School of Microelectronic Engineering EMT362: Microelectronic Fabrication Contact Technology For The VLSI Process Ramzan Mat Ayub School of Microelectronic Engineering

Lecture Objectives Able to identify ALL back-end process modules from wafer cross section. Understand the important of ohmic contact and able to describe step by step ohmic contact formation. Understand the importance of contact resistance monitoring, extraction method and test structure. Understand the application of diffusion barrier layer Able to describe silicide and salicide processes.

School of Microelectronic Engineering Main Process Modules (CMOS 1P2M 3.3V) 1. Wells Formation 2.Active Area Definition 3.Device Isolation (LOCOS) 4.Vt Adjust 5.Polygate Definition 6.Source & Drain Formation 7.Pre Metal Dielectrics Deposition (PMD) 8.Contact Definition 9.Metal-1 Deposition & Patterning 10.Inter-Metal Dielectrics Deposition (IMD) 11.Via Definition 12.Metal-2 Deposition & Patterning 13.Passivation 14.Pad Definition Full integration may require process steps FRONT END PROCESS (creating an electrically isolated devices) BACK END PROCESS (connecting the devices to form the desired circuit function.) Standard CMOS Process Flow

School of Microelectronic Engineering Back-end Process Overview

School of Microelectronic Engineering 56. Resist Removal FOX N-Well Arsenic Implant LDD As+ S/D Implant P-Well NMOSPMOS Capacitor FOX BF2 S/D Implant Test Insert and Scribe-line SequenceOperationEquipmentSpecification Process ControlPurpose

School of Microelectronic Engineering 57. BPSG Deposition : To isolate metal 1 from polysilicon lines and gates SequenceOperationEquipmentSpecification Process ControlPurpose FOX N-Well Arsenic Implant LDD As+ S/D Implant P-Well NMOSPMOS Capacitor FOX BF2 S/D Implant BPSG Test Insert and Scribe-line

School of Microelectronic Engineering 58. Reflow FOX N-Well Arsenic Implant LDD As+ S/D Implant P-Well NMOSPMOS Capacitor FOX BF2 S/D Implant BPSG Test Insert and Scribe-line SequenceOperationEquipmentSpecification Process ControlPurpose

School of Microelectronic Engineering 59. Lithography Contact FOX N-Well Arsenic Implant LDD As+ S/D Implant P-Well NMOSPMOS Capacitor FOX BF2 S/D Implant BPSG Resist Test Insert and Scribe-line Sequence Operation Equipment Specification Process ControlPurpose Anneal800 C, 15 ‘, N2ASM SB/T1To prepare wafer surface for better priming

School of Microelectronic Engineering 60. Contact Etch FOX N-Well Arsenic Implant LDD As+ S/D Implant P-Well NMOSPMOS Capacitor FOX BF2 S/D Implant BPSG Resist SequenceOperationEquipmentSpecification Process ControlPurpose Test Insert and Scribe-line

School of Microelectronic Engineering 61. Resist Coat, Backside Etch, Resist Removal FOX N-Well Arsenic Implant LDD As+ S/D Implant P-Well NMOSPMOS Capacitor FOX BF2 S/D Implant BPSG Resist Test Insert and Scribe-line SequenceOperation Equipment Specification Process ControlPurpose

School of Microelectronic Engineering 62. Titanium/Titanium Nitride Deposition SequenceOperationEquipmentSpecification Process ControlPurpose FOX N-Well Arsenic Implant LDD As+ S/D Implant P-Well NMOSPMOS Capacitor FOX BF2 S/D Implant BPSG Ti/TiN Test Insert and Scribe-line

School of Microelectronic Engineering 63. Anneal FOX N-Well Arsenic Implant LDD As+ S/D Implant P-Well NMOSPMOS Capacitor FOX BF2 S/D Implant BPSG Ti/TiN Test Insert and Scribe-line SequenceOperationEquipmentSpecification Process ControlPurpose

School of Microelectronic Engineering 64. Metal 1 Deposition SequenceOperationEquipmentSpecification Process ControlPurpose FOX N-Well Arsenic Implant LDD As+ S/D Implant P-Well NMOSPMOS Capacitor FOX BF2 S/D Implant BPSG AlSiCu TiN ARC Layer Test Insert and Scribe-line

School of Microelectronic Engineering 65. Lithography Metal-1 FOX N-Well Arsenic Implant LDD As+ S/D Implant P-Well NMOSPMOS Capacitor FOX BF2 S/D Implant BPSG AlSiCu TiN ARC Layer Resist Test Insert and Scribe-line Sequence OperationEquipmentSpecificationProcess ControlPurpose

School of Microelectronic Engineering 66. Metal-1 Etch/Resist Removal FOX N-Well Arsenic Implant LDD As+ S/D Implant P-Well NMOSPMOS Capacitor FOX BF2 S/D Implant BPSG AlSiCu TiN ARC Layer SequenceOperationEquipment Specification Process ControlPurpose Test Insert and Scribe-line

School of Microelectronic Engineering 66. Metal-1 Etch / Capacitor FOX Arsenic Implant LDD As+ S/D Implant P-Well NMOSPMOS Capacitor FOX BPSG N-Well Metal 1 SequenceOperationEquipmentSpecification Process ControlPurpose Test Insert and Scribe-line

School of Microelectronic Engineering 67. Solvent Strip FOX N-Well Arsenic Implant LDD As+ S/D Implant P-Well NMOSPMOS Capacitor FOX BF2 S/D Implant BPSG AlSiCu Test Insert and Scribe-line SequenceOperationEquipmentSpecification Process ControlPurpose

School of Microelectronic Engineering 68. Parameter Test 1 SequenceOperationEquipmentSpecification Process ControlPurpose FOX N-Well Arsenic Implant LDD As+ S/D Implant P-Well NMOSPMOS Capacitor FOX BF2 S/D Implant BPSG AlSiCu Test Insert and Scribe-line

School of Microelectronic Engineering 69. IMD-1 and Planarisation FOX N-Well Arsenic Implant LDD As+ S/D Implant P-Well NMOSPMOS Capacitor FOX BF2 S/D Implant BPSG AlSiCu Planarisation SequenceOperationEquipmentSpecification Process ControlPurpose Test Insert and Scribe-line

School of Microelectronic Engineering 70. Lithography Via-Contact FOX N-Well Arsenic Implant LDD As+ S/D Implant P-Well NMOSPMOS Capacitor FOX BF2 S/D Implant BPSG AlSiCu Planarisation Test Insert and Scribe-line Sequence OperationEquipmentSpecificationProcess ControlPurpose

School of Microelectronic Engineering 71. Via-Contact Etch FOX N-Well Arsenic Implant LDD As+ S/D Implant P-Well NMOSPMOS Capacitor FOX BF2 S/D Implant BPSG AlSiCu Planarisation SequenceOperationEquipmentSpecification Process Control Purpose Test Insert and Scribe-line

School of Microelectronic Engineering 72. Resist Removal FOX N-Well Arsenic Implant LDD As+ S/D Implant P-Well NMOSPMOS Capacitor FOX BF2 S/D Implant BPSG AlSiCu Planarisation SequenceOperationEquipmentSpecification Process Control Purpose Test Insert and Scribe-line

School of Microelectronic Engineering 73. Metal 2 Deposition AlSiCu TiN ARC-Layer FOX N-Well Arsenic Implant LDD As+ S/D Implant P-Well NMOSPMOS Capacitor FOX BF2 S/D Implant BPSG AlSiCu Planarisation Test Insert and Scribe-line SequenceOperationEquipmentSpecification Process ControlPurpose

School of Microelectronic Engineering 74. Lithograpy Metal 2 AlSiCu FOX N-Well Arsenic Implant LDD As+ S/D Implant P-Well NMOSPMOS Capacitor FOX BF2 S/D Implant BPSG AlSiCu Planarisation Test Insert and Scribe-line Sequence OperationEquipmentSpecificationProcess ControlPurpose

School of Microelectronic Engineering 75. Metal 2 Etch / Resist Removal Metal 2 FOX N-Well Arsenic Implant LDD As+ S/D Implant P-Well NMOSPMOS Capacitor FOX BF2 S/D Implant BPSG AlSiCu Planarisation SequenceOperationEquipmentSpecification Process ControlPurpose Test Insert and Scribe-line

School of Microelectronic Engineering 76. Solvent Strip Metal 2 FOX N-Well Arsenic Implant LDD As+ S/D Implant P-Well NMOSPMOS Capacitor FOX BF2 S/D Implant BPSG AlSiCu Planarisation Test Insert and Scribe-line SequenceOperationEquipmentSpecification Process ControlPurpose

School of Microelectronic Engineering 77. Passivation SequenceOperationEquipmentSpecification Process ControlPurpose FOX N-Well Arsenic Implant LDD As+ S/D Implant P-Well NMOSPMOS Capacitor FOX BF2 S/D Implant BPSG AlSiCu Planarisation Metal 2 Passivation P+ Substrate Test Insert and Scribe-line

School of Microelectronic Engineering 78. Lithography Bond Pads Field Oxide BPSG Metal 1 Metal 2 Planarisation Passivation Resist Sequence OperationEquipmentSpecificationProcess ControlPurpose

School of Microelectronic Engineering 79. Passivation Etch Resist Silicon Substrate Field Oxide BPSG Metal 1 Metal 2 Planarisation Passivation Resist Bond Pad opening SequenceOperationEquipmentSpecification Process ControlPurpose

School of Microelectronic Engineering 80. Resist Removal / Solvent Strip Resist Silicon Substrate Field Oxide BPSG Metal 1 Metal 2 Planarisation Passivation Bond Pad opening SequenceOperationEquipmentSpecification Process ControlPurpose

School of Microelectronic Engineering 81. Anneal SequenceOperationEquipmentSpecification Process ControlPurpose Resist Silicon Substrate Field Oxide BPSG Metal 1 Metal 2 Planarisation Passivation Bond Pad opening

School of Microelectronic Engineering 82. PATMOS / Final Test SequenceOperationEquipmentSpecification Process ControlPurpose FOX N-Well Arsenic Implant LDD As+ S/D Implant P-Well NMOSPMOS Capacitor FOX BF2 S/D Implant BPSG AlSiCu Planarisation Metal 2 Passivation P+ Substrate Spacer Test Insert and Scribe-line

School of Microelectronic Engineering  WHEN ICs ARE FABRICATED, ISOLATED ACTIVE-DEVICE REGIONS ARE CREATED WITHIN THE SINGLE-CRYSTAL SUBSTRATE.  THE TECHNOLOGY USED TO CONNECT THESE ISOLATED DEVICES THROUGH SPECIFIC ELECTRICAL PATHS EMPLOYS HIGH-CONDUCTIVITY, THIN FILM CONDUCTOR MATERIALS FABRICATED ABOVE THE SIO2 INSULATOR THAT COVERS THE SILICON SURFACE.  WHEREVER A CONNECTION IS NEEDED BETWEEN A CONDUCTOR FILM AND THE SILICON SUBSTRATE, AN OPENING IN THE SIO2 MUST BE PROVIDED TO ALLOW SUCH CONTACT TO OCCUR. THE NEED FOR CONTACT

School of Microelectronic Engineering GATE Xj  In MOSFET, current enters the contact perpendicular to the wafer surface, then travels parallel to the surface to reach channel.  The parasitic series resistance, R S of the current path from the contact to the edge of the channel can be modeled as; R S = R co + R sh + R sp + R ac R ac R sp R sh R co PMD METAL

School of Microelectronic Engineering Where; Rco – contact resistance between the metal and the S/D region Rsh – sheet resistance of S/D regions Rsp – resistance due to current crowding effect near the channel end of the source Rac – accumulation layer resistance Rco need to be accurately determined !

School of Microelectronic Engineering THEORY OF METAL-SEMICONDUCTOR CONTACT V I V V I I Ideal ohmic contact Rectifying contact Low-resistance ohmic contact  Ideal non-rectifying contacts would exhibit no resistance to the flow of current in both directions.  In general, metal-semiconductor contacts tend to exhibit non-ohmic I-V (due to the work-function different of metal and semiconductor, potential energy barrier exist between metal-semiconductor at thermal equilibrium). For e.g. Metal-n type S/C potential barrier is 0.5V.

School of Microelectronic Engineering EvEv EcEc EFEF EFEF vacuum level qΦmqΦm metal n-type s/conductor qΦsqΦs EcEc e e e e Energy band diagram of metal-semiconductor contact potential barrier EFEF Rectifying contact

School of Microelectronic Engineering  However, it is still possible to fabricate metal - s/c contacts with I-V characteristics that approach those of ideal case. This actual contact is referred as low-resistance ohmic contact.  Surface concentration in silicon is high, N D > cm -3  Contact sintering (furnace anneal ~450ºC after metal deposition)

School of Microelectronic Engineering SPECIFIC CONTACT RESISTIVITY, ρ c  PHYSICAL PARAMETERS THAT CHARACTERIZE THE INTERFACE RESISTIVITY OF METAL – S/C CONTACT.  THE ρ c DESCRIBES THE INCREMENTAL RESISTANCE OF AN INFINITELY SMALL AREA OF INTERFACE I.E THE INTERFACE QUALITY.  UNIT  -cm 2

School of Microelectronic Engineering SPECIFIC CONTACT RESISTIVITY, ρ c EXTRACTION GATE A – area of contact interface V Assume the current density over the entire area A is uniform; ρ c = R k / A Where R k is V/I

School of Microelectronic Engineering SPECIFIC CONTACT RESISTIVITY, ρ c EXTRACTION  Three most commonly used structures  Cross-bridge Kelvin Resistor – CBKR  Contact-end resistor – CER  Transmission line tap resistor - TLTR In all of these structures,  a specific current is sourced from the diffusion level up to metal level through the contact window.  a voltage is measured between the two levels using two other terminals.

School of Microelectronic Engineering metal diffusion L L I CROSS-BRIDGE KELVIN RESISTOR ℓ δ

School of Microelectronic Engineering PROCEDURE FOR EXTRACTING ρ c FROM CBKR ℓ δ 1.2 sets of CBKR test structures of varying contact sizes, ℓ varying in length between 1 to 25 um, with at least 2 different δ for each set of test structures. 2.The diffused region under the contacts for CBKR should be fabricated to closely emulate the actual junctions to be built in the actual devices. Normally both contacts on p+ and n+ need to be built. The sheet resistance( ρ sh ) of diffused layers is to be measured. 3.After test structures have been fabricated, the value of Kelvin contact resistance, R k = V/I, of each contact is measured. 4.The value of log 10 (R k / ρ sh ) is calculated for each contact. 5.The value of log 10 (ℓ/δ ) is calculated for each contact. 6.The values of log 10 (R k / ρ sh ) versus log 10 (ℓ/δ ) are plotted for every set of different δ 7.Two value of y = ℓ t / δ could be extracted from the curves where ℓ t is the transfer length and defined as ℓ t = √ ρ c /ρ sh (ℓ t is effective length of current crowding effect) 8.Since the δ values are known, ℓ t can be found from ℓ t = y δ 9.Since ℓ t = √ ρ c /ρ sh, ρ c is found from ρ c = ℓ t 2 ρ sh

School of Microelectronic Engineering SPECIFIC CONTACT RESISTIVITIES OF VARIOUS METAL-SI CONTACTS METAL-SI ρ c (  -  m 2 ) AlSi to n+ Si 15 AlSi-TiN to n+ Si 1.0 AlSi-TiN to p+ Si 20 CVD W to n+ Si 11 Al-Ti:W – TiSi2 to p+ Si Al-Ti:W – TiSi2 to n+ Si 13-25

School of Microelectronic Engineering CONTACT CHAIN FOR R CO MONITORING  Generally, accurate value of Rco cannot be extracted from resistance data obtained from simple contact chain structure.  However, these kinds of contact chains are useful to provide rapid monitoring of the contact-fabrication process.

School of Microelectronic Engineering contact metal diffused region PMD PAD 1 PAD 2 P-substrate n+ R 12 = V 12 / I 12 R co = R 12 / number of contact

School of Microelectronic Engineering BASIC PROCESS SEQUENCE OF CONVENTIONAL OHMIC-CONTACT  Creation of heavily doped regions (n+ or p+)  A window is etched in the oxide (contact hole etched in PMD)  Contact pre-clean (remove particles, contaminants and native oxide)  Metal deposition  Sintering or annealing process

School of Microelectronic Engineering FORMATION OF HEAVILY DOPED REGIONS  Dopants selectively introduced through ion implantation or diffusion process  Masking layer is used to restrict the introduction of dopants into the desired regions  Heavy doping is needed, however the maximum doping concentration is limited by the solid solubility of material.  Clustering effect may reduce the electrically active dopants N D > 10 19

School of Microelectronic Engineering FORMATION OF CONTACT OPENING  Key step in the fabrication of contact structure  The minimum size of contact holes usually determined by the minimum resolution capability of patterning technology. Contact size normally the same as gate length for e.g 0.5um CMOS technology, gate length = 0.5um, contact size = 0.5um (refer to the design rules).  In older technology (>2.0um process), wet etching is used for contact etch. Wetting and by product is introduced into the oxide etchant plus the application of ultrasonic agitation.  Due to the isotrapic nature of wet etching, it is ineffective for the etching of smaller contact holes.  Dry etching of contact etch is developed. N D > 10 19

School of Microelectronic Engineering  Dry etch introduced a new set of problems;  polymer contamination – by product of dry etching.  damage of silicon surface (high energy radicals in plasma), this plasma also could damaged gate oxide (plasma damaged, antenna structure is used to monitor this effect to oxide reliability)  selectivity problem  Several approaches used;  additional step to remove polymer  combined isotropic and anisotropic dry etch  combination of dry and wet etch  many others N D > 10 19

School of Microelectronic Engineering SIDEWALL CONTOURING  To give a shape that will result in good step coverage of metal.  Several approaches used;  reflow, high temperature furnace annealing after contact etch  wet etching followed by dry etch process  PR contouring followed by dry etch  many others Sloped opening

School of Microelectronic Engineering

REMOVAL OF NATIVE OXIDE  Native oxide could result in high R co  2 – 5 Å oxide posed not problem since it can be consumed by metals during sintering  Metal must be immediately deposited after native oxide removal  Methods of removing native oxide  H 2 O:HF (100:1) dip for 1 minute, followed by rinsing and drying  Sputter etch contact in sputtering system prior to metalization  in-situ dry-etch (no commercial product available) Time (min) Thickness (Å) Native oxide growth rate on Si exposed to room air

School of Microelectronic Engineering METAL DEPOSITION AND PATTERNING  Major issue is metal step coverage in the contact holes  Metal deposition technique is important;  CVD is more capable to produce good step coverage (W plug, blanket or selective deposition)  The drawback is process complexity and increase cost per process step  Preferred deposition technique for high aspect ratio contact, > A.R of 3  PVD at elevated temperature ( C)  Hot aluminum PVD process ( C)

School of Microelectronic Engineering SINTERING THE CONTACTS  Performed to allow any interface layer that exists between the metal and silicon to be consumed by a chemical reaction.  to allow metal and silicon to come into intimate contact through inter-diffusion.  Methods;  C for 30 minutes in the presence of H 2 or forming gas (a mixture of H 2 (10%) and N 2 (90%)  RTP, laser annealing and several others.

School of Microelectronic Engineering ALUMINUM JUNCTION SPIKING  Aluminum is chosen as metal interconnect because of;  Al-Si ohmic contact could be fabricated with low R co to n+ and p+  low resistivity (2.7 Ohm-cm)  excellent compatibility with SiO 2 (good adhesion).  the drawback is low melting point (660C) and low eutectic temperature of Al/Si mixtures (577 C)  Grain boundaries of polycrystalline Aluminum provide fast diffusion path for Si at temperature > 400 C.  As a result, large quantity of Si from Al-Si interface can diffuse into the Al film  Simultaneously Al from film will move rapidly to fill the voids created by the departing Si.  If the penetration of Al is deeper than the p-n junction depth below the contact, the junction will exhibit large leakage current / electrically shorted.  This effect is referred as junction spiking.

School of Microelectronic Engineering Si Beginning of heat treatment During heat treatment

School of Microelectronic Engineering METHOD TO REDUCE JUNCTION SPIKING  Silicon is added to the Al film during deposition.  sputter depositing the film from a single target containing both Al and Si.  co-evaporation of Si and Al  Silicon diffusion into Al will not occur if added Si concentration exceeds the Si solubility at process temperature (normally 1 to 2 wt % Si is added). However, this solution is only suitable for tchnology of 3um and above due to Si precipitation, thus increasing the R co.  The introduction of Diffusion Barrier between Al and Si (typical solution to junction spiking in the sub-micron CMOS process)

School of Microelectronic Engineering DIFFUSION BARRIERS  The role of this material is to prevent the inter- diffusion of Al and Si.  A diffusion barrier used is a thin film inserted between an overlying metal and underlying semiconductor material.  Such diffusion barriers should have the following characteristics;  diffusion of Al and Si through it should be low  barrier materials should be stable in the presence of Al and Si  barrier materials should adhere well to both Al and Si  barrier materials should have low contact resistivity to Al and Si  barrier materials should have good electrical conductivity  3 types of barriers  passive barriers (chemically inert with respect to Al and Si.  sacrificial barriers (react with Al and Si)  stuffed barriers (its grain boundaries is filled with other materials to block inter diffusion of Al and Si. Diffusion barrier

School of Microelectronic Engineering DIFFUSION BARRIER MATERIALS  Titanum – tungsten (Ti:W) – Stuffed Barrier  Normally sputter-deposired from a single target.  Initially used in Bipolar technology.  Major draw-back for VLSI application is the film is quite brittle and of high stress.  Polysilicon – Sacrificial Barrier  Easily integrated into NMOS technology but not as compatible with CMOS  Titanium – Sacrificial Barrier  Good diffusion barrier to Si, has a relatively short barrier capability lifetime.  Titanium Nitride – Passive Barrier  The most compatible and successful diffusion barrier in CMOS process.  impermeable barrier to Si  high activation energy for the diffusion of other materials.  chemically and thermodynamically very stable.  the lowest electrical resistivity among transitory metals.

School of Microelectronic Engineering

THE IMPACT OF INTRINSIC SERIES RESISTANCE ON MOS TRANSISTOR PERFORMANCE  Series resistance Rs is a combination of;  Rs = Rco + Rsh + Rsp + Rac GATE Xj R ac R sp R sh R co PMD METAL ℓ Contact length

School of Microelectronic Engineering THE IMPACT OF INTRINSIC SERIES RESISTANCE ON MOS TRANSISTOR PERFORMANCE  When larger design rules were used, Rs was a minor component of the total MOS resistance.  As devices got smaller, Rs grew larger due to;  shrinking contact size (Rco is dependence on contact size)  shallower source / drain regions (Rsh is dependence on source / drain depth and width)  under such conditions, Rs would degrade the device performance such as;  Idsat, transconductance, Vt  Rch = [L eff + V DS ] / [  0 C ox (V GS – V T – 0.5V DS ]  Generally accepted that Rs to be kept < 10% of Rch.  A comprehensive analysis on the Rs components is needed to find the major contributor to the Rs and ways to reduce it.

School of Microelectronic Engineering SUMMARY OF THE ANALYSIS  Rsh contribution is negligible  The value of (Rac + Rsp) is likely to dominate the value of Rs for MOS devices with the channel length of < 0.5um. Minimum value of (Rac + Rsp) are achieved by fabricating source/drain junction with as steep a doping profile as possible.  Rco can also important in degrading MOS device performance. Rco is essentially determined by;  value of specific contact resistivity, ρc  contact length, ℓ. It was shown that ℓ will need to be 1 to 4 times the channel length, L, to produce with minimum value of Rco. GATE ℓ Contact length L

School of Microelectronic Engineering The requirement on minimum ℓ meaning the new way of performing contact structure is needed for deep sub-micron process technology. WHY ???

School of Microelectronic Engineering  It is not possible to increase the contact size, ℓ, because it will defeat the purpose of device shrinkage.  Enlarge active area (to accommodate larger ℓ) will also resulted in increased parasitic junction capacitance, which further degrade the device performance 2λ x 2λ DRAIN W=4λ 5λ5λ 2λ2λ Z=2λ L=2λ n + diffusion λ 2λ2λ

School of Microelectronic Engineering ALTERNATIVE CONTACT STRUCTURES self-aligned silicides (SALICIDE)  buried-oxide MOS (BOMOS) contact  elevated source / drain  selective metal deposition

School of Microelectronic Engineering Materials for Silicide Process  Group – VIII metal silicides  PtSi (28-30  ohm-cm)  CoSi2 (16-18  ohm-cm)  NiSi2 (50  Ohm-cm)  TiSi2 (13-20  ohm-cm)  TiSi2 and CoSi2 are the most developed silicide process mainly because of;  lowest resistivities among the group members  stable at temperature ~ 850 C

School of Microelectronic Engineering Silicide Process 1.Contact etch 2.Resist strip Purpose : To reduce contact resistance, Rco between metal and silicon interface 3. Titanium deposition by sputtering technique ~ 400Å GATE n+ PMD

School of Microelectronic Engineering GATE n+ 4. TiN (barrier) deposition by sputtering technique ~ 1000 Å 5. TiSi 2 (titanium silicide) formation by RTP annealing, 30s GATE n+ PMD TiSi 2

School of Microelectronic Engineering 6. W Plug deposition ~ 6000 Å (by CVD) and etch back. GATE n+ PMD TiSi 2 7. AlSiCu deposition by sputtering ~ 3000 Å 8. TiN (ARC) deposition by sputtering ~ 1400 Å GATE n+ PMD TiSi 2

School of Microelectronic Engineering 9. Metal-1 pattern and etch GATE n+ PMD TiSi 2

School of Microelectronic Engineering SALICIDE Process 1.After S/D implant 2.Resist strip GATE n+ GATE n+ 3. Titanium deposition by sputtering technique

School of Microelectronic Engineering GATE n+ 4. TiSi 2 (titanium silicide) formation by RTP annealing, 30s GATE n+ 5. Unreacted metal is selectively etched by etchant that does not attack the silicide, SiO 2 and Si substrate TiSi 2

School of Microelectronic Engineering GATE n+ 6. PMD Deposition and reflow GATE n+ 7. Contact pattern and etch Then to be deposited with TiN (barrier), W plug, AlSiCu and TiN (ARC).

School of Microelectronic Engineering Advantages of SALICIDE over conventional contact  The value of Rsh becomes negligible, ρsh silicide = 1-2 Ohm/sq versus diffused junction = ohm/sq  Rs = Rco + Rsh + Rsp + Rac  Contact area of silicide and the Si is much larger, thus, lower Rco for the same ρc