MNCF: Monthly Management Meeting Dr. Vijay Mishra 26 th July 2011.

Slides:



Advertisements
Similar presentations
Common Mode Termination Of Ethernet Twisted Pairs
Advertisements

CNR IEIIT – Applied Electromagnetics Group AAVP, Dwingeloo, December AAVS0 Results, Dual-Polarized Vivaldi Antenna G. Virone, R. Tascone, A.
1 Mohammad Shahriar Rahman The Nanotechnology Research and Teaching Facility University of Texas at Arlington, Arlington, TX Device Level Packaging.
Submicron Probing Techniques Based on AFM Technology
Plasma E- Measurement Brian DeHerrera John Purcell Jaber Assiri.
Computer Science, Software Engineering & Robotics Workshop, FGCU, April 27-28, 2012 Bayesian Belief Networks in Anomaly Detection, Fault Diagnosis & Failure.
IHP Im Technologiepark Frankfurt (Oder) Germany IHP Im Technologiepark Frankfurt (Oder) Germany ©
1 Mobile Phone Testing using Impedance Tuners Roman Meierer and Steve Dudkiewicz Your Complete Measurement & Modeling Solutions Partner.
Low AC and DC Resistance Inductor Technology Weyman Lundquist – President and CEO West Coast Magnetics April 4, 2007 International Patent # WO 2005/09630.
Micro and Nano Characterization Facility
IC-CAP Modeling Configuration Agilent Technologies November 01, 2005 Page 1 Agilent IC-CAP Modeling Configuration - Block Diagram ( GHz) E8363B.
Special Products Section 6.4. Find the product. (x + 2)(x + 2) (x + 3)(x + 3)
 All rights reserved to Humavox Ltd. RF Energy Harvesting Ambient Energy sources.
MNCF Equipment Usage Statistics Vijay 29 th November 2011.
IC-CAP Modeling Configuration Agilent Technologies November 01, 2005 Page 1 Agilent IC-CAP Modeling Configuration - 1/f Noise Measurement Diagram GPIB.
Troubleshooting Tools Cable Performance Testers Voltage Event Recorders Butt Set Crossover Cable Tone Generator & Locator Multimeter Cable Continuity Tester.
WaveSurfer 3000 Oscilloscopes Public Release – July 1 st, 2014.
Basic Nanotechnology EHS Awareness Basics of Chemical and Material Properties—Role of Scale Basics of Chemical and Material Properties—Role of Scale Chemical.
INTO DEEP ICE What does the future hold for Earth’s ice? (IEEE Spectrum | December 2005| NA) ECE 695 Alkesh Patel & Hemant Patel.
Reconfigurable Low Profile Antenna James Soon Advisor: Dr. Prasad Shastry.
All Rights Reserved Copyright (C) Siam Bee Technologies Device Modeling and Simulation of DC Motor using LTspice 08APR2015 Bee Technologies
Technology for Educators, July 8 & 9, 2009 Day 2 Welcome!
BPM Orbit Data Analysis with Wakefields Glen White, SLAC January 2013.
Undergraduate Research Experience in Sensors and Applications – Summer 2013 University of Texas Arlington Pyroelectric Infrared Sensors Dr. Donald Buttler.
Adrian Oates Daresbury Laboratory ALICE Control System July 08.
Micro and Nano Characterization Facility Girish Kunte June 10 th 2013.
Network Analyzers From Small Signal To Large Signal Measurements
MST-11 Class 100/10,000 Cleanroom User Facility Catherine Mombourquette Brian Crone
©2006 Avanex, Inc. All rights reserved. CONFIDENTIALITY NOTICE: The information contained in this presentation is Avanex confidential information. Any.
Micro and Nano Characterization Facility Girish Kunte July 1 st 2014.
NVNA Applications Loren Betts Component Test Division.
Micro and Nano Characterization Facility Girish Kunte October 28 th 2014.
IC-CAP Modeling Configuration Agilent Technologies November 01, 2005 Page 1 Agilent IC-CAP Modeling Configuration - Block Diagram ( GHz) E8364B.
FNI 2A Tools1 Tools of Nanoscience Microscopy  Optical  Electron SEM TEM  Scanning Probe STM AFM NSOM Spectroscopy  Electromagnetic  Mass  Electron.
IC-CAP Modeling Configuration Agilent Technologies November 01, 2005 Page 1 Agilent IC-CAP Modeling Configuration - Block Diagram ( GHz) E8361A.
Micro and Nano Characterization Facility Girish Kunte May 28 th 2014.
CLIC workshop 2015 EXTRACTION KICKER STRIPLINE MEASUREMENTS C. Belver-Aguilar (IFIC) On behalf of: A. Faus-Golfe (IFIC), F. Toral (CIEMAT), M.J. Barnes.
MNCF: Monthly Management Meeting Dr. Vijay Mishra 30 th Aug 2011.
IC-CAP Modeling Configuration Agilent Technologies November 01, 2005 Page 1 Agilent IC-CAP Modeling Configuration - Block Diagram ( GHz) GPIB.
Copyright 2002, S.D. Personick. All Rights Reserved.1 Telecommunications Networking II Topic 12 Wireless LAN Technology (Layer 1&2) Dr. Stewart D. Personick.
LER workshop 2014 Update on the Extraction Kicker for CLIC DRs: Calibration Tests C. Belver-Aguilar (IFIC) On behalf of: A. Faus-Golfe (IFIC), F. Toral.
SOC & VLSI PROCESSOR Sumana Kumar 04/26/2011. SOC & VLSI Project : Network on chip Team : Processor team Group : Sumana Kumar Harold Yu Fu Lin Guidance.
RECONFIGURABLE ANTENNA
The Next Evolution In AFM Nanonics produces AFM/SPM systems with unique design for overcoming limitations of standard SPM system. Nanonics offers unique.
IC-CAP Modeling Configuration Agilent Technologies November 01, 2005 Page 1 Agilent IC-CAP Modeling Configuration - Block Diagram ( GHz) E8364B.
9/6/2017 2:01 PM9/6/2017 2:01 PM9/6/2017 2:01 PM1 Restaurant Service A student in.
observed instabilities in Rf opamps R. Abbott, 30 July 2010
Electric Grid Technology Energy Storage Technology
Monitoring NJ Climate Variability & Change
WaveJet 300A Series Manufacturers Test Equipment Components Trade-ins
Agilent IC-CAP Modeling Configuration - CV Measurement Block Diagram
COMPLEX ELECTRON ENERGY DISTRIBUTIONS IN ASYMMETRIC RF-DC DISCHARGES
doc.: IEEE <doc#>
doc.: IEEE <doc#>
November 2006 Project: IEEE P Working Group for Wireless Personal Area Networks (WPANs) Submission Title: [TG3c Technical Requirement sub-group report]
Antony D. Han Chem 750/7530 Feb 28th, 06
doc.: IEEE <doc#>
רובוט 4X4 בעל עבירות גבוהה עם יכולת כיסוי שטח יעיל
Jul 12, /12/10 Project: IEEE P Working Group for Wireless Personal Area Networks (WPANs) Submission Title: TG4n Chinese Medical Band Closing.
9-4 Operations with Functions
آشکارسازهای مادون قرمز بر پایه گرافن سمینار درس کوانتوم الکترونیک
Device test stations Multi-probe electrical DC injection and optical input/output Near-field measurement Analogue characteristics 1) 50GHz Network analyzer,
Types of Microscopy Type Probe Technique Best Resolution Penetration
4/20/ :00 PM © Microsoft Corporation. All rights reserved. MICROSOFT MAKES NO WARRANTIES, EXPRESS, IMPLIED OR STATUTORY, AS TO THE INFORMATION IN.
9-4 Operations with Functions
Oxide nanostructures for energy efficient white lighting
Products FM Radio Rebroadcast Unit– RFR-2J0 ]
Production Month Sun Hours K Monthly Kwh Tou Peak Value After Kwh
Power Electronics: cooking up group IV semiconductor materials.
Example applications of microrobot-assisted wet transfer for fiber functionalization. Example applications of microrobot-assisted wet transfer for fiber.
Presentation transcript:

MNCF: Monthly Management Meeting Dr. Vijay Mishra 26 th July 2011

SAM

FIB

Tool Reservation and Usage Pattern

Tools Update (any Issues) DC Probe Station 1 (PM5 with Thermal Chuck, Agilent Device Analyzer B1500A) DC Probe Station 2 (PM5, Agilent Device Analyzer B1500A with pulsed source 5 MHz) DC Probe Station 3 (PM8, Agilent Sem. Parametric Analyzer 4155C with pulsed source 1 MHz, 4284A for LFCV) DC Probe Station 4 (PM5, Agilent Impedence Analyzer 4294A for HFCV, 110 Mhz ) RF Probe Station and Network Analyzer AFM Agilent MSA-500 optical Profilometer FTIR_Nicolet 6700 – NXRFT Raman & PL (PSU coming back as replacements) Solar Simulator, QE measurement

Feedback: Privacy Policy Feedback
Do Not Sell My Personal Information
About project: SlidePlayer Terms of Service

© 2025 SlidePlayer.com. Inc. All rights reserved.