Error Checking Mechanisms Natural error checking mechanisms –e.g., fire a thruster, check for spacecraft attitude change Checking mechanisms arising from multiple subsystems –e.g., command a module to power on, check its current draw and temperature Explicitly added checking mechanisms –Watchdog timers –Handshake protocols for command acknowledgement –Monitors, e.g., thruster on-time monitor

A4 12 Barto Transient Errors Cause FSM Jumps to Erroneous States Jump toPathologyCircuit Level Response Illegal stateImpartially decoded states allow erroneous state machine outputs Appropriate recovery state difficult to determine Homing sequence, reset controlled circuitry –Success depends on nature of system Stop, raise error flag, handle at system level Legal stateIncorrect sequencing of state machine activities Probably detectable at system level only based on incorrect module operation

A4 13 Barto System-Level Error Handling Mechanisms Also Handle Transient Error Effects Transient Error Effect System Response Command RejectionCommand Retry Telemetry or Data CorruptionData Filtering, also required to handle system noise State Machine Lock-up, e.g., detected by multiple command rejections Indistinguishable from hard error

A4 14 Barto EDAC Required For Some FSMs Based on Criticalness of Circuit and Probability of Error Common EDAC Types TypeCapabilityPower & Mass Impact ParityDetect 1 bit error, correct 0Extra bit, parity trees to set and check NMRCorrect int(N/2) bit errors (strong correction) Multiplies gate count by N+ and clock loading by N HammingCorrect 1 bit error, Detect 2 (or more, depending on code) (weak correction) Close to TMR in gate count, much lower clock loading

A4 15 Barto Impact of Adding EDAC to Common FSM Types FSM TypeProtecting with EDAC BinaryHigh encoding efficiency => smallest EDAC impact Potentially few illegal states => fairly easy to detect Full decoding eliminates effects of illegal states One-hotPoor encoding efficiency => greatest EDAC impact Many illegal states => complex circuit to detect Full decoding defeats advantage of easy state decoding

A4 16 Barto Conclusion Binary state machine may be optimal for highly reliable systems –Most amenable to the addition of EDAC circuitry if necessary because of high encoding efficiency –Full state decoding protects against erroneous outputs –Easier to detect illegal states Overall EDAC scheme must also consider system-level action –Will be there for hard failures, anyhow –Must consider system response to defeated circuit-level EDAC