Masaya Miyahara, James Lin, Kei Yoshihara and Akira Matsuzawa Tokyo Institute of Technology, Japan A 0.5 V, 1.2 mW, 160 fJ, 600 MS/s 5 bit Flash ADC.

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Presentation transcript:

Masaya Miyahara, James Lin, Kei Yoshihara and Akira Matsuzawa Tokyo Institute of Technology, Japan A 0.5 V, 1.2 mW, 160 fJ, 600 MS/s 5 bit Flash ADC

2 Outline Motivation Design Concept Calibration Technique Measurement Results Conclusions

3 Motivation An ultra-low power ADC is strongly required. –Portable applications –Ubiquitous wireless sensor system –Green IT A low voltage operation is required for further technology scaling and low power operation. –Analog circuits design becomes more difficult. Increasing V T mismatch Degradation of gain and distortion of an amplifier –The FoM of an ADC should be reduced like digital circuits. Optimizing a speed, resolution and power. Calibration technique for low voltage operation.

4 Performance of flash ADCs FoM is deteriorated by the offset voltage of the comparator. Offset voltage should be low at low voltage operation. V off (  ):Offset voltage V q : 1LSB voltage

5 FoM vs. VDD E c :Energy consumption for each comparator and followed logic circuits. FoM can be significantly reduced by reducing power supply voltage VDD.

6 FoM delay product Delay time The FD product suggests the balance between the number of interleaving and decrease of energy consumption. V T = 0.4 V Excessive number of Interleaving ADC Large area Driving difficulty Reduction of ENOB

7 Forward body biasing Forward body biasing can decrease the delay time (1/2) and can be used easily at 0.5 V operation. V TN = 100mV V TP = 60mV Increased leakage current in the proposed ADC is 0.32 mA by forward body biasing. 1/2

8 Proposed Calibration Technique Proposed Calibration (Timing control base) Timing controller no CALCap CAL [5]Proposed V off (  ) [mV] P d [  W] Delay [ps] [5] V. Giannini, ISSCC2008 V DD =0.5V, f s =500MHz Conventional Calibration (Capacitor DAC base[5]) MOS varactor sensitivity Delay time and power

9 ADC Structure 90nm 1P9M CMOS process

10 DNL and INL DNL +/-2.2 LSB => +/- 0.5 LSB. INL +/-1.5 LSB => +/- 0.3 LSB. (Measurement results are updated because the measurement setup is improved.)

11 SFDR and SNDR vs. Fsample SFDR, W/ CAL SFDR, W/O CAL SNDR, W/O CAL SNDR, W/ CAL 5 dB 10 dB Fin = 1 MHz

12 SFDR and SNDR vs. Fin Fsample = 360 MSps FoM Best = 110 fJ/conv.

13 Performance Summary [7] B. P. Ginsburg, J. Solid-State Circuits [8] B. Verbruggen, ISSCC [9] B. Verbruggen, VLSI Circuits [10] J. E. Proesel, CICC FoM Fmax = 600MSps FoM Best = MSps

14 Conclusions The strategy for low voltage operation is proposed. –FoM delay product (FD) is considered for not only low FoM but also high speed operation. Low voltage design techniques are proposed. –Forward body bias can be used easily at 0.5 V operation. (T d => 1/2) –The timing control based offset calibration technique is proposed. (DNL / INL 2 LSB => 0.5 LSB) Proposed ADC has good power efficiency and high speed operation. –600MSps, ERBW = 200 MHz, ENOB = 4.6 bit, FoM Best =110 fJ/ conv. at 0.5 V supply.

15 Thank you for your interest! Masaya Miyahara,