P10511: Miniaturization of Xerography Derek Meinke (ME, PM) Matthew Liff (ME) Tony Zhang (EE) Zaw Htoo (ISE)

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Presentation transcript:

P10511: Miniaturization of Xerography Derek Meinke (ME, PM) Matthew Liff (ME) Tony Zhang (EE) Zaw Htoo (ISE)

Agenda Project Description Final Design Concept System Architecture Project Development Current State of Design Summary of Test Results Conclusions Questions

Project Description The scope of P10511 is to create a test fixture that will allow the use of various charging devices along with multiple diameters of photoreceptors. Test affect of charge uniformity with various device configurations and input parameters. Obtain device characteristics using I-V curve.

Project Description

Final Design Concept Photoreceptor (84mm) ESVThreaded rod end for easy changeability Coronode/Grid/Plate Power Supplies Charger Mount Erase Mount

Final Design Concept

System Architecture

Project Development Process Define Needs and Specifications Concept Generation and Selection MSD 1 Weeks MSD 1 Weeks Detailed Design MSD 1 Weeks Define Customer Needs -Develop Eng. Specifications -Perform QFD Analysis -Concept Generation and sketches -Concept Screening and selection -Part Drawings -Bill of Materials -Calculations BuildingTesting -Material Acquisition -Part Machining -Design Adjustments -Wiring Connections MSD 2 Weeks 1-8 -Uniformity Plots -I-V Curves -LabVIEW Optimization -Part Modifications MSD 2 Weeks 9-10

Current State of Project Testing is complete – Smooth uniformity plot – I-V Curves with slope of around 0.6 Photoreceptor sizes – Only tested 84mm and 30mm diameters (largest and smallest) – The 60mm and 40mm diameters are unavailable Budget – $ was used of $ available – Includes extra material for PR endcaps – Donated equipment cost was tracked but not purchased on budget

Summary of Results Grid Voltage: -655V ESV Readings/PR Rotation: 1 ESV Readings/PR Length: 50 Speed of PR: 0.1 Average Reading: V Range of Uniformity: 92.28V Uniformity TestIV Test Grid Voltage: -655V Voltage Step: 20V Intercept: Slope: -0.6

Summary of Results IV Test -665V Applied Voltage Increment (V) Sample Voltage Intercept (V) Slope (uA/V-m) Theoretical Intercept Error (%) Uniformity Test -665V Applied Speed (m/s)Sample Average Voltage (V) Range of Uniformity Slope of Voltage Across P/R Mean of Voltage (V) Mean of Uniformity Range (V)

Conclusions Design Modifications – Charger mount slots were opened on PR end for increased charger range of motion – Original retaining mechanism for PR compression spring used c-clip; changed to threaded rod with nut for assembly considerations – Cut down spring by 3 loops for lower compression force and easier assembly – Shaft mounts now use gussets over flimsy L-brackets for alignment – Individually sized endcaps vs. v-flange design – Dovetail design optimized for machinability Improvement ideas – Lengthen charger mounting assembly for less interference – Implement third shaft mount on free end to eliminate cantilever design – Alligator clips with higher breakdown threshold – Make charger slide plastic to eliminate arcing problems

Further Questions?